Deconvolution–convolution treatment on powder diffraction data collected with CuKα X-ray and NiKβ filter
A method to remove small CuKβ peaks and step structures caused by NiK-edge absorption as well as CuKα2 sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution–convolution treatment applying scale trans...
Gespeichert in:
| Veröffentlicht in: | Powder diffraction 2018-06, Vol.33 (2), p.80-87 |
|---|---|
| Hauptverfasser: | , , , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 87 |
|---|---|
| container_issue | 2 |
| container_start_page | 80 |
| container_title | Powder diffraction |
| container_volume | 33 |
| creator | Ida, Takashi Ono, Shoki Hattan, Daiki Yoshida, Takehiro Takatsu, Yoshinobu Nomura, Katsuhiro |
| description | A method to remove small CuKβ peaks and step structures caused by NiK-edge absorption as well as CuKα2 sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and a realistic spectroscopic model for the source X-ray. The validity of the method has been tested by analysis of the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with the combination of CuKα X-ray source, Ni-foil Kβ filter, flat powder specimen and one-dimensional Si strip detector. The diffraction intensity data treated with the method have certainly shown background intensity profile without CuKβ peaks and NiK-edge step structures. |
| doi_str_mv | 10.1017/S0885715618000258 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cambr</sourceid><recordid>TN_cdi_proquest_journals_2061972130</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S0885715618000258</cupid><sourcerecordid>2061972130</sourcerecordid><originalsourceid>FETCH-LOGICAL-c337t-b7d6b35de62e9c617fa6de5d5b450f40ce9ac108932dec5a155ef57c67c4e06d3</originalsourceid><addsrcrecordid>eNplkM1Kw0AUhQdRsFYfwN2A6-i9mcxMspT6S4suVHAXJjM3mpImdTK1uPMdfBJ9kD6ET2JrBQVXl8P3cS4cxvYRDhFQH91AmkqNUmEKALFMN1gPs0RGOkGxyXorHK34NtvpujEAYirjHqtPyLbNc1vPQtU2n69vfxIPnkyYUBP4MkzbuSPPXVWW3thv7kww3LZ1TTaQ4_MqPPLBbLh45_eRNy_cNI5fVcPFBy-rOpDfZVulqTva-7l9dnd2eju4iEbX55eD41FkhdAhKrRThZCOVEyZVahLoxxJJ4tEQpmApcxYhDQTsSMrDUpJpdRWaZsQKCf67GDdO_Xt04y6kI_bmW-WL_MYFGY6RgFLS6wtayaFr9wD_WoI-WrW_N-s4gtb3m6P</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2061972130</pqid></control><display><type>article</type><title>Deconvolution–convolution treatment on powder diffraction data collected with CuKα X-ray and NiKβ filter</title><source>Cambridge University Press Journals Complete</source><creator>Ida, Takashi ; Ono, Shoki ; Hattan, Daiki ; Yoshida, Takehiro ; Takatsu, Yoshinobu ; Nomura, Katsuhiro</creator><creatorcontrib>Ida, Takashi ; Ono, Shoki ; Hattan, Daiki ; Yoshida, Takehiro ; Takatsu, Yoshinobu ; Nomura, Katsuhiro</creatorcontrib><description>A method to remove small CuKβ peaks and step structures caused by NiK-edge absorption as well as CuKα2 sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and a realistic spectroscopic model for the source X-ray. The validity of the method has been tested by analysis of the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with the combination of CuKα X-ray source, Ni-foil Kβ filter, flat powder specimen and one-dimensional Si strip detector. The diffraction intensity data treated with the method have certainly shown background intensity profile without CuKβ peaks and NiK-edge step structures.</description><identifier>ISSN: 0885-7156</identifier><identifier>EISSN: 1945-7413</identifier><identifier>DOI: 10.1017/S0885715618000258</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Convolution ; Copper ; Deconvolution ; Diffraction ; Foils ; Fourier transforms ; Laboratories ; Nickel ; Sensors ; Technical Article ; X ray sources ; X-ray diffraction ; X-rays</subject><ispartof>Powder diffraction, 2018-06, Vol.33 (2), p.80-87</ispartof><rights>Copyright © International Centre for Diffraction Data 2018</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S0885715618000258/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,777,781,27905,27906,55609</link.rule.ids></links><search><creatorcontrib>Ida, Takashi</creatorcontrib><creatorcontrib>Ono, Shoki</creatorcontrib><creatorcontrib>Hattan, Daiki</creatorcontrib><creatorcontrib>Yoshida, Takehiro</creatorcontrib><creatorcontrib>Takatsu, Yoshinobu</creatorcontrib><creatorcontrib>Nomura, Katsuhiro</creatorcontrib><title>Deconvolution–convolution treatment on powder diffraction data collected with CuKα X-ray and NiKβ filter</title><title>Powder diffraction</title><addtitle>Powder Diffr</addtitle><description>A method to remove small CuKβ peaks and step structures caused by NiK-edge absorption as well as CuKα2 sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and a realistic spectroscopic model for the source X-ray. The validity of the method has been tested by analysis of the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with the combination of CuKα X-ray source, Ni-foil Kβ filter, flat powder specimen and one-dimensional Si strip detector. The diffraction intensity data treated with the method have certainly shown background intensity profile without CuKβ peaks and NiK-edge step structures.</description><subject>Convolution</subject><subject>Copper</subject><subject>Deconvolution</subject><subject>Diffraction</subject><subject>Foils</subject><subject>Fourier transforms</subject><subject>Laboratories</subject><subject>Nickel</subject><subject>Sensors</subject><subject>Technical Article</subject><subject>X ray sources</subject><subject>X-ray diffraction</subject><subject>X-rays</subject><issn>0885-7156</issn><issn>1945-7413</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNplkM1Kw0AUhQdRsFYfwN2A6-i9mcxMspT6S4suVHAXJjM3mpImdTK1uPMdfBJ9kD6ET2JrBQVXl8P3cS4cxvYRDhFQH91AmkqNUmEKALFMN1gPs0RGOkGxyXorHK34NtvpujEAYirjHqtPyLbNc1vPQtU2n69vfxIPnkyYUBP4MkzbuSPPXVWW3thv7kww3LZ1TTaQ4_MqPPLBbLh45_eRNy_cNI5fVcPFBy-rOpDfZVulqTva-7l9dnd2eju4iEbX55eD41FkhdAhKrRThZCOVEyZVahLoxxJJ4tEQpmApcxYhDQTsSMrDUpJpdRWaZsQKCf67GDdO_Xt04y6kI_bmW-WL_MYFGY6RgFLS6wtayaFr9wD_WoI-WrW_N-s4gtb3m6P</recordid><startdate>20180601</startdate><enddate>20180601</enddate><creator>Ida, Takashi</creator><creator>Ono, Shoki</creator><creator>Hattan, Daiki</creator><creator>Yoshida, Takehiro</creator><creator>Takatsu, Yoshinobu</creator><creator>Nomura, Katsuhiro</creator><general>Cambridge University Press</general><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope></search><sort><creationdate>20180601</creationdate><title>Deconvolution–convolution treatment on powder diffraction data collected with CuKα X-ray and NiKβ filter</title><author>Ida, Takashi ; Ono, Shoki ; Hattan, Daiki ; Yoshida, Takehiro ; Takatsu, Yoshinobu ; Nomura, Katsuhiro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c337t-b7d6b35de62e9c617fa6de5d5b450f40ce9ac108932dec5a155ef57c67c4e06d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Convolution</topic><topic>Copper</topic><topic>Deconvolution</topic><topic>Diffraction</topic><topic>Foils</topic><topic>Fourier transforms</topic><topic>Laboratories</topic><topic>Nickel</topic><topic>Sensors</topic><topic>Technical Article</topic><topic>X ray sources</topic><topic>X-ray diffraction</topic><topic>X-rays</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ida, Takashi</creatorcontrib><creatorcontrib>Ono, Shoki</creatorcontrib><creatorcontrib>Hattan, Daiki</creatorcontrib><creatorcontrib>Yoshida, Takehiro</creatorcontrib><creatorcontrib>Takatsu, Yoshinobu</creatorcontrib><creatorcontrib>Nomura, Katsuhiro</creatorcontrib><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Powder diffraction</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ida, Takashi</au><au>Ono, Shoki</au><au>Hattan, Daiki</au><au>Yoshida, Takehiro</au><au>Takatsu, Yoshinobu</au><au>Nomura, Katsuhiro</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Deconvolution–convolution treatment on powder diffraction data collected with CuKα X-ray and NiKβ filter</atitle><jtitle>Powder diffraction</jtitle><addtitle>Powder Diffr</addtitle><date>2018-06-01</date><risdate>2018</risdate><volume>33</volume><issue>2</issue><spage>80</spage><epage>87</epage><pages>80-87</pages><issn>0885-7156</issn><eissn>1945-7413</eissn><abstract>A method to remove small CuKβ peaks and step structures caused by NiK-edge absorption as well as CuKα2 sub-peaks from powder diffraction intensity data measured with Cu-target X-ray source and Ni-foil filter is proposed. The method is based on deconvolution–convolution treatment applying scale transform of abscissa, Fourier transform, and a realistic spectroscopic model for the source X-ray. The validity of the method has been tested by analysis of the powder diffraction data of a standard LaB6 powder (NIST SRM660a) sample, collected with the combination of CuKα X-ray source, Ni-foil Kβ filter, flat powder specimen and one-dimensional Si strip detector. The diffraction intensity data treated with the method have certainly shown background intensity profile without CuKβ peaks and NiK-edge step structures.</abstract><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S0885715618000258</doi><tpages>8</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0885-7156 |
| ispartof | Powder diffraction, 2018-06, Vol.33 (2), p.80-87 |
| issn | 0885-7156 1945-7413 |
| language | eng |
| recordid | cdi_proquest_journals_2061972130 |
| source | Cambridge University Press Journals Complete |
| subjects | Convolution Copper Deconvolution Diffraction Foils Fourier transforms Laboratories Nickel Sensors Technical Article X ray sources X-ray diffraction X-rays |
| title | Deconvolution–convolution treatment on powder diffraction data collected with CuKα X-ray and NiKβ filter |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-19T10%3A37%3A49IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cambr&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Deconvolution%E2%80%93convolution%20treatment%20on%20powder%20diffraction%20data%20collected%20with%20CuK%CE%B1%20X-ray%20and%20NiK%CE%B2%20filter&rft.jtitle=Powder%20diffraction&rft.au=Ida,%20Takashi&rft.date=2018-06-01&rft.volume=33&rft.issue=2&rft.spage=80&rft.epage=87&rft.pages=80-87&rft.issn=0885-7156&rft.eissn=1945-7413&rft_id=info:doi/10.1017/S0885715618000258&rft_dat=%3Cproquest_cambr%3E2061972130%3C/proquest_cambr%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2061972130&rft_id=info:pmid/&rft_cupid=10_1017_S0885715618000258&rfr_iscdi=true |