Electron beam lithography on uneven resist for uniform Bragg gratings in GaSb based distributed-feedback lasers
Nanofabrication of metallic Bragg gratings vertically connected to the AlGaAsSb ridges for distributed-feedback (DFB) lasers based on AlGaAsSb/InGaAsSb was successfully conducted in this work. Owing to the densely distributed 4-μm wide ridges on the surface, electron beam lithography on the spin-coa...
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Veröffentlicht in: | Microelectronic engineering 2018-08, Vol.195, p.32-35 |
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creator | Deng, Jianan Yan, Jinyi Shao, Jinhai Chen, Yifang Gong, Qian |
description | Nanofabrication of metallic Bragg gratings vertically connected to the AlGaAsSb ridges for distributed-feedback (DFB) lasers based on AlGaAsSb/InGaAsSb was successfully conducted in this work. Owing to the densely distributed 4-μm wide ridges on the surface, electron beam lithography on the spin-coated PMMA suffered from severely uneven thickness of the resist, significantly deteriorating the grating quality. To overcome this difficulty, a special e-beam exposure strategy was developed by optimizing the dose distribution on the non-flat PMMA to achieve uniform Bragg gratings throughout the whole wafer surface. Single mode operation at room temperature of the fabricated DFB lasers was achieved at the designed lasing wavelength around 1973 nm, indicating the high quality of the gratings generated on extremely uneven PMMA. This exposure method provided us with a novel approach to pattern uniform nanostructures on the resist with uneven thickness as a whole.
[Display omitted]
•A special approach was developed to carry out EBL on uneven PMMA for uniform gratings with identical width.•The fabricated DFB laser with metal gratings by this new method shows single mode spectra with high quality. |
doi_str_mv | 10.1016/j.mee.2018.03.016 |
format | Article |
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[Display omitted]
•A special approach was developed to carry out EBL on uneven PMMA for uniform gratings with identical width.•The fabricated DFB laser with metal gratings by this new method shows single mode spectra with high quality.</description><identifier>ISSN: 0167-9317</identifier><identifier>EISSN: 1873-5568</identifier><identifier>DOI: 10.1016/j.mee.2018.03.016</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>Bragg grating ; Bragg gratings ; Distributed-feedback lasers ; Electron beam lithography ; Electron spin ; Feedback ; Lasers ; Nanofabrication ; Nanostructured materials ; Offset printing ; Optimization ; Point spread function ; Polymethyl methacrylate ; Ridges ; Single mode operation ; Spin coating ; Temperature ; Uneven resist thickness</subject><ispartof>Microelectronic engineering, 2018-08, Vol.195, p.32-35</ispartof><rights>2018 Elsevier B.V.</rights><rights>Copyright Elsevier BV Aug 5, 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c240t-21352516ed66975756b37cafa98669fd4d9b256917425fd64ac00ebd9aed1cd3</citedby><cites>FETCH-LOGICAL-c240t-21352516ed66975756b37cafa98669fd4d9b256917425fd64ac00ebd9aed1cd3</cites><orcidid>0000-0001-7450-826X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.mee.2018.03.016$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Deng, Jianan</creatorcontrib><creatorcontrib>Yan, Jinyi</creatorcontrib><creatorcontrib>Shao, Jinhai</creatorcontrib><creatorcontrib>Chen, Yifang</creatorcontrib><creatorcontrib>Gong, Qian</creatorcontrib><title>Electron beam lithography on uneven resist for uniform Bragg gratings in GaSb based distributed-feedback lasers</title><title>Microelectronic engineering</title><description>Nanofabrication of metallic Bragg gratings vertically connected to the AlGaAsSb ridges for distributed-feedback (DFB) lasers based on AlGaAsSb/InGaAsSb was successfully conducted in this work. Owing to the densely distributed 4-μm wide ridges on the surface, electron beam lithography on the spin-coated PMMA suffered from severely uneven thickness of the resist, significantly deteriorating the grating quality. To overcome this difficulty, a special e-beam exposure strategy was developed by optimizing the dose distribution on the non-flat PMMA to achieve uniform Bragg gratings throughout the whole wafer surface. Single mode operation at room temperature of the fabricated DFB lasers was achieved at the designed lasing wavelength around 1973 nm, indicating the high quality of the gratings generated on extremely uneven PMMA. This exposure method provided us with a novel approach to pattern uniform nanostructures on the resist with uneven thickness as a whole.
[Display omitted]
•A special approach was developed to carry out EBL on uneven PMMA for uniform gratings with identical width.•The fabricated DFB laser with metal gratings by this new method shows single mode spectra with high quality.</description><subject>Bragg grating</subject><subject>Bragg gratings</subject><subject>Distributed-feedback lasers</subject><subject>Electron beam lithography</subject><subject>Electron spin</subject><subject>Feedback</subject><subject>Lasers</subject><subject>Nanofabrication</subject><subject>Nanostructured materials</subject><subject>Offset printing</subject><subject>Optimization</subject><subject>Point spread function</subject><subject>Polymethyl methacrylate</subject><subject>Ridges</subject><subject>Single mode operation</subject><subject>Spin coating</subject><subject>Temperature</subject><subject>Uneven resist thickness</subject><issn>0167-9317</issn><issn>1873-5568</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp9kE9PwzAMxSMEEmPwAbhF4tyStE3aihNMMJAmcWD3KE3cLqV_RtJO2rfH0zhzsvzze7b1CLnnLOaMy8c27gHihPEiZmmM5IIseJGnkRCyuCQLJHlUpjy_JjchtAz7jBULMr52YCY_DrQC3dPOTbux8Xq_O1Jk8wAHGKiH4MJE69EjcVh6-uJ101BUTm5oAnUDXeuvilY6gKUW1d5V8wQ2qgFspc037XDkwy25qnUX4O6vLsn27XW7eo82n-uP1fMmMknGpijhqUgEl2ClLHORC1mludG1LgsEtc1sWSVCljzPElFbmWnDGFS21GC5semSPJzX7v34M0OYVDvOfsCLKmGyFCzJhEAVP6uMH0PwUKu9d732R8WZOsWqWoWxqlOsiqUKCXqezh7A7w8OvArGwWDAOo9JKju6f9y_GD-BHg</recordid><startdate>20180805</startdate><enddate>20180805</enddate><creator>Deng, Jianan</creator><creator>Yan, Jinyi</creator><creator>Shao, Jinhai</creator><creator>Chen, Yifang</creator><creator>Gong, Qian</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-7450-826X</orcidid></search><sort><creationdate>20180805</creationdate><title>Electron beam lithography on uneven resist for uniform Bragg gratings in GaSb based distributed-feedback lasers</title><author>Deng, Jianan ; Yan, Jinyi ; Shao, Jinhai ; Chen, Yifang ; Gong, Qian</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c240t-21352516ed66975756b37cafa98669fd4d9b256917425fd64ac00ebd9aed1cd3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Bragg grating</topic><topic>Bragg gratings</topic><topic>Distributed-feedback lasers</topic><topic>Electron beam lithography</topic><topic>Electron spin</topic><topic>Feedback</topic><topic>Lasers</topic><topic>Nanofabrication</topic><topic>Nanostructured materials</topic><topic>Offset printing</topic><topic>Optimization</topic><topic>Point spread function</topic><topic>Polymethyl methacrylate</topic><topic>Ridges</topic><topic>Single mode operation</topic><topic>Spin coating</topic><topic>Temperature</topic><topic>Uneven resist thickness</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Deng, Jianan</creatorcontrib><creatorcontrib>Yan, Jinyi</creatorcontrib><creatorcontrib>Shao, Jinhai</creatorcontrib><creatorcontrib>Chen, Yifang</creatorcontrib><creatorcontrib>Gong, Qian</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Microelectronic engineering</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Deng, Jianan</au><au>Yan, Jinyi</au><au>Shao, Jinhai</au><au>Chen, Yifang</au><au>Gong, Qian</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron beam lithography on uneven resist for uniform Bragg gratings in GaSb based distributed-feedback lasers</atitle><jtitle>Microelectronic engineering</jtitle><date>2018-08-05</date><risdate>2018</risdate><volume>195</volume><spage>32</spage><epage>35</epage><pages>32-35</pages><issn>0167-9317</issn><eissn>1873-5568</eissn><abstract>Nanofabrication of metallic Bragg gratings vertically connected to the AlGaAsSb ridges for distributed-feedback (DFB) lasers based on AlGaAsSb/InGaAsSb was successfully conducted in this work. Owing to the densely distributed 4-μm wide ridges on the surface, electron beam lithography on the spin-coated PMMA suffered from severely uneven thickness of the resist, significantly deteriorating the grating quality. To overcome this difficulty, a special e-beam exposure strategy was developed by optimizing the dose distribution on the non-flat PMMA to achieve uniform Bragg gratings throughout the whole wafer surface. Single mode operation at room temperature of the fabricated DFB lasers was achieved at the designed lasing wavelength around 1973 nm, indicating the high quality of the gratings generated on extremely uneven PMMA. This exposure method provided us with a novel approach to pattern uniform nanostructures on the resist with uneven thickness as a whole.
[Display omitted]
•A special approach was developed to carry out EBL on uneven PMMA for uniform gratings with identical width.•The fabricated DFB laser with metal gratings by this new method shows single mode spectra with high quality.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.mee.2018.03.016</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0001-7450-826X</orcidid></addata></record> |
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subjects | Bragg grating Bragg gratings Distributed-feedback lasers Electron beam lithography Electron spin Feedback Lasers Nanofabrication Nanostructured materials Offset printing Optimization Point spread function Polymethyl methacrylate Ridges Single mode operation Spin coating Temperature Uneven resist thickness |
title | Electron beam lithography on uneven resist for uniform Bragg gratings in GaSb based distributed-feedback lasers |
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