Measurements and Characterisation of Surface Scattering at 60 GHz
This paper presents the analysis and characterization of the surface scattering process for both specular and diffused components. The study is focused on the investigation of various building materials each having a different roughness, at a central frequency of 60GHz. Very large signal strength va...
Gespeichert in:
Veröffentlicht in: | arXiv.org 2017-10 |
---|---|
Hauptverfasser: | , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | arXiv.org |
container_volume | |
creator | Goulianos, Angelos A Freire, Alberto L Barratt, Tom Mellios, Evangelos Cain, Peter Rumney, Moray Nix, Andrew Beach, Mark |
description | This paper presents the analysis and characterization of the surface scattering process for both specular and diffused components. The study is focused on the investigation of various building materials each having a different roughness, at a central frequency of 60GHz. Very large signal strength variations in first order scattered components is observed as the user moves over very short distances. This is due to the small-scale fading caused by rough surface scatterers. Furthermore, it is shown that the diffused scattering depends on the material roughness, the angle of incidence and the distance from the surface. Finally, results indicate that reflections from rough materials may suffer from high depolarization, a phenomenon that can potentially be exploited in order to improve the performance of mm-Wave systems using polarization diversity. |
format | Article |
fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_2076325270</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2076325270</sourcerecordid><originalsourceid>FETCH-proquest_journals_20763252703</originalsourceid><addsrcrecordid>eNqNyrEKwjAQgOEgCBbtOxw4F-LFtq5S1C5OdS9HvWqLJppLFp9eBR_A6R--f6ISNGaVbdaIM5WKjFprLErMc5Oo7ZFJouc72yBA9gzVlTx1gf0gFAZnwfXQRN9Tx9B0FL5iL0ABCg2H-rVQ055uwumvc7Xc705VnT28e0aW0I4uevuhFnVZGMyx1Oa_6w1EwTiw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2076325270</pqid></control><display><type>article</type><title>Measurements and Characterisation of Surface Scattering at 60 GHz</title><source>Free E- Journals</source><creator>Goulianos, Angelos A ; Freire, Alberto L ; Barratt, Tom ; Mellios, Evangelos ; Cain, Peter ; Rumney, Moray ; Nix, Andrew ; Beach, Mark</creator><creatorcontrib>Goulianos, Angelos A ; Freire, Alberto L ; Barratt, Tom ; Mellios, Evangelos ; Cain, Peter ; Rumney, Moray ; Nix, Andrew ; Beach, Mark</creatorcontrib><description>This paper presents the analysis and characterization of the surface scattering process for both specular and diffused components. The study is focused on the investigation of various building materials each having a different roughness, at a central frequency of 60GHz. Very large signal strength variations in first order scattered components is observed as the user moves over very short distances. This is due to the small-scale fading caused by rough surface scatterers. Furthermore, it is shown that the diffused scattering depends on the material roughness, the angle of incidence and the distance from the surface. Finally, results indicate that reflections from rough materials may suffer from high depolarization, a phenomenon that can potentially be exploited in order to improve the performance of mm-Wave systems using polarization diversity.</description><identifier>EISSN: 2331-8422</identifier><language>eng</language><publisher>Ithaca: Cornell University Library, arXiv.org</publisher><subject>Building materials ; Construction materials ; Depolarization ; Incidence angle ; Millimeter waves ; Performance enhancement ; Roughness ; Scattering ; Signal strength</subject><ispartof>arXiv.org, 2017-10</ispartof><rights>2017. This work is published under http://arxiv.org/licenses/nonexclusive-distrib/1.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>780,784</link.rule.ids></links><search><creatorcontrib>Goulianos, Angelos A</creatorcontrib><creatorcontrib>Freire, Alberto L</creatorcontrib><creatorcontrib>Barratt, Tom</creatorcontrib><creatorcontrib>Mellios, Evangelos</creatorcontrib><creatorcontrib>Cain, Peter</creatorcontrib><creatorcontrib>Rumney, Moray</creatorcontrib><creatorcontrib>Nix, Andrew</creatorcontrib><creatorcontrib>Beach, Mark</creatorcontrib><title>Measurements and Characterisation of Surface Scattering at 60 GHz</title><title>arXiv.org</title><description>This paper presents the analysis and characterization of the surface scattering process for both specular and diffused components. The study is focused on the investigation of various building materials each having a different roughness, at a central frequency of 60GHz. Very large signal strength variations in first order scattered components is observed as the user moves over very short distances. This is due to the small-scale fading caused by rough surface scatterers. Furthermore, it is shown that the diffused scattering depends on the material roughness, the angle of incidence and the distance from the surface. Finally, results indicate that reflections from rough materials may suffer from high depolarization, a phenomenon that can potentially be exploited in order to improve the performance of mm-Wave systems using polarization diversity.</description><subject>Building materials</subject><subject>Construction materials</subject><subject>Depolarization</subject><subject>Incidence angle</subject><subject>Millimeter waves</subject><subject>Performance enhancement</subject><subject>Roughness</subject><subject>Scattering</subject><subject>Signal strength</subject><issn>2331-8422</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqNyrEKwjAQgOEgCBbtOxw4F-LFtq5S1C5OdS9HvWqLJppLFp9eBR_A6R--f6ISNGaVbdaIM5WKjFprLErMc5Oo7ZFJouc72yBA9gzVlTx1gf0gFAZnwfXQRN9Tx9B0FL5iL0ABCg2H-rVQ055uwumvc7Xc705VnT28e0aW0I4uevuhFnVZGMyx1Oa_6w1EwTiw</recordid><startdate>20171016</startdate><enddate>20171016</enddate><creator>Goulianos, Angelos A</creator><creator>Freire, Alberto L</creator><creator>Barratt, Tom</creator><creator>Mellios, Evangelos</creator><creator>Cain, Peter</creator><creator>Rumney, Moray</creator><creator>Nix, Andrew</creator><creator>Beach, Mark</creator><general>Cornell University Library, arXiv.org</general><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>L6V</scope><scope>M7S</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope></search><sort><creationdate>20171016</creationdate><title>Measurements and Characterisation of Surface Scattering at 60 GHz</title><author>Goulianos, Angelos A ; Freire, Alberto L ; Barratt, Tom ; Mellios, Evangelos ; Cain, Peter ; Rumney, Moray ; Nix, Andrew ; Beach, Mark</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_20763252703</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Building materials</topic><topic>Construction materials</topic><topic>Depolarization</topic><topic>Incidence angle</topic><topic>Millimeter waves</topic><topic>Performance enhancement</topic><topic>Roughness</topic><topic>Scattering</topic><topic>Signal strength</topic><toplevel>online_resources</toplevel><creatorcontrib>Goulianos, Angelos A</creatorcontrib><creatorcontrib>Freire, Alberto L</creatorcontrib><creatorcontrib>Barratt, Tom</creatorcontrib><creatorcontrib>Mellios, Evangelos</creatorcontrib><creatorcontrib>Cain, Peter</creatorcontrib><creatorcontrib>Rumney, Moray</creatorcontrib><creatorcontrib>Nix, Andrew</creatorcontrib><creatorcontrib>Beach, Mark</creatorcontrib><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Engineering Collection</collection><collection>Engineering Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Goulianos, Angelos A</au><au>Freire, Alberto L</au><au>Barratt, Tom</au><au>Mellios, Evangelos</au><au>Cain, Peter</au><au>Rumney, Moray</au><au>Nix, Andrew</au><au>Beach, Mark</au><format>book</format><genre>document</genre><ristype>GEN</ristype><atitle>Measurements and Characterisation of Surface Scattering at 60 GHz</atitle><jtitle>arXiv.org</jtitle><date>2017-10-16</date><risdate>2017</risdate><eissn>2331-8422</eissn><abstract>This paper presents the analysis and characterization of the surface scattering process for both specular and diffused components. The study is focused on the investigation of various building materials each having a different roughness, at a central frequency of 60GHz. Very large signal strength variations in first order scattered components is observed as the user moves over very short distances. This is due to the small-scale fading caused by rough surface scatterers. Furthermore, it is shown that the diffused scattering depends on the material roughness, the angle of incidence and the distance from the surface. Finally, results indicate that reflections from rough materials may suffer from high depolarization, a phenomenon that can potentially be exploited in order to improve the performance of mm-Wave systems using polarization diversity.</abstract><cop>Ithaca</cop><pub>Cornell University Library, arXiv.org</pub><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | EISSN: 2331-8422 |
ispartof | arXiv.org, 2017-10 |
issn | 2331-8422 |
language | eng |
recordid | cdi_proquest_journals_2076325270 |
source | Free E- Journals |
subjects | Building materials Construction materials Depolarization Incidence angle Millimeter waves Performance enhancement Roughness Scattering Signal strength |
title | Measurements and Characterisation of Surface Scattering at 60 GHz |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-04T07%3A20%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=document&rft.atitle=Measurements%20and%20Characterisation%20of%20Surface%20Scattering%20at%2060%20GHz&rft.jtitle=arXiv.org&rft.au=Goulianos,%20Angelos%20A&rft.date=2017-10-16&rft.eissn=2331-8422&rft_id=info:doi/&rft_dat=%3Cproquest%3E2076325270%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2076325270&rft_id=info:pmid/&rfr_iscdi=true |