Dislocation Analysis of p Type and Insulating HPHT Diamond Seed Crystals

The dislocation of a p+ high-temperature, high-pressure (HPHT) seed crystal is analyzed by X-ray topography using a SR light source, and compared with that of an insulating HPHT seed crystal. The dislocation density of the typical insulating HPHT substrate is around 250 cm-2. Over several years, sig...

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Veröffentlicht in:Materials science forum 2018-06, Vol.924, p.208-211, Article 208
Hauptverfasser: Tsuchida, Yuki, Kamei, Eiichi, Shikata, Shinichi, Yamaguchi, Koji, Takahashi, Hiroyuki
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Sprache:eng
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