Study of Fracture Mechanics in Testing Interfacial Fracture of Solder Joints

This paper is concerned with the mechanics of interfacial fracture that are active in two common testing configurations of solder joint reliability. Utilizing eutectic Pb-Sn/Cu as a reference system and assuming the presence of a predefined crack size in the intermetallic compound (IMC) layer, stres...

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Veröffentlicht in:Journal of electronic materials 2008-04, Vol.37 (4), p.417-428
Hauptverfasser: Bang, W.H., Moon, M.-W., Kim, C.-U., Kang, S.H., Jung, J.P., Oh, K.H.
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container_end_page 428
container_issue 4
container_start_page 417
container_title Journal of electronic materials
container_volume 37
creator Bang, W.H.
Moon, M.-W.
Kim, C.-U.
Kang, S.H.
Jung, J.P.
Oh, K.H.
description This paper is concerned with the mechanics of interfacial fracture that are active in two common testing configurations of solder joint reliability. Utilizing eutectic Pb-Sn/Cu as a reference system and assuming the presence of a predefined crack size in the intermetallic compound (IMC) layer, stress intensity factors ( K I and K II ) at the crack are numerically calculated for the two given configurations. The analysis of the tensile test configuration reveals that the fracture occurs by the crack-opening mode ( K I mode), as anticipated, but that it is greatly assisted by the viscoplasticity of the solder. With nonuniform viscoplastic deformation across the joint, K I is found to increase much more rapidly than it would without the solder, decreasing the critical crack size to the micron scale. The same mechanism is also responsible for the development of a K II comparable to K I at the crack tip, that is, | K I /K II | ~ 1. It is also found that the predominant fracture mode in the bump shear configuration is crack opening, not crack shearing. This is an unexpected result, but numerical analyses as well as experimental observations provide consistent indications that fracture occurs by crack opening. During shear testing, bump rotation due to nonzero rotational moment in the test configuration is found to be responsible for the change in the fracture mode because the rotation makes K I become dominant over K II . With rotational moment being affected by the geometry of the bump, it is further found that the fracture behavior may vary with bump size or shape.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_204870356</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1452949871</sourcerecordid><originalsourceid>FETCH-LOGICAL-c315t-eee6490f98791863000465e922d7274c48cd51f449a2502e92e93b1d8ce865b13</originalsourceid><addsrcrecordid>eNp1kD1PwzAQhi0EEqXwA9gidsOdv-KMqKJQFMTQIrFZqeOUVMUpdjL03-MqSJ2Ybrjnee_0EnKLcI8A-UNEVEpQAE2BF5zqMzJBKThFrT7PyQS4QioZl5fkKsYtAErUOCHlsh_qQ9Y12TxUth-Cy96c_ap8a2PW-mzlYt_6TbbwvQtNZdtqdyKTtex2tQvZa9f6Pl6Ti6baRXfzN6fkY_60mr3Q8v15MXssqeUoe-qcU6KAptB5kd7jACCUdAVjdc5yYYW2tcRGiKJiElhauIKvsdbWaSXXyKfkbszdh-5nSB-abTcEn04aBkLnwKVKEI6QDV2MwTVmH9rvKhwMgjl2ZsbOTOrMHDszOjlsdGJi_caFU_D_0i8_hG06</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>204870356</pqid></control><display><type>article</type><title>Study of Fracture Mechanics in Testing Interfacial Fracture of Solder Joints</title><source>Springer Nature - Complete Springer Journals</source><creator>Bang, W.H. ; Moon, M.-W. ; Kim, C.-U. ; Kang, S.H. ; Jung, J.P. ; Oh, K.H.</creator><creatorcontrib>Bang, W.H. ; Moon, M.-W. ; Kim, C.-U. ; Kang, S.H. ; Jung, J.P. ; Oh, K.H.</creatorcontrib><description>This paper is concerned with the mechanics of interfacial fracture that are active in two common testing configurations of solder joint reliability. Utilizing eutectic Pb-Sn/Cu as a reference system and assuming the presence of a predefined crack size in the intermetallic compound (IMC) layer, stress intensity factors ( K I and K II ) at the crack are numerically calculated for the two given configurations. The analysis of the tensile test configuration reveals that the fracture occurs by the crack-opening mode ( K I mode), as anticipated, but that it is greatly assisted by the viscoplasticity of the solder. With nonuniform viscoplastic deformation across the joint, K I is found to increase much more rapidly than it would without the solder, decreasing the critical crack size to the micron scale. The same mechanism is also responsible for the development of a K II comparable to K I at the crack tip, that is, | K I /K II | ~ 1. It is also found that the predominant fracture mode in the bump shear configuration is crack opening, not crack shearing. This is an unexpected result, but numerical analyses as well as experimental observations provide consistent indications that fracture occurs by crack opening. During shear testing, bump rotation due to nonzero rotational moment in the test configuration is found to be responsible for the change in the fracture mode because the rotation makes K I become dominant over K II . With rotational moment being affected by the geometry of the bump, it is further found that the fracture behavior may vary with bump size or shape.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-008-0393-8</identifier><identifier>CODEN: JECMA5</identifier><language>eng</language><publisher>Boston: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Electronics and Microelectronics ; Fracture mechanics ; Instrumentation ; Materials Science ; Optical and Electronic Materials ; Shear tests ; Soldering ; Solid State Physics ; Stress intensity factors ; Tensile strength</subject><ispartof>Journal of electronic materials, 2008-04, Vol.37 (4), p.417-428</ispartof><rights>TMS 2008</rights><rights>Copyright Minerals, Metals &amp; Materials Society Apr 2008</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c315t-eee6490f98791863000465e922d7274c48cd51f449a2502e92e93b1d8ce865b13</citedby><cites>FETCH-LOGICAL-c315t-eee6490f98791863000465e922d7274c48cd51f449a2502e92e93b1d8ce865b13</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11664-008-0393-8$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11664-008-0393-8$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Bang, W.H.</creatorcontrib><creatorcontrib>Moon, M.-W.</creatorcontrib><creatorcontrib>Kim, C.-U.</creatorcontrib><creatorcontrib>Kang, S.H.</creatorcontrib><creatorcontrib>Jung, J.P.</creatorcontrib><creatorcontrib>Oh, K.H.</creatorcontrib><title>Study of Fracture Mechanics in Testing Interfacial Fracture of Solder Joints</title><title>Journal of electronic materials</title><addtitle>Journal of Elec Materi</addtitle><description>This paper is concerned with the mechanics of interfacial fracture that are active in two common testing configurations of solder joint reliability. Utilizing eutectic Pb-Sn/Cu as a reference system and assuming the presence of a predefined crack size in the intermetallic compound (IMC) layer, stress intensity factors ( K I and K II ) at the crack are numerically calculated for the two given configurations. The analysis of the tensile test configuration reveals that the fracture occurs by the crack-opening mode ( K I mode), as anticipated, but that it is greatly assisted by the viscoplasticity of the solder. With nonuniform viscoplastic deformation across the joint, K I is found to increase much more rapidly than it would without the solder, decreasing the critical crack size to the micron scale. The same mechanism is also responsible for the development of a K II comparable to K I at the crack tip, that is, | K I /K II | ~ 1. It is also found that the predominant fracture mode in the bump shear configuration is crack opening, not crack shearing. This is an unexpected result, but numerical analyses as well as experimental observations provide consistent indications that fracture occurs by crack opening. During shear testing, bump rotation due to nonzero rotational moment in the test configuration is found to be responsible for the change in the fracture mode because the rotation makes K I become dominant over K II . With rotational moment being affected by the geometry of the bump, it is further found that the fracture behavior may vary with bump size or shape.</description><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Electronics and Microelectronics</subject><subject>Fracture mechanics</subject><subject>Instrumentation</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Shear tests</subject><subject>Soldering</subject><subject>Solid State Physics</subject><subject>Stress intensity factors</subject><subject>Tensile strength</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>BENPR</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNp1kD1PwzAQhi0EEqXwA9gidsOdv-KMqKJQFMTQIrFZqeOUVMUpdjL03-MqSJ2Ybrjnee_0EnKLcI8A-UNEVEpQAE2BF5zqMzJBKThFrT7PyQS4QioZl5fkKsYtAErUOCHlsh_qQ9Y12TxUth-Cy96c_ap8a2PW-mzlYt_6TbbwvQtNZdtqdyKTtex2tQvZa9f6Pl6Ti6baRXfzN6fkY_60mr3Q8v15MXssqeUoe-qcU6KAptB5kd7jACCUdAVjdc5yYYW2tcRGiKJiElhauIKvsdbWaSXXyKfkbszdh-5nSB-abTcEn04aBkLnwKVKEI6QDV2MwTVmH9rvKhwMgjl2ZsbOTOrMHDszOjlsdGJi_caFU_D_0i8_hG06</recordid><startdate>20080401</startdate><enddate>20080401</enddate><creator>Bang, W.H.</creator><creator>Moon, M.-W.</creator><creator>Kim, C.-U.</creator><creator>Kang, S.H.</creator><creator>Jung, J.P.</creator><creator>Oh, K.H.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope></search><sort><creationdate>20080401</creationdate><title>Study of Fracture Mechanics in Testing Interfacial Fracture of Solder Joints</title><author>Bang, W.H. ; Moon, M.-W. ; Kim, C.-U. ; Kang, S.H. ; Jung, J.P. ; Oh, K.H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c315t-eee6490f98791863000465e922d7274c48cd51f449a2502e92e93b1d8ce865b13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Electronics and Microelectronics</topic><topic>Fracture mechanics</topic><topic>Instrumentation</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Shear tests</topic><topic>Soldering</topic><topic>Solid State Physics</topic><topic>Stress intensity factors</topic><topic>Tensile strength</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Bang, W.H.</creatorcontrib><creatorcontrib>Moon, M.-W.</creatorcontrib><creatorcontrib>Kim, C.-U.</creatorcontrib><creatorcontrib>Kang, S.H.</creatorcontrib><creatorcontrib>Jung, J.P.</creatorcontrib><creatorcontrib>Oh, K.H.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Bang, W.H.</au><au>Moon, M.-W.</au><au>Kim, C.-U.</au><au>Kang, S.H.</au><au>Jung, J.P.</au><au>Oh, K.H.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Study of Fracture Mechanics in Testing Interfacial Fracture of Solder Joints</atitle><jtitle>Journal of electronic materials</jtitle><stitle>Journal of Elec Materi</stitle><date>2008-04-01</date><risdate>2008</risdate><volume>37</volume><issue>4</issue><spage>417</spage><epage>428</epage><pages>417-428</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><coden>JECMA5</coden><abstract>This paper is concerned with the mechanics of interfacial fracture that are active in two common testing configurations of solder joint reliability. Utilizing eutectic Pb-Sn/Cu as a reference system and assuming the presence of a predefined crack size in the intermetallic compound (IMC) layer, stress intensity factors ( K I and K II ) at the crack are numerically calculated for the two given configurations. The analysis of the tensile test configuration reveals that the fracture occurs by the crack-opening mode ( K I mode), as anticipated, but that it is greatly assisted by the viscoplasticity of the solder. With nonuniform viscoplastic deformation across the joint, K I is found to increase much more rapidly than it would without the solder, decreasing the critical crack size to the micron scale. The same mechanism is also responsible for the development of a K II comparable to K I at the crack tip, that is, | K I /K II | ~ 1. It is also found that the predominant fracture mode in the bump shear configuration is crack opening, not crack shearing. This is an unexpected result, but numerical analyses as well as experimental observations provide consistent indications that fracture occurs by crack opening. During shear testing, bump rotation due to nonzero rotational moment in the test configuration is found to be responsible for the change in the fracture mode because the rotation makes K I become dominant over K II . With rotational moment being affected by the geometry of the bump, it is further found that the fracture behavior may vary with bump size or shape.</abstract><cop>Boston</cop><pub>Springer US</pub><doi>10.1007/s11664-008-0393-8</doi><tpages>12</tpages></addata></record>
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subjects Characterization and Evaluation of Materials
Chemistry and Materials Science
Electronics and Microelectronics
Fracture mechanics
Instrumentation
Materials Science
Optical and Electronic Materials
Shear tests
Soldering
Solid State Physics
Stress intensity factors
Tensile strength
title Study of Fracture Mechanics in Testing Interfacial Fracture of Solder Joints
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-12T16%3A30%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Study%20of%20Fracture%20Mechanics%20in%20Testing%20Interfacial%20Fracture%20of%20Solder%20Joints&rft.jtitle=Journal%20of%20electronic%20materials&rft.au=Bang,%20W.H.&rft.date=2008-04-01&rft.volume=37&rft.issue=4&rft.spage=417&rft.epage=428&rft.pages=417-428&rft.issn=0361-5235&rft.eissn=1543-186X&rft.coden=JECMA5&rft_id=info:doi/10.1007/s11664-008-0393-8&rft_dat=%3Cproquest_cross%3E1452949871%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=204870356&rft_id=info:pmid/&rfr_iscdi=true