Structural, Electrical, and Ferroelectric Properties of Nb-Doped Na0.5Bi4.5Ti4O15 Thin Films
Ferroelectric Na0.5Bi4.5Ti4O15 (NaBTi) and donor Nb‐doped Na0.5Bi4.5Ti3.94Nb0.06O15 (NaBTiNb) thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates using a chemical solution deposition method. The doping with Nb5+‐ions leads to tremendous improvements in the ferroelectric properties of the...
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creator | Raghavan, Chinnambedu Murugesan Kim, Jin Won Kim, Sang Su |
description | Ferroelectric Na0.5Bi4.5Ti4O15 (NaBTi) and donor Nb‐doped Na0.5Bi4.5Ti3.94Nb0.06O15 (NaBTiNb) thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates using a chemical solution deposition method. The doping with Nb5+‐ions leads to tremendous improvements in the ferroelectric properties of the NaBTiNb thin film. Room‐temperature ferroelectricity with a large remnant polarization (2Pr) of 64.1 μC/cm2 and a low coercive field (2Ec) of 165 kV/cm at an applied electric field of 475 kV/cm was observed for the NaBTiNb thin film. The polarization fatigue study revealed that the NaBTiNb thin film exhibited good fatigue endurance compared with the NaBTi thin film. Furthermore, the NaBTiNb thin film showed a low leakage current density, which was 1.48 × 10−6 A/cm2 at an applied electric field of 100 kV/cm. |
doi_str_mv | 10.1111/jace.13744 |
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The doping with Nb5+‐ions leads to tremendous improvements in the ferroelectric properties of the NaBTiNb thin film. Room‐temperature ferroelectricity with a large remnant polarization (2Pr) of 64.1 μC/cm2 and a low coercive field (2Ec) of 165 kV/cm at an applied electric field of 475 kV/cm was observed for the NaBTiNb thin film. The polarization fatigue study revealed that the NaBTiNb thin film exhibited good fatigue endurance compared with the NaBTi thin film. Furthermore, the NaBTiNb thin film showed a low leakage current density, which was 1.48 × 10−6 A/cm2 at an applied electric field of 100 kV/cm.</description><identifier>ISSN: 0002-7820</identifier><identifier>EISSN: 1551-2916</identifier><identifier>DOI: 10.1111/jace.13744</identifier><language>eng</language><publisher>Columbus: Blackwell Publishing Ltd</publisher><subject>Coercivity ; Electric fields ; Electricity ; Endurance ; Ferroelectric materials ; Ferroelectricity ; Leakage current ; Niobium ; Organic chemistry ; Polarization ; Silicon dioxide ; Silicon substrates ; Thin films</subject><ispartof>Journal of the American Ceramic Society, 2015-10, Vol.98 (10), p.3153-3158</ispartof><rights>2015 The American Ceramic Society</rights><rights>2015 American Ceramic Society</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1111%2Fjace.13744$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1111%2Fjace.13744$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1417,27924,27925,45574,45575</link.rule.ids></links><search><contributor>Ihlefeld, J.</contributor><creatorcontrib>Raghavan, Chinnambedu Murugesan</creatorcontrib><creatorcontrib>Kim, Jin Won</creatorcontrib><creatorcontrib>Kim, Sang Su</creatorcontrib><title>Structural, Electrical, and Ferroelectric Properties of Nb-Doped Na0.5Bi4.5Ti4O15 Thin Films</title><title>Journal of the American Ceramic Society</title><addtitle>J. Am. Ceram. Soc</addtitle><description>Ferroelectric Na0.5Bi4.5Ti4O15 (NaBTi) and donor Nb‐doped Na0.5Bi4.5Ti3.94Nb0.06O15 (NaBTiNb) thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates using a chemical solution deposition method. The doping with Nb5+‐ions leads to tremendous improvements in the ferroelectric properties of the NaBTiNb thin film. Room‐temperature ferroelectricity with a large remnant polarization (2Pr) of 64.1 μC/cm2 and a low coercive field (2Ec) of 165 kV/cm at an applied electric field of 475 kV/cm was observed for the NaBTiNb thin film. The polarization fatigue study revealed that the NaBTiNb thin film exhibited good fatigue endurance compared with the NaBTi thin film. Furthermore, the NaBTiNb thin film showed a low leakage current density, which was 1.48 × 10−6 A/cm2 at an applied electric field of 100 kV/cm.</description><subject>Coercivity</subject><subject>Electric fields</subject><subject>Electricity</subject><subject>Endurance</subject><subject>Ferroelectric materials</subject><subject>Ferroelectricity</subject><subject>Leakage current</subject><subject>Niobium</subject><subject>Organic chemistry</subject><subject>Polarization</subject><subject>Silicon dioxide</subject><subject>Silicon substrates</subject><subject>Thin films</subject><issn>0002-7820</issn><issn>1551-2916</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><recordid>eNo9UMtOwzAQtBBIlMKFL7DElQQ_Y-dYSh9AlSIo4oJkOYktXEJTnETQv8d9iL3szGpmVhoALjGKcZibpS5MjKlg7Aj0MOc4IilOjkEPIUQiIQk6BWdNswwUp5L1wPtL67ui7byuruGoMkXrXbHFelXCsfG-NocjfPL12vjWmQbWFmZ5dBd4CTONYn7rWMwXjs0xh4sPt4JjV3015-DE6qoxF4fdB6_j0WI4jWbzyf1wMIscSSiLqCy5xKk2lOqclhQXBHFihUm5tlKUhUkYz7k0DNlcMFtoyQxBuRZWlkSntA-u9rlrX393pmnVsu78KrxUISnlOEkQDSq8V_24ymzU2rsv7TcKI7WtTm2rU7vq1MNgONqh4In2Hte05vffo_2nSgQVXL1lE_WY8ekseU6D-w_qZ3DA</recordid><startdate>201510</startdate><enddate>201510</enddate><creator>Raghavan, Chinnambedu Murugesan</creator><creator>Kim, Jin Won</creator><creator>Kim, Sang Su</creator><general>Blackwell Publishing Ltd</general><general>Wiley Subscription Services, Inc</general><scope>BSCLL</scope><scope>7QQ</scope><scope>7SR</scope><scope>8FD</scope><scope>JG9</scope></search><sort><creationdate>201510</creationdate><title>Structural, Electrical, and Ferroelectric Properties of Nb-Doped Na0.5Bi4.5Ti4O15 Thin Films</title><author>Raghavan, Chinnambedu Murugesan ; Kim, Jin Won ; Kim, Sang Su</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i2634-38d5819ae33ab3d31c2052f7e95af87dce645b58e40fb74fca84e20ba7f8d2a93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>Coercivity</topic><topic>Electric fields</topic><topic>Electricity</topic><topic>Endurance</topic><topic>Ferroelectric materials</topic><topic>Ferroelectricity</topic><topic>Leakage current</topic><topic>Niobium</topic><topic>Organic chemistry</topic><topic>Polarization</topic><topic>Silicon dioxide</topic><topic>Silicon substrates</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Raghavan, Chinnambedu Murugesan</creatorcontrib><creatorcontrib>Kim, Jin Won</creatorcontrib><creatorcontrib>Kim, Sang Su</creatorcontrib><collection>Istex</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of the American Ceramic Society</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Raghavan, Chinnambedu Murugesan</au><au>Kim, Jin Won</au><au>Kim, Sang Su</au><au>Ihlefeld, J.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural, Electrical, and Ferroelectric Properties of Nb-Doped Na0.5Bi4.5Ti4O15 Thin Films</atitle><jtitle>Journal of the American Ceramic Society</jtitle><addtitle>J. Am. Ceram. Soc</addtitle><date>2015-10</date><risdate>2015</risdate><volume>98</volume><issue>10</issue><spage>3153</spage><epage>3158</epage><pages>3153-3158</pages><issn>0002-7820</issn><eissn>1551-2916</eissn><abstract>Ferroelectric Na0.5Bi4.5Ti4O15 (NaBTi) and donor Nb‐doped Na0.5Bi4.5Ti3.94Nb0.06O15 (NaBTiNb) thin films were prepared on Pt(111)/Ti/SiO2/Si(100) substrates using a chemical solution deposition method. The doping with Nb5+‐ions leads to tremendous improvements in the ferroelectric properties of the NaBTiNb thin film. Room‐temperature ferroelectricity with a large remnant polarization (2Pr) of 64.1 μC/cm2 and a low coercive field (2Ec) of 165 kV/cm at an applied electric field of 475 kV/cm was observed for the NaBTiNb thin film. The polarization fatigue study revealed that the NaBTiNb thin film exhibited good fatigue endurance compared with the NaBTi thin film. Furthermore, the NaBTiNb thin film showed a low leakage current density, which was 1.48 × 10−6 A/cm2 at an applied electric field of 100 kV/cm.</abstract><cop>Columbus</cop><pub>Blackwell Publishing Ltd</pub><doi>10.1111/jace.13744</doi><tpages>6</tpages></addata></record> |
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subjects | Coercivity Electric fields Electricity Endurance Ferroelectric materials Ferroelectricity Leakage current Niobium Organic chemistry Polarization Silicon dioxide Silicon substrates Thin films |
title | Structural, Electrical, and Ferroelectric Properties of Nb-Doped Na0.5Bi4.5Ti4O15 Thin Films |
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