A `beam-selection' high-resolution X-ray diffractometer

A new diffractometer that can be described as a high‐intensity low‐background high‐resolution diffractometer for analysing perfect, nearly perfect and highly imperfect materials on a routine basis is presented. The instrumentation is very simple and uncomplicated, yet the way in which it works is le...

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Veröffentlicht in:	Journal of applied crystallography 2004-08, Vol.37 (4), p.565-574
1. Verfasser:	Fewster, Paul F.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties diffractometer Exact sciences and technology high-resolution diffractometry microdiffraction Physics Single-crystal and powder diffraction Structure of solids and liquids crystallography X-ray diffraction and scattering X-ray diffractometry
Online-Zugang:	Volltext
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