Post Processing of Roughness Raw Data

This paper deals with the system of roughness measurement, especially with the problem of data filtering and processing the results. Theoretical part describes shortly terms roughness, waviness and shape as surface integrity parameters. During phase of measuring we obtain all these three constituent...

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Veröffentlicht in:Solid state phenomena 2018-07, Vol.278, p.15-22
Hauptverfasser: Kubátová, Dana, Melichar, Martin
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Melichar, Martin
description This paper deals with the system of roughness measurement, especially with the problem of data filtering and processing the results. Theoretical part describes shortly terms roughness, waviness and shape as surface integrity parameters. During phase of measuring we obtain all these three constituents in common. The most important task of post processing is separation of them. That is possible due to roughness HW and SW filters. Other parts of this paper contain SW data filtering description and philosophy of HW filtering. Last part of this article describes SW filters with basic mathematical apparatus, areas of usage and limitations.
doi_str_mv 10.4028/www.scientific.net/SSP.278.15
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2077155328</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2077155328</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2085-3e7bc313482e0597e613b68880f4ebfc29210e816aefbf00dfa3686dcbcbf67e3</originalsourceid><addsrcrecordid>eNqNkFtLwzAYhoMoOKf_oSC7bJdDm6QXIjKPMHBseh3S7MvWoc1MUor_3siE3Xr1vR-8B3gQmhBclJjK6TAMRTAtdLG1rSk6iNPValFQIQtSnaAR4ZzmtRD1adKY0ByzujxHFyHsMGZEEjlCk4ULMVt4ZyCEtttkzmZL12-2XfqzpR6yex31JTqz-iPA1d8do_fHh7fZcz5_fXqZ3c1zQ7GscgaiMYywUlLAVS2AE9ZwKSW2JTTW0JoSDJJwDbaxGK-tZlzytWlMY7kANkbXh969d189hKh2rvddmlQUC0GqilGZXDcHl_EuBA9W7X37qf23Ilj9klGJjDqSUYmMSmRUIqNIlfK3h3z0ugsRzPY487-GH2c1c8U</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2077155328</pqid></control><display><type>article</type><title>Post Processing of Roughness Raw Data</title><source>Scientific.net Journals</source><creator>Kubátová, Dana ; Melichar, Martin</creator><creatorcontrib>Kubátová, Dana ; Melichar, Martin</creatorcontrib><description>This paper deals with the system of roughness measurement, especially with the problem of data filtering and processing the results. Theoretical part describes shortly terms roughness, waviness and shape as surface integrity parameters. During phase of measuring we obtain all these three constituents in common. The most important task of post processing is separation of them. That is possible due to roughness HW and SW filters. Other parts of this paper contain SW data filtering description and philosophy of HW filtering. Last part of this article describes SW filters with basic mathematical apparatus, areas of usage and limitations.</description><identifier>ISSN: 1012-0394</identifier><identifier>ISSN: 1662-9779</identifier><identifier>EISSN: 1662-9779</identifier><identifier>DOI: 10.4028/www.scientific.net/SSP.278.15</identifier><language>eng</language><publisher>Zurich: Trans Tech Publications Ltd</publisher><subject>Filtration ; Roughness ; Waviness</subject><ispartof>Solid state phenomena, 2018-07, Vol.278, p.15-22</ispartof><rights>2018 Trans Tech Publications Ltd</rights><rights>Copyright Trans Tech Publications Ltd. Jul 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c2085-3e7bc313482e0597e613b68880f4ebfc29210e816aefbf00dfa3686dcbcbf67e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttps://www.scientific.net/Image/TitleCover/4720?width=600</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Kubátová, Dana</creatorcontrib><creatorcontrib>Melichar, Martin</creatorcontrib><title>Post Processing of Roughness Raw Data</title><title>Solid state phenomena</title><description>This paper deals with the system of roughness measurement, especially with the problem of data filtering and processing the results. Theoretical part describes shortly terms roughness, waviness and shape as surface integrity parameters. During phase of measuring we obtain all these three constituents in common. The most important task of post processing is separation of them. That is possible due to roughness HW and SW filters. Other parts of this paper contain SW data filtering description and philosophy of HW filtering. Last part of this article describes SW filters with basic mathematical apparatus, areas of usage and limitations.</description><subject>Filtration</subject><subject>Roughness</subject><subject>Waviness</subject><issn>1012-0394</issn><issn>1662-9779</issn><issn>1662-9779</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqNkFtLwzAYhoMoOKf_oSC7bJdDm6QXIjKPMHBseh3S7MvWoc1MUor_3siE3Xr1vR-8B3gQmhBclJjK6TAMRTAtdLG1rSk6iNPValFQIQtSnaAR4ZzmtRD1adKY0ByzujxHFyHsMGZEEjlCk4ULMVt4ZyCEtttkzmZL12-2XfqzpR6yex31JTqz-iPA1d8do_fHh7fZcz5_fXqZ3c1zQ7GscgaiMYywUlLAVS2AE9ZwKSW2JTTW0JoSDJJwDbaxGK-tZlzytWlMY7kANkbXh969d189hKh2rvddmlQUC0GqilGZXDcHl_EuBA9W7X37qf23Ilj9klGJjDqSUYmMSmRUIqNIlfK3h3z0ugsRzPY487-GH2c1c8U</recordid><startdate>20180701</startdate><enddate>20180701</enddate><creator>Kubátová, Dana</creator><creator>Melichar, Martin</creator><general>Trans Tech Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20180701</creationdate><title>Post Processing of Roughness Raw Data</title><author>Kubátová, Dana ; Melichar, Martin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2085-3e7bc313482e0597e613b68880f4ebfc29210e816aefbf00dfa3686dcbcbf67e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Filtration</topic><topic>Roughness</topic><topic>Waviness</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kubátová, Dana</creatorcontrib><creatorcontrib>Melichar, Martin</creatorcontrib><collection>CrossRef</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Solid state phenomena</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kubátová, Dana</au><au>Melichar, Martin</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Post Processing of Roughness Raw Data</atitle><jtitle>Solid state phenomena</jtitle><date>2018-07-01</date><risdate>2018</risdate><volume>278</volume><spage>15</spage><epage>22</epage><pages>15-22</pages><issn>1012-0394</issn><issn>1662-9779</issn><eissn>1662-9779</eissn><abstract>This paper deals with the system of roughness measurement, especially with the problem of data filtering and processing the results. Theoretical part describes shortly terms roughness, waviness and shape as surface integrity parameters. During phase of measuring we obtain all these three constituents in common. The most important task of post processing is separation of them. That is possible due to roughness HW and SW filters. Other parts of this paper contain SW data filtering description and philosophy of HW filtering. Last part of this article describes SW filters with basic mathematical apparatus, areas of usage and limitations.</abstract><cop>Zurich</cop><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/SSP.278.15</doi><tpages>8</tpages></addata></record>
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subjects Filtration
Roughness
Waviness
title Post Processing of Roughness Raw Data
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-21T04%3A48%3A39IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Post%20Processing%20of%20Roughness%20Raw%20Data&rft.jtitle=Solid%20state%20phenomena&rft.au=Kub%C3%A1tov%C3%A1,%20Dana&rft.date=2018-07-01&rft.volume=278&rft.spage=15&rft.epage=22&rft.pages=15-22&rft.issn=1012-0394&rft.eissn=1662-9779&rft_id=info:doi/10.4028/www.scientific.net/SSP.278.15&rft_dat=%3Cproquest_cross%3E2077155328%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2077155328&rft_id=info:pmid/&rfr_iscdi=true