A 2.5-5.6 GHz Subharmonically Injection-Locked All-Digital PLL With Dual-Edge Complementary Switched Injection

A 2.5-5.6 GHz low-phase-noise subharmonically injection-locked sub-sampling all-digital phase-locked loop with a dual-edge complementary switched injection technique is presented. While previously reported injection-locked phase-locked loops (ILPLLs) require additional circuitry for resolving a phas...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2018-09, Vol.65 (9), p.2691-2702
Hauptverfasser: Cho, Sung-Yong, Kim, Sungwoo, Choo, Min-Seong, Ko, Han-Gon, Lee, Jinhyung, Bae, Woorham, Jeong, Deog-Kyoon
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2702
container_issue 9
container_start_page 2691
container_title IEEE transactions on circuits and systems. I, Regular papers
container_volume 65
creator Cho, Sung-Yong
Kim, Sungwoo
Choo, Min-Seong
Ko, Han-Gon
Lee, Jinhyung
Bae, Woorham
Jeong, Deog-Kyoon
description A 2.5-5.6 GHz low-phase-noise subharmonically injection-locked sub-sampling all-digital phase-locked loop with a dual-edge complementary switched injection technique is presented. While previously reported injection-locked phase-locked loops (ILPLLs) require additional circuitry for resolving a phase alignment mismatch between the PLL loop and injection path, the presented ILPLL exhibits a simplified architecture owing to the proposed injection technique and sub-sampling bang-bang phase detector (SSBBPD). Because the proposed injection technique exploits dual-edge injection, we analyze the performance impact of dual-edge injection when inaccurate injection timing occurs. This paper also offers an analysis of the injection technique based on the charge transfer and derives the realignment factor of the injection. With the proposed injection technique and the direct connection of the digitally controlled oscillator (DCO) clock to the SSBBPD, the timing mismatch between the PLL loop and injection path becomes insensitive to voltage and temperature drift. The proposed ILPLL prototype is fabricated in a 65-nm CMOS process and achieves a 168-fs integrated rms jitter over 1 kHz to 40 MHz at a 5-GHz output frequency with 156.25-MHz reference clock while consuming 15.4 mW with an active area of 0.06 mm 2 .
doi_str_mv 10.1109/TCSI.2018.2799195
format Article
fullrecord <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_2083988564</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8292824</ieee_id><sourcerecordid>2083988564</sourcerecordid><originalsourceid>FETCH-LOGICAL-c293t-8369f580c11ab84a422fab0a33bc20c036671e4aa3b1225b5db502831b36b2883</originalsourceid><addsrcrecordid>eNo9kF9LwzAUxYsoOKcfQHwJ-Jya3DRd8jg63QYFhU18LEmWbplpO_sHmZ_elo093fNwzrmHXxA8UhJSSuTLOlktQyBUhDCRkkp-FYwo5wITQeLrQUcSCwbiNrhrmj0hIAmjo6CcIgg55mGM5os_tOr0TtVFVTqjvD-iZbm3pnVVidPKfNsNmnqPZ27rWuXRR5qiL9fu0KxTHr9uthYlVXHwtrBlq-ojWv261uz61KXmPrjJlW_sw_mOg8-313WywOn7fJlMU2xAsrYfGsucC2IoVVpEKgLIlSaKMW2AGMLieEJtpBTTFIBrvtGcgGBUs1iDEGwcPJ96D3X109mmzfZVV5f9ywyIYFIIHke9i55cpq6aprZ5dqhd0S_PKMkGrNmANRuwZmesfebplHHW2otfgAQBEfsH-EZxZQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2083988564</pqid></control><display><type>article</type><title>A 2.5-5.6 GHz Subharmonically Injection-Locked All-Digital PLL With Dual-Edge Complementary Switched Injection</title><source>IEEE Electronic Library (IEL)</source><creator>Cho, Sung-Yong ; Kim, Sungwoo ; Choo, Min-Seong ; Ko, Han-Gon ; Lee, Jinhyung ; Bae, Woorham ; Jeong, Deog-Kyoon</creator><creatorcontrib>Cho, Sung-Yong ; Kim, Sungwoo ; Choo, Min-Seong ; Ko, Han-Gon ; Lee, Jinhyung ; Bae, Woorham ; Jeong, Deog-Kyoon</creatorcontrib><description>A 2.5-5.6 GHz low-phase-noise subharmonically injection-locked sub-sampling all-digital phase-locked loop with a dual-edge complementary switched injection technique is presented. While previously reported injection-locked phase-locked loops (ILPLLs) require additional circuitry for resolving a phase alignment mismatch between the PLL loop and injection path, the presented ILPLL exhibits a simplified architecture owing to the proposed injection technique and sub-sampling bang-bang phase detector (SSBBPD). Because the proposed injection technique exploits dual-edge injection, we analyze the performance impact of dual-edge injection when inaccurate injection timing occurs. This paper also offers an analysis of the injection technique based on the charge transfer and derives the realignment factor of the injection. With the proposed injection technique and the direct connection of the digitally controlled oscillator (DCO) clock to the SSBBPD, the timing mismatch between the PLL loop and injection path becomes insensitive to voltage and temperature drift. The proposed ILPLL prototype is fabricated in a 65-nm CMOS process and achieves a 168-fs integrated rms jitter over 1 kHz to 40 MHz at a 5-GHz output frequency with 156.25-MHz reference clock while consuming 15.4 mW with an active area of 0.06 mm 2 .</description><identifier>ISSN: 1549-8328</identifier><identifier>EISSN: 1558-0806</identifier><identifier>DOI: 10.1109/TCSI.2018.2799195</identifier><identifier>CODEN: ITCSCH</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>All-digital PLL (ADPLL) ; Charge transfer ; Circuits ; Clocks ; CMOS ; Delays ; dual-edge injection ; frequency detector ; Impact analysis ; injection-locked oscillator (ILO) ; Jitter ; Phase detectors ; Phase locked loops ; Phase locked systems ; Phase noise ; Realignment ; reference spur ; Sampling ; sense-amplifier ; sub-sampling PLL ; Vibration</subject><ispartof>IEEE transactions on circuits and systems. I, Regular papers, 2018-09, Vol.65 (9), p.2691-2702</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-8369f580c11ab84a422fab0a33bc20c036671e4aa3b1225b5db502831b36b2883</citedby><cites>FETCH-LOGICAL-c293t-8369f580c11ab84a422fab0a33bc20c036671e4aa3b1225b5db502831b36b2883</cites><orcidid>0000-0002-4189-7120 ; 0000-0001-5184-3321 ; 0000-0002-9274-0182 ; 0000-0003-1863-1719 ; 0000-0002-0548-3836 ; 0000-0003-0436-703X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8292824$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54736</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8292824$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Cho, Sung-Yong</creatorcontrib><creatorcontrib>Kim, Sungwoo</creatorcontrib><creatorcontrib>Choo, Min-Seong</creatorcontrib><creatorcontrib>Ko, Han-Gon</creatorcontrib><creatorcontrib>Lee, Jinhyung</creatorcontrib><creatorcontrib>Bae, Woorham</creatorcontrib><creatorcontrib>Jeong, Deog-Kyoon</creatorcontrib><title>A 2.5-5.6 GHz Subharmonically Injection-Locked All-Digital PLL With Dual-Edge Complementary Switched Injection</title><title>IEEE transactions on circuits and systems. I, Regular papers</title><addtitle>TCSI</addtitle><description>A 2.5-5.6 GHz low-phase-noise subharmonically injection-locked sub-sampling all-digital phase-locked loop with a dual-edge complementary switched injection technique is presented. While previously reported injection-locked phase-locked loops (ILPLLs) require additional circuitry for resolving a phase alignment mismatch between the PLL loop and injection path, the presented ILPLL exhibits a simplified architecture owing to the proposed injection technique and sub-sampling bang-bang phase detector (SSBBPD). Because the proposed injection technique exploits dual-edge injection, we analyze the performance impact of dual-edge injection when inaccurate injection timing occurs. This paper also offers an analysis of the injection technique based on the charge transfer and derives the realignment factor of the injection. With the proposed injection technique and the direct connection of the digitally controlled oscillator (DCO) clock to the SSBBPD, the timing mismatch between the PLL loop and injection path becomes insensitive to voltage and temperature drift. The proposed ILPLL prototype is fabricated in a 65-nm CMOS process and achieves a 168-fs integrated rms jitter over 1 kHz to 40 MHz at a 5-GHz output frequency with 156.25-MHz reference clock while consuming 15.4 mW with an active area of 0.06 mm 2 .</description><subject>All-digital PLL (ADPLL)</subject><subject>Charge transfer</subject><subject>Circuits</subject><subject>Clocks</subject><subject>CMOS</subject><subject>Delays</subject><subject>dual-edge injection</subject><subject>frequency detector</subject><subject>Impact analysis</subject><subject>injection-locked oscillator (ILO)</subject><subject>Jitter</subject><subject>Phase detectors</subject><subject>Phase locked loops</subject><subject>Phase locked systems</subject><subject>Phase noise</subject><subject>Realignment</subject><subject>reference spur</subject><subject>Sampling</subject><subject>sense-amplifier</subject><subject>sub-sampling PLL</subject><subject>Vibration</subject><issn>1549-8328</issn><issn>1558-0806</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kF9LwzAUxYsoOKcfQHwJ-Jya3DRd8jg63QYFhU18LEmWbplpO_sHmZ_elo093fNwzrmHXxA8UhJSSuTLOlktQyBUhDCRkkp-FYwo5wITQeLrQUcSCwbiNrhrmj0hIAmjo6CcIgg55mGM5os_tOr0TtVFVTqjvD-iZbm3pnVVidPKfNsNmnqPZ27rWuXRR5qiL9fu0KxTHr9uthYlVXHwtrBlq-ojWv261uz61KXmPrjJlW_sw_mOg8-313WywOn7fJlMU2xAsrYfGsucC2IoVVpEKgLIlSaKMW2AGMLieEJtpBTTFIBrvtGcgGBUs1iDEGwcPJ96D3X109mmzfZVV5f9ywyIYFIIHke9i55cpq6aprZ5dqhd0S_PKMkGrNmANRuwZmesfebplHHW2otfgAQBEfsH-EZxZQ</recordid><startdate>20180901</startdate><enddate>20180901</enddate><creator>Cho, Sung-Yong</creator><creator>Kim, Sungwoo</creator><creator>Choo, Min-Seong</creator><creator>Ko, Han-Gon</creator><creator>Lee, Jinhyung</creator><creator>Bae, Woorham</creator><creator>Jeong, Deog-Kyoon</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-4189-7120</orcidid><orcidid>https://orcid.org/0000-0001-5184-3321</orcidid><orcidid>https://orcid.org/0000-0002-9274-0182</orcidid><orcidid>https://orcid.org/0000-0003-1863-1719</orcidid><orcidid>https://orcid.org/0000-0002-0548-3836</orcidid><orcidid>https://orcid.org/0000-0003-0436-703X</orcidid></search><sort><creationdate>20180901</creationdate><title>A 2.5-5.6 GHz Subharmonically Injection-Locked All-Digital PLL With Dual-Edge Complementary Switched Injection</title><author>Cho, Sung-Yong ; Kim, Sungwoo ; Choo, Min-Seong ; Ko, Han-Gon ; Lee, Jinhyung ; Bae, Woorham ; Jeong, Deog-Kyoon</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c293t-8369f580c11ab84a422fab0a33bc20c036671e4aa3b1225b5db502831b36b2883</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>All-digital PLL (ADPLL)</topic><topic>Charge transfer</topic><topic>Circuits</topic><topic>Clocks</topic><topic>CMOS</topic><topic>Delays</topic><topic>dual-edge injection</topic><topic>frequency detector</topic><topic>Impact analysis</topic><topic>injection-locked oscillator (ILO)</topic><topic>Jitter</topic><topic>Phase detectors</topic><topic>Phase locked loops</topic><topic>Phase locked systems</topic><topic>Phase noise</topic><topic>Realignment</topic><topic>reference spur</topic><topic>Sampling</topic><topic>sense-amplifier</topic><topic>sub-sampling PLL</topic><topic>Vibration</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Cho, Sung-Yong</creatorcontrib><creatorcontrib>Kim, Sungwoo</creatorcontrib><creatorcontrib>Choo, Min-Seong</creatorcontrib><creatorcontrib>Ko, Han-Gon</creatorcontrib><creatorcontrib>Lee, Jinhyung</creatorcontrib><creatorcontrib>Bae, Woorham</creatorcontrib><creatorcontrib>Jeong, Deog-Kyoon</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics &amp; Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Cho, Sung-Yong</au><au>Kim, Sungwoo</au><au>Choo, Min-Seong</au><au>Ko, Han-Gon</au><au>Lee, Jinhyung</au><au>Bae, Woorham</au><au>Jeong, Deog-Kyoon</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A 2.5-5.6 GHz Subharmonically Injection-Locked All-Digital PLL With Dual-Edge Complementary Switched Injection</atitle><jtitle>IEEE transactions on circuits and systems. I, Regular papers</jtitle><stitle>TCSI</stitle><date>2018-09-01</date><risdate>2018</risdate><volume>65</volume><issue>9</issue><spage>2691</spage><epage>2702</epage><pages>2691-2702</pages><issn>1549-8328</issn><eissn>1558-0806</eissn><coden>ITCSCH</coden><abstract>A 2.5-5.6 GHz low-phase-noise subharmonically injection-locked sub-sampling all-digital phase-locked loop with a dual-edge complementary switched injection technique is presented. While previously reported injection-locked phase-locked loops (ILPLLs) require additional circuitry for resolving a phase alignment mismatch between the PLL loop and injection path, the presented ILPLL exhibits a simplified architecture owing to the proposed injection technique and sub-sampling bang-bang phase detector (SSBBPD). Because the proposed injection technique exploits dual-edge injection, we analyze the performance impact of dual-edge injection when inaccurate injection timing occurs. This paper also offers an analysis of the injection technique based on the charge transfer and derives the realignment factor of the injection. With the proposed injection technique and the direct connection of the digitally controlled oscillator (DCO) clock to the SSBBPD, the timing mismatch between the PLL loop and injection path becomes insensitive to voltage and temperature drift. The proposed ILPLL prototype is fabricated in a 65-nm CMOS process and achieves a 168-fs integrated rms jitter over 1 kHz to 40 MHz at a 5-GHz output frequency with 156.25-MHz reference clock while consuming 15.4 mW with an active area of 0.06 mm 2 .</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TCSI.2018.2799195</doi><tpages>12</tpages><orcidid>https://orcid.org/0000-0002-4189-7120</orcidid><orcidid>https://orcid.org/0000-0001-5184-3321</orcidid><orcidid>https://orcid.org/0000-0002-9274-0182</orcidid><orcidid>https://orcid.org/0000-0003-1863-1719</orcidid><orcidid>https://orcid.org/0000-0002-0548-3836</orcidid><orcidid>https://orcid.org/0000-0003-0436-703X</orcidid></addata></record>
fulltext fulltext_linktorsrc
identifier ISSN: 1549-8328
ispartof IEEE transactions on circuits and systems. I, Regular papers, 2018-09, Vol.65 (9), p.2691-2702
issn 1549-8328
1558-0806
language eng
recordid cdi_proquest_journals_2083988564
source IEEE Electronic Library (IEL)
subjects All-digital PLL (ADPLL)
Charge transfer
Circuits
Clocks
CMOS
Delays
dual-edge injection
frequency detector
Impact analysis
injection-locked oscillator (ILO)
Jitter
Phase detectors
Phase locked loops
Phase locked systems
Phase noise
Realignment
reference spur
Sampling
sense-amplifier
sub-sampling PLL
Vibration
title A 2.5-5.6 GHz Subharmonically Injection-Locked All-Digital PLL With Dual-Edge Complementary Switched Injection
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-27T07%3A05%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%202.5-5.6%20GHz%20Subharmonically%20Injection-Locked%20All-Digital%20PLL%20With%20Dual-Edge%20Complementary%20Switched%20Injection&rft.jtitle=IEEE%20transactions%20on%20circuits%20and%20systems.%20I,%20Regular%20papers&rft.au=Cho,%20Sung-Yong&rft.date=2018-09-01&rft.volume=65&rft.issue=9&rft.spage=2691&rft.epage=2702&rft.pages=2691-2702&rft.issn=1549-8328&rft.eissn=1558-0806&rft.coden=ITCSCH&rft_id=info:doi/10.1109/TCSI.2018.2799195&rft_dat=%3Cproquest_RIE%3E2083988564%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2083988564&rft_id=info:pmid/&rft_ieee_id=8292824&rfr_iscdi=true