Which low-fusing porcelain glaze treatment technique is better to promote a vitreous surface on Y-TZP ceramic?

OBJECTIVE: to evaluated the influence of two types of low-fusing porcelain glaze application on the surface of a zirconia ceramics stabilized by yttrium (Y-TZP).METHODS: Y-TZP specimens were divided into five groups (n=5) according the surface treatments: control (CO), no treatment was performed; ap...

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Veröffentlicht in:Revista odonto ciência 2018-07, Vol.32 (4), p.174
Hauptverfasser: Miranda, Jean Soares, Malta, Natália Veloso, De Carvalho, Ronaldo Luís Almeida, Souza, Rodrigo Othávio de Assunção e, Machado, João Paulo Barros, Leite, Fabíola Pessôa Pereira
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container_end_page
container_issue 4
container_start_page 174
container_title Revista odonto ciência
container_volume 32
creator Miranda, Jean Soares
Malta, Natália Veloso
De Carvalho, Ronaldo Luís Almeida
Souza, Rodrigo Othávio de Assunção e
Machado, João Paulo Barros
Leite, Fabíola Pessôa Pereira
description OBJECTIVE: to evaluated the influence of two types of low-fusing porcelain glaze application on the surface of a zirconia ceramics stabilized by yttrium (Y-TZP).METHODS: Y-TZP specimens were divided into five groups (n=5) according the surface treatments: control (CO), no treatment was performed; application of a thin low-fusing porcelain glass layer by the powder/liquid technique (GPL); GPL followed by 10% hydrofluoric acid (HF) etching (GPL-HF); glaze spray application (GS); GS followed by 10% HF etching (GS-HF). Roughness measurements contact angle, x-ray diffraction, energy-dispersive spectroscopy (EDS) and scanning electron microscope (SEM) analysis were performed.RESULTS: ANOVA and Tukey tests revealed that GPL had significantly lower contact angle values than the other groups (GPL:50.31º; GPL-HF: 72.73º; GS-HF: 81.73º; CO: 96.48º; GS:101.30º; p=0.001). GPL-HF presented a significant higher roughness (Ra/Rq: 2658.0/3367.0 ηm; p=0.001) than the other groups (GPL: 872.1/1162.0 ηm; GS-HF: 383.0/603.6 ηm; GS: 303.4/391.3 ηm; CO:263.4/339.1 ηm). The X-ray diffraction analysis just tetragonal phase in all groups. EDS and SEM analysis show a highest amount of silica on GPL and GPL-HF surface.CONCLUSION: the application of the low-fusing porcelain glaze by the powder/liquid technique followed by the HF etching promoted a better surface to micromechanical and chemical adhesion.
doi_str_mv 10.15448/1980-6523.2017.4.28749
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Roughness measurements contact angle, x-ray diffraction, energy-dispersive spectroscopy (EDS) and scanning electron microscope (SEM) analysis were performed.RESULTS: ANOVA and Tukey tests revealed that GPL had significantly lower contact angle values than the other groups (GPL:50.31º; GPL-HF: 72.73º; GS-HF: 81.73º; CO: 96.48º; GS:101.30º; p=0.001). GPL-HF presented a significant higher roughness (Ra/Rq: 2658.0/3367.0 ηm; p=0.001) than the other groups (GPL: 872.1/1162.0 ηm; GS-HF: 383.0/603.6 ηm; GS: 303.4/391.3 ηm; CO:263.4/339.1 ηm). The X-ray diffraction analysis just tetragonal phase in all groups. EDS and SEM analysis show a highest amount of silica on GPL and GPL-HF surface.CONCLUSION: the application of the low-fusing porcelain glaze by the powder/liquid technique followed by the HF etching promoted a better surface to micromechanical and chemical adhesion.</description><identifier>ISSN: 0102-9460</identifier><identifier>EISSN: 1980-6523</identifier><identifier>DOI: 10.15448/1980-6523.2017.4.28749</identifier><language>eng</language><publisher>Porto Alegre: EDIPUCRS</publisher><subject>Contact angle ; Electron microscopes ; Etching ; Porcelain ; Powder ; Scanning electron microscopy ; Silica ; Spectroscopy ; X-ray diffraction ; Yttrium ; Zirconia</subject><ispartof>Revista odonto ciência, 2018-07, Vol.32 (4), p.174</ispartof><rights>Copyright EDIPUCRS 2017</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c200t-a2c176f333de09f713bead38eea2c798d53c478c64517f2a6935628214695d6c3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,27901,27902</link.rule.ids></links><search><creatorcontrib>Miranda, Jean Soares</creatorcontrib><creatorcontrib>Malta, Natália Veloso</creatorcontrib><creatorcontrib>De Carvalho, Ronaldo Luís Almeida</creatorcontrib><creatorcontrib>Souza, Rodrigo Othávio de Assunção e</creatorcontrib><creatorcontrib>Machado, João Paulo Barros</creatorcontrib><creatorcontrib>Leite, Fabíola Pessôa Pereira</creatorcontrib><title>Which low-fusing porcelain glaze treatment technique is better to promote a vitreous surface on Y-TZP ceramic?</title><title>Revista odonto ciência</title><description>OBJECTIVE: to evaluated the influence of two types of low-fusing porcelain glaze application on the surface of a zirconia ceramics stabilized by yttrium (Y-TZP).METHODS: Y-TZP specimens were divided into five groups (n=5) according the surface treatments: control (CO), no treatment was performed; application of a thin low-fusing porcelain glass layer by the powder/liquid technique (GPL); GPL followed by 10% hydrofluoric acid (HF) etching (GPL-HF); glaze spray application (GS); GS followed by 10% HF etching (GS-HF). Roughness measurements contact angle, x-ray diffraction, energy-dispersive spectroscopy (EDS) and scanning electron microscope (SEM) analysis were performed.RESULTS: ANOVA and Tukey tests revealed that GPL had significantly lower contact angle values than the other groups (GPL:50.31º; GPL-HF: 72.73º; GS-HF: 81.73º; CO: 96.48º; GS:101.30º; p=0.001). GPL-HF presented a significant higher roughness (Ra/Rq: 2658.0/3367.0 ηm; p=0.001) than the other groups (GPL: 872.1/1162.0 ηm; GS-HF: 383.0/603.6 ηm; GS: 303.4/391.3 ηm; CO:263.4/339.1 ηm). The X-ray diffraction analysis just tetragonal phase in all groups. 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application of a thin low-fusing porcelain glass layer by the powder/liquid technique (GPL); GPL followed by 10% hydrofluoric acid (HF) etching (GPL-HF); glaze spray application (GS); GS followed by 10% HF etching (GS-HF). Roughness measurements contact angle, x-ray diffraction, energy-dispersive spectroscopy (EDS) and scanning electron microscope (SEM) analysis were performed.RESULTS: ANOVA and Tukey tests revealed that GPL had significantly lower contact angle values than the other groups (GPL:50.31º; GPL-HF: 72.73º; GS-HF: 81.73º; CO: 96.48º; GS:101.30º; p=0.001). GPL-HF presented a significant higher roughness (Ra/Rq: 2658.0/3367.0 ηm; p=0.001) than the other groups (GPL: 872.1/1162.0 ηm; GS-HF: 383.0/603.6 ηm; GS: 303.4/391.3 ηm; CO:263.4/339.1 ηm). The X-ray diffraction analysis just tetragonal phase in all groups. EDS and SEM analysis show a highest amount of silica on GPL and GPL-HF surface.CONCLUSION: the application of the low-fusing porcelain glaze by the powder/liquid technique followed by the HF etching promoted a better surface to micromechanical and chemical adhesion.</abstract><cop>Porto Alegre</cop><pub>EDIPUCRS</pub><doi>10.15448/1980-6523.2017.4.28749</doi><oa>free_for_read</oa></addata></record>
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source EZB-FREE-00999 freely available EZB journals
subjects Contact angle
Electron microscopes
Etching
Porcelain
Powder
Scanning electron microscopy
Silica
Spectroscopy
X-ray diffraction
Yttrium
Zirconia
title Which low-fusing porcelain glaze treatment technique is better to promote a vitreous surface on Y-TZP ceramic?
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