Guest Editorial Deep Learning Models for Industry Informatics
The papers in this special issue mainly focus on deep learning models for industry informatics, addressing both original algorithmic development and new applications of deep learning.
Gespeichert in:
| Veröffentlicht in: | IEEE transactions on industrial informatics 2018-07, Vol.14 (7), p.3166-3169 |
|---|---|
| Hauptverfasser: | , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 3169 |
|---|---|
| container_issue | 7 |
| container_start_page | 3166 |
| container_title | IEEE transactions on industrial informatics |
| container_volume | 14 |
| creator | Agrawal, Dharma Prakash Gupta, Brij Bhooshan Wang, Haoxiang Chang, Xiaojun Yamaguchi, Shingo Perez, Gregorio Martinez |
| description | The papers in this special issue mainly focus on deep learning models for industry informatics, addressing both original algorithmic development and new applications of deep learning. |
| doi_str_mv | 10.1109/TII.2018.2834547 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_2064312845</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8402153</ieee_id><sourcerecordid>2064312845</sourcerecordid><originalsourceid>FETCH-LOGICAL-c333t-885de2f584fedde1a2cd40392352073fc2e114b0b015476ea2829282cfc2f4e33</originalsourceid><addsrcrecordid>eNo9UMFOAjEQbYwmIno38bKJ58WZTgvdgweDgJtgvOC5KbtTswR2sV0O_L0lEA-Tmcm8N-_lCfGIMEKE4mVVliMJaEbSkNJqciUGWCjMATRcp1lrzEkC3Yq7GDcANAEqBuJ1ceDYZ7O66bvQuG32zrzPluxC27Q_2WdX8zZmvgtZ2daH2IdjGtK6c31TxXtx49028sOlD8X3fLaafuTLr0U5fVvmFRH1uTG6Zum1UZ7rmtHJqlZJXpKWMCFfSUZUa1gDJudjdtLIIlWVLl4x0VA8n__uQ_d7Mmw33SG0SdJKGCtCaZROKDijqtDFGNjbfWh2Lhwtgj2FZFNI9hSSvYSUKE9nSsPM_3CjQKIm-gPp2mFK</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2064312845</pqid></control><display><type>article</type><title>Guest Editorial Deep Learning Models for Industry Informatics</title><source>IEEE Electronic Library (IEL)</source><creator>Agrawal, Dharma Prakash ; Gupta, Brij Bhooshan ; Wang, Haoxiang ; Chang, Xiaojun ; Yamaguchi, Shingo ; Perez, Gregorio Martinez</creator><creatorcontrib>Agrawal, Dharma Prakash ; Gupta, Brij Bhooshan ; Wang, Haoxiang ; Chang, Xiaojun ; Yamaguchi, Shingo ; Perez, Gregorio Martinez</creatorcontrib><description>The papers in this special issue mainly focus on deep learning models for industry informatics, addressing both original algorithmic development and new applications of deep learning.</description><identifier>ISSN: 1551-3203</identifier><identifier>EISSN: 1941-0050</identifier><identifier>DOI: 10.1109/TII.2018.2834547</identifier><identifier>CODEN: ITIICH</identifier><language>eng</language><publisher>Piscataway: IEEE</publisher><subject>Computational modeling ; Computer vision ; Feature extraction ; Industrial control ; Informatics ; Learning systems ; Machine learning ; Malware ; Predictive models ; Special issues and sections</subject><ispartof>IEEE transactions on industrial informatics, 2018-07, Vol.14 (7), p.3166-3169</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c333t-885de2f584fedde1a2cd40392352073fc2e114b0b015476ea2829282cfc2f4e33</citedby><cites>FETCH-LOGICAL-c333t-885de2f584fedde1a2cd40392352073fc2e114b0b015476ea2829282cfc2f4e33</cites><orcidid>0000-0002-7778-8807 ; 0000-0003-4929-4698 ; 0000-0001-5532-6604 ; 0000-0003-0579-8501</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8402153$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8402153$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Agrawal, Dharma Prakash</creatorcontrib><creatorcontrib>Gupta, Brij Bhooshan</creatorcontrib><creatorcontrib>Wang, Haoxiang</creatorcontrib><creatorcontrib>Chang, Xiaojun</creatorcontrib><creatorcontrib>Yamaguchi, Shingo</creatorcontrib><creatorcontrib>Perez, Gregorio Martinez</creatorcontrib><title>Guest Editorial Deep Learning Models for Industry Informatics</title><title>IEEE transactions on industrial informatics</title><addtitle>TII</addtitle><description>The papers in this special issue mainly focus on deep learning models for industry informatics, addressing both original algorithmic development and new applications of deep learning.</description><subject>Computational modeling</subject><subject>Computer vision</subject><subject>Feature extraction</subject><subject>Industrial control</subject><subject>Informatics</subject><subject>Learning systems</subject><subject>Machine learning</subject><subject>Malware</subject><subject>Predictive models</subject><subject>Special issues and sections</subject><issn>1551-3203</issn><issn>1941-0050</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9UMFOAjEQbYwmIno38bKJ58WZTgvdgweDgJtgvOC5KbtTswR2sV0O_L0lEA-Tmcm8N-_lCfGIMEKE4mVVliMJaEbSkNJqciUGWCjMATRcp1lrzEkC3Yq7GDcANAEqBuJ1ceDYZ7O66bvQuG32zrzPluxC27Q_2WdX8zZmvgtZ2daH2IdjGtK6c31TxXtx49028sOlD8X3fLaafuTLr0U5fVvmFRH1uTG6Zum1UZ7rmtHJqlZJXpKWMCFfSUZUa1gDJudjdtLIIlWVLl4x0VA8n__uQ_d7Mmw33SG0SdJKGCtCaZROKDijqtDFGNjbfWh2Lhwtgj2FZFNI9hSSvYSUKE9nSsPM_3CjQKIm-gPp2mFK</recordid><startdate>20180701</startdate><enddate>20180701</enddate><creator>Agrawal, Dharma Prakash</creator><creator>Gupta, Brij Bhooshan</creator><creator>Wang, Haoxiang</creator><creator>Chang, Xiaojun</creator><creator>Yamaguchi, Shingo</creator><creator>Perez, Gregorio Martinez</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SC</scope><scope>7SP</scope><scope>8FD</scope><scope>JQ2</scope><scope>L7M</scope><scope>L~C</scope><scope>L~D</scope><orcidid>https://orcid.org/0000-0002-7778-8807</orcidid><orcidid>https://orcid.org/0000-0003-4929-4698</orcidid><orcidid>https://orcid.org/0000-0001-5532-6604</orcidid><orcidid>https://orcid.org/0000-0003-0579-8501</orcidid></search><sort><creationdate>20180701</creationdate><title>Guest Editorial Deep Learning Models for Industry Informatics</title><author>Agrawal, Dharma Prakash ; Gupta, Brij Bhooshan ; Wang, Haoxiang ; Chang, Xiaojun ; Yamaguchi, Shingo ; Perez, Gregorio Martinez</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c333t-885de2f584fedde1a2cd40392352073fc2e114b0b015476ea2829282cfc2f4e33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Computational modeling</topic><topic>Computer vision</topic><topic>Feature extraction</topic><topic>Industrial control</topic><topic>Informatics</topic><topic>Learning systems</topic><topic>Machine learning</topic><topic>Malware</topic><topic>Predictive models</topic><topic>Special issues and sections</topic><toplevel>online_resources</toplevel><creatorcontrib>Agrawal, Dharma Prakash</creatorcontrib><creatorcontrib>Gupta, Brij Bhooshan</creatorcontrib><creatorcontrib>Wang, Haoxiang</creatorcontrib><creatorcontrib>Chang, Xiaojun</creatorcontrib><creatorcontrib>Yamaguchi, Shingo</creatorcontrib><creatorcontrib>Perez, Gregorio Martinez</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Computer and Information Systems Abstracts</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>ProQuest Computer Science Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Computer and Information Systems Abstracts Academic</collection><collection>Computer and Information Systems Abstracts Professional</collection><jtitle>IEEE transactions on industrial informatics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Agrawal, Dharma Prakash</au><au>Gupta, Brij Bhooshan</au><au>Wang, Haoxiang</au><au>Chang, Xiaojun</au><au>Yamaguchi, Shingo</au><au>Perez, Gregorio Martinez</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Guest Editorial Deep Learning Models for Industry Informatics</atitle><jtitle>IEEE transactions on industrial informatics</jtitle><stitle>TII</stitle><date>2018-07-01</date><risdate>2018</risdate><volume>14</volume><issue>7</issue><spage>3166</spage><epage>3169</epage><pages>3166-3169</pages><issn>1551-3203</issn><eissn>1941-0050</eissn><coden>ITIICH</coden><abstract>The papers in this special issue mainly focus on deep learning models for industry informatics, addressing both original algorithmic development and new applications of deep learning.</abstract><cop>Piscataway</cop><pub>IEEE</pub><doi>10.1109/TII.2018.2834547</doi><tpages>4</tpages><orcidid>https://orcid.org/0000-0002-7778-8807</orcidid><orcidid>https://orcid.org/0000-0003-4929-4698</orcidid><orcidid>https://orcid.org/0000-0001-5532-6604</orcidid><orcidid>https://orcid.org/0000-0003-0579-8501</orcidid><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1551-3203 |
| ispartof | IEEE transactions on industrial informatics, 2018-07, Vol.14 (7), p.3166-3169 |
| issn | 1551-3203 1941-0050 |
| language | eng |
| recordid | cdi_proquest_journals_2064312845 |
| source | IEEE Electronic Library (IEL) |
| subjects | Computational modeling Computer vision Feature extraction Industrial control Informatics Learning systems Machine learning Malware Predictive models Special issues and sections |
| title | Guest Editorial Deep Learning Models for Industry Informatics |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T08%3A43%3A02IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Guest%20Editorial%20Deep%20Learning%20Models%20for%20Industry%20Informatics&rft.jtitle=IEEE%20transactions%20on%20industrial%20informatics&rft.au=Agrawal,%20Dharma%20Prakash&rft.date=2018-07-01&rft.volume=14&rft.issue=7&rft.spage=3166&rft.epage=3169&rft.pages=3166-3169&rft.issn=1551-3203&rft.eissn=1941-0050&rft.coden=ITIICH&rft_id=info:doi/10.1109/TII.2018.2834547&rft_dat=%3Cproquest_RIE%3E2064312845%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2064312845&rft_id=info:pmid/&rft_ieee_id=8402153&rfr_iscdi=true |