A `beam-selection' high-resolution X-ray diffractometer
A new diffractometer that can be described as a high‐intensity low‐background high‐resolution diffractometer for analysing perfect, nearly perfect and highly imperfect materials on a routine basis is presented. The instrumentation is very simple and uncomplicated, yet the way in which it works is le...
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| Veröffentlicht in: | Journal of applied crystallography 2004-08, Vol.37 (4), p.565-574 |
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| container_end_page | 574 |
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| container_issue | 4 |
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| container_title | Journal of applied crystallography |
| container_volume | 37 |
| creator | Fewster, Paul F. |
| description | A new diffractometer that can be described as a high‐intensity low‐background high‐resolution diffractometer for analysing perfect, nearly perfect and highly imperfect materials on a routine basis is presented. The instrumentation is very simple and uncomplicated, yet the way in which it works is less obvious. The sample requires minimal sample alignment, the resolution can be adjusted to optimize the experiment and the wavelength dispersion can be controlled. This diffractometer can produce near perfect profiles from bent and imperfect samples. The illuminated area can easily be varied from greater than 3 mm down to 50 µm diameter, offering great opportunities in microdiffraction with high resolution. The instrument appears similar to a double‐crystal diffractometer in reverse, i.e. the sample and collimating crystal of a conventional double‐crystal diffractometer are reversed; however, the concept is quite different. |
| doi_str_mv | 10.1107/S0021889804011094 |
| format | Article |
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The instrument appears similar to a double‐crystal diffractometer in reverse, i.e. the sample and collimating crystal of a conventional double‐crystal diffractometer are reversed; however, the concept is quite different.</description><identifier>ISSN: 1600-5767</identifier><identifier>ISSN: 0021-8898</identifier><identifier>EISSN: 1600-5767</identifier><identifier>DOI: 10.1107/S0021889804011094</identifier><identifier>CODEN: JACGAR</identifier><language>eng</language><publisher>5 Abbey Square, Chester, Cheshire CH1 2HU, England: Munksgaard International Publishers</publisher><subject>Condensed matter: structure, mechanical and thermal properties ; diffractometer ; Exact sciences and technology ; high-resolution diffractometry ; microdiffraction ; Physics ; Single-crystal and powder diffraction ; Structure of solids and liquids; crystallography ; X-ray diffraction and scattering ; X-ray diffractometry</subject><ispartof>Journal of applied crystallography, 2004-08, Vol.37 (4), p.565-574</ispartof><rights>2004 INIST-CNRS</rights><rights>International Union of Crystallography, 2004</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c3877-833ae9d10fcc641349d5d3241d357e8daeaf0557c9d7d0450d581b265af5e14b3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://onlinelibrary.wiley.com/doi/pdf/10.1107%2FS0021889804011094$$EPDF$$P50$$Gwiley$$H</linktopdf><linktohtml>$$Uhttps://onlinelibrary.wiley.com/doi/full/10.1107%2FS0021889804011094$$EHTML$$P50$$Gwiley$$H</linktohtml><link.rule.ids>314,780,784,1417,27924,27925,45574,45575</link.rule.ids><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=15975043$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Fewster, Paul F.</creatorcontrib><title>A `beam-selection' high-resolution X-ray diffractometer</title><title>Journal of applied crystallography</title><addtitle>J. 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The instrument appears similar to a double‐crystal diffractometer in reverse, i.e. the sample and collimating crystal of a conventional double‐crystal diffractometer are reversed; however, the concept is quite different.</description><subject>Condensed matter: structure, mechanical and thermal properties</subject><subject>diffractometer</subject><subject>Exact sciences and technology</subject><subject>high-resolution diffractometry</subject><subject>microdiffraction</subject><subject>Physics</subject><subject>Single-crystal and powder diffraction</subject><subject>Structure of solids and liquids; crystallography</subject><subject>X-ray diffraction and scattering</subject><subject>X-ray diffractometry</subject><issn>1600-5767</issn><issn>0021-8898</issn><issn>1600-5767</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2004</creationdate><recordtype>article</recordtype><recordid>eNqFkEFLAzEQhRdRsFZ_gLdFEE_RySbZJMdStSptBavUW0yTrN267dZki_bfu2WLCh48zfB43xvmRdExhnOMgV-MABIshBRAoRYk3YlaOAVAjKd899e-Hx2EMAPAKU-SVsQ78cvE6TkKrnCmysvFWTzNX6fIu1AWq40QPyOv17HNs8xrU5VzVzl_GO1lugjuaDvb0dP11WP3BvXve7fdTh8ZIjhHghDtpMWQGZNSTKi0zJKEYksYd8JqpzNgjBtpuQXKwDKBJ0nKdMYcphPSjk6a3KUv31cuVGpWrvyiPqkSYIBlAmltwo3J-DIE7zK19Plc-7XCoDb1qD_11MzpNlgHo4v6tYXJww_IJGdASe0Tje8jL9z6_2B1130YDBgAr1HUoHmo3Oc3qv2bSjnhTI2HPXUpRpLwwVgNyRfEA4HD</recordid><startdate>200408</startdate><enddate>200408</enddate><creator>Fewster, Paul F.</creator><general>Munksgaard International Publishers</general><general>Blackwell</general><general>Blackwell Publishing Ltd</general><scope>BSCLL</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>200408</creationdate><title>A `beam-selection' high-resolution X-ray diffractometer</title><author>Fewster, Paul F.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c3877-833ae9d10fcc641349d5d3241d357e8daeaf0557c9d7d0450d581b265af5e14b3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Condensed matter: structure, mechanical and thermal properties</topic><topic>diffractometer</topic><topic>Exact sciences and technology</topic><topic>high-resolution diffractometry</topic><topic>microdiffraction</topic><topic>Physics</topic><topic>Single-crystal and powder diffraction</topic><topic>Structure of solids and liquids; crystallography</topic><topic>X-ray diffraction and scattering</topic><topic>X-ray diffractometry</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Fewster, Paul F.</creatorcontrib><collection>Istex</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of applied crystallography</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Fewster, Paul F.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A `beam-selection' high-resolution X-ray diffractometer</atitle><jtitle>Journal of applied crystallography</jtitle><addtitle>J. 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| ispartof | Journal of applied crystallography, 2004-08, Vol.37 (4), p.565-574 |
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| language | eng |
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| source | Access via Wiley Online Library; Alma/SFX Local Collection |
| subjects | Condensed matter: structure, mechanical and thermal properties diffractometer Exact sciences and technology high-resolution diffractometry microdiffraction Physics Single-crystal and powder diffraction Structure of solids and liquids crystallography X-ray diffraction and scattering X-ray diffractometry |
| title | A `beam-selection' high-resolution X-ray diffractometer |
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