Characterization of HgCdTe p-on-n heterojunction photodiodes and their defects using variable-area test structures

Characterization of HgCdTe p-on-n heterojunction photodiodes and their defects using variable-area test structures

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Veröffentlicht in:Journal of electronic materials 1997-06, Vol.26 (6), p.635-642
Hauptverfasser: Weiler, M. H., Tarnowski, G. J.
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container_title Journal of electronic materials
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Tarnowski, G. J.
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doi_str_mv 10.1007/s11664-997-0208-3
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title Characterization of HgCdTe p-on-n heterojunction photodiodes and their defects using variable-area test structures
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