Experimental evidence of the thickness- and electric-field-dependent topological phase transitions in topological crystalline insulator SnTe(111) thin films

Using in situ angle-resolved photoemission spectroscopy, we systematically studied molecular-beam-epitaxy-grown topological crystalline insulator SnTe(111) thin films with varied thicknesses and substrate conditions. An oscillation in the band gap size with an increase in thickness was observed to d...

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