Preparation and optoelectronic properties of a-IGZO thin films deposited by RF magnetron sputtering at different working pressures
Transparent oxide semiconductor, a-IGZO, thin films were prepared by high-vacuum RF magnetron sputtering at different working pressures. The effect of working pressure on crystal structure, surface morphology, and electrical and optical properties of the films was studied. The highest hall mobility...
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Veröffentlicht in: | Rare metals 2018-07, Vol.37 (7), p.599-603 |
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Sprache: | eng |
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