Ultrafast Fourier transform inelastic x-ray scattering

Over the past few years, x-ray free-electron lasers (FELs) have demonstrated the possibility for probing materials with femtosecond time resolution and Angstrom spatial sensitivity. Here, we review a novel development of Fourier transform inelastic x-ray scattering (FT-IXS), which exploits the ultra...

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Veröffentlicht in:	MRS bulletin 2018-07, Vol.43 (7), p.520-526
1. Verfasser:	Trigo, Mariano
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied and Technical Physics Characterization and Evaluation of Materials Energy Materials Equilibrium Femtosecond pulses Fourier transforms Free electron lasers Inelastic scattering Lattice vibration Materials Engineering Materials Science Nanotechnology Spectrum analysis Ultrafast Imaging of Materials Dynamics X-ray scattering X-rays
Online-Zugang:	Volltext
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