Evaluation of saw damage using diamond-coated wire in crystalline silicon solar cells by photoluminescence imaging
Si ingots were sliced using a diamond-coated wire, and saw damage was observed even after damage removal etching and texturization. Since invisible microscopic damage was observed only under uncontrolled slice conditions, such damage was identified as saw damage. The wafers with saw damage exhibited...
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| Veröffentlicht in: | Japanese Journal of Applied Physics 2018-05, Vol.57 (5), p.55702 |
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| container_issue | 5 |
| container_start_page | 55702 |
| container_title | Japanese Journal of Applied Physics |
| container_volume | 57 |
| creator | Kinoshita, Kosuke Kojima, Takuto Suzuki, Ryota Kawatsu, Tomoyuki Nakamura, Kyotaro Ohshita, Yoshio Ogura, Atsushi |
| description | Si ingots were sliced using a diamond-coated wire, and saw damage was observed even after damage removal etching and texturization. Since invisible microscopic damage was observed only under uncontrolled slice conditions, such damage was identified as saw damage. The wafers with saw damage exhibited the degradation of solar cell conversion efficiency (approximately 1-2% absolute). The results of external quantum efficiency (EQE) measurements showed a slight deterioration of EQE in the short wavelength region. Current-voltage characteristic measurements showed similar results that agreed with the EQE measurement results. In addition, EQE mapping measurements were carried out at various irradiation wavelengths between 350 and 1150 nm. Areas with dark contrasts in EQE mapping correspond to saw damage. In the cells with a low conversion efficiency, both EQE mapping and PL images exhibited dark areas and lines. On the other hand, in the cells with a high conversion efficiency, a uniform distribution of saw damage was observed even with the saw damage in the PL images. We believe that sophisticated control to suppress saw damage during sawing is required to realize higher conversion efficiency solar cells in the future. |
| doi_str_mv | 10.7567/JJAP.57.055702 |
| format | Article |
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Since invisible microscopic damage was observed only under uncontrolled slice conditions, such damage was identified as saw damage. The wafers with saw damage exhibited the degradation of solar cell conversion efficiency (approximately 1-2% absolute). The results of external quantum efficiency (EQE) measurements showed a slight deterioration of EQE in the short wavelength region. Current-voltage characteristic measurements showed similar results that agreed with the EQE measurement results. In addition, EQE mapping measurements were carried out at various irradiation wavelengths between 350 and 1150 nm. Areas with dark contrasts in EQE mapping correspond to saw damage. In the cells with a low conversion efficiency, both EQE mapping and PL images exhibited dark areas and lines. On the other hand, in the cells with a high conversion efficiency, a uniform distribution of saw damage was observed even with the saw damage in the PL images. We believe that sophisticated control to suppress saw damage during sawing is required to realize higher conversion efficiency solar cells in the future.</description><identifier>ISSN: 0021-4922</identifier><identifier>EISSN: 1347-4065</identifier><identifier>DOI: 10.7567/JJAP.57.055702</identifier><identifier>CODEN: JJAPB6</identifier><language>eng</language><publisher>Tokyo: The Japan Society of Applied Physics</publisher><subject>Damage assessment ; Damage detection ; Diamond films ; Diamond machining ; Efficiency ; Energy conversion efficiency ; Mapping ; Photoluminescence ; Photovoltaic cells ; Quantum efficiency ; Sawing ; Silicon ; Solar cells ; Wire</subject><ispartof>Japanese Journal of Applied Physics, 2018-05, Vol.57 (5), p.55702</ispartof><rights>2018 The Japan Society of Applied Physics</rights><rights>Copyright Japanese Journal of Applied Physics May 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c401t-7fa0a93d4c1c71e9bc566c5444b785d170be0f383187653378614ec86ea0d8033</citedby><cites>FETCH-LOGICAL-c401t-7fa0a93d4c1c71e9bc566c5444b785d170be0f383187653378614ec86ea0d8033</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://iopscience.iop.org/article/10.7567/JJAP.57.055702/pdf$$EPDF$$P50$$Giop$$H</linktopdf><link.rule.ids>314,780,784,27924,27925,53846,53893</link.rule.ids></links><search><creatorcontrib>Kinoshita, Kosuke</creatorcontrib><creatorcontrib>Kojima, Takuto</creatorcontrib><creatorcontrib>Suzuki, Ryota</creatorcontrib><creatorcontrib>Kawatsu, Tomoyuki</creatorcontrib><creatorcontrib>Nakamura, Kyotaro</creatorcontrib><creatorcontrib>Ohshita, Yoshio</creatorcontrib><creatorcontrib>Ogura, Atsushi</creatorcontrib><title>Evaluation of saw damage using diamond-coated wire in crystalline silicon solar cells by photoluminescence imaging</title><title>Japanese Journal of Applied Physics</title><addtitle>Jpn. J. Appl. Phys</addtitle><description>Si ingots were sliced using a diamond-coated wire, and saw damage was observed even after damage removal etching and texturization. Since invisible microscopic damage was observed only under uncontrolled slice conditions, such damage was identified as saw damage. The wafers with saw damage exhibited the degradation of solar cell conversion efficiency (approximately 1-2% absolute). The results of external quantum efficiency (EQE) measurements showed a slight deterioration of EQE in the short wavelength region. Current-voltage characteristic measurements showed similar results that agreed with the EQE measurement results. In addition, EQE mapping measurements were carried out at various irradiation wavelengths between 350 and 1150 nm. Areas with dark contrasts in EQE mapping correspond to saw damage. In the cells with a low conversion efficiency, both EQE mapping and PL images exhibited dark areas and lines. On the other hand, in the cells with a high conversion efficiency, a uniform distribution of saw damage was observed even with the saw damage in the PL images. We believe that sophisticated control to suppress saw damage during sawing is required to realize higher conversion efficiency solar cells in the future.</description><subject>Damage assessment</subject><subject>Damage detection</subject><subject>Diamond films</subject><subject>Diamond machining</subject><subject>Efficiency</subject><subject>Energy conversion efficiency</subject><subject>Mapping</subject><subject>Photoluminescence</subject><subject>Photovoltaic cells</subject><subject>Quantum efficiency</subject><subject>Sawing</subject><subject>Silicon</subject><subject>Solar cells</subject><subject>Wire</subject><issn>0021-4922</issn><issn>1347-4065</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNp1kM1LwzAYh4MoOKdXzwEvInQmzVd3HGN-MdCDnkOapjMla2rSOvbfm9GBFz29vPD8nvflB8A1RjPBuLh_eVm8zZiYIcYEyk_ABBMqMoo4OwUThHKc0Xmen4OLGJu0ckbxBITVt3KD6q1voa9hVDtYqa3aGDhE225gZdXWt1WmvepNBXc2GGhbqMM-9so52xoYrbM6xaN3KkBtnIuw3MPu0_feDduERG1anXLJm5yX4KxWLpqr45yCj4fV-_IpW78-Pi8X60xThPtM1AqpOamoxlpgMy8141wzSmkpClZhgUqDalIQXAjOCBEFx9ToghuFqgIRMgU3o7cL_mswsZeNH0KbTsocUZHnHHGRqNlI6eBjDKaWXUiPhr3ESB56lYdeJRNy7DUFbseA9d2vsWlUd4DYEZNdVSf07g_0H-8PcfKGrw</recordid><startdate>20180501</startdate><enddate>20180501</enddate><creator>Kinoshita, Kosuke</creator><creator>Kojima, Takuto</creator><creator>Suzuki, Ryota</creator><creator>Kawatsu, Tomoyuki</creator><creator>Nakamura, Kyotaro</creator><creator>Ohshita, Yoshio</creator><creator>Ogura, Atsushi</creator><general>The Japan Society of Applied Physics</general><general>Japanese Journal of Applied Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20180501</creationdate><title>Evaluation of saw damage using diamond-coated wire in crystalline silicon solar cells by photoluminescence imaging</title><author>Kinoshita, Kosuke ; Kojima, Takuto ; Suzuki, Ryota ; Kawatsu, Tomoyuki ; Nakamura, Kyotaro ; Ohshita, Yoshio ; Ogura, Atsushi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c401t-7fa0a93d4c1c71e9bc566c5444b785d170be0f383187653378614ec86ea0d8033</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Damage assessment</topic><topic>Damage detection</topic><topic>Diamond films</topic><topic>Diamond machining</topic><topic>Efficiency</topic><topic>Energy conversion efficiency</topic><topic>Mapping</topic><topic>Photoluminescence</topic><topic>Photovoltaic cells</topic><topic>Quantum efficiency</topic><topic>Sawing</topic><topic>Silicon</topic><topic>Solar cells</topic><topic>Wire</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Kinoshita, Kosuke</creatorcontrib><creatorcontrib>Kojima, Takuto</creatorcontrib><creatorcontrib>Suzuki, Ryota</creatorcontrib><creatorcontrib>Kawatsu, Tomoyuki</creatorcontrib><creatorcontrib>Nakamura, Kyotaro</creatorcontrib><creatorcontrib>Ohshita, Yoshio</creatorcontrib><creatorcontrib>Ogura, Atsushi</creatorcontrib><collection>CrossRef</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Japanese Journal of Applied Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Kinoshita, Kosuke</au><au>Kojima, Takuto</au><au>Suzuki, Ryota</au><au>Kawatsu, Tomoyuki</au><au>Nakamura, Kyotaro</au><au>Ohshita, Yoshio</au><au>Ogura, Atsushi</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Evaluation of saw damage using diamond-coated wire in crystalline silicon solar cells by photoluminescence imaging</atitle><jtitle>Japanese Journal of Applied Physics</jtitle><addtitle>Jpn. J. Appl. Phys</addtitle><date>2018-05-01</date><risdate>2018</risdate><volume>57</volume><issue>5</issue><spage>55702</spage><pages>55702-</pages><issn>0021-4922</issn><eissn>1347-4065</eissn><coden>JJAPB6</coden><abstract>Si ingots were sliced using a diamond-coated wire, and saw damage was observed even after damage removal etching and texturization. Since invisible microscopic damage was observed only under uncontrolled slice conditions, such damage was identified as saw damage. The wafers with saw damage exhibited the degradation of solar cell conversion efficiency (approximately 1-2% absolute). The results of external quantum efficiency (EQE) measurements showed a slight deterioration of EQE in the short wavelength region. Current-voltage characteristic measurements showed similar results that agreed with the EQE measurement results. In addition, EQE mapping measurements were carried out at various irradiation wavelengths between 350 and 1150 nm. Areas with dark contrasts in EQE mapping correspond to saw damage. In the cells with a low conversion efficiency, both EQE mapping and PL images exhibited dark areas and lines. On the other hand, in the cells with a high conversion efficiency, a uniform distribution of saw damage was observed even with the saw damage in the PL images. We believe that sophisticated control to suppress saw damage during sawing is required to realize higher conversion efficiency solar cells in the future.</abstract><cop>Tokyo</cop><pub>The Japan Society of Applied Physics</pub><doi>10.7567/JJAP.57.055702</doi><tpages>5</tpages></addata></record> |
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| source | IOP Publishing Journals; Institute of Physics (IOP) Journals - HEAL-Link |
| subjects | Damage assessment Damage detection Diamond films Diamond machining Efficiency Energy conversion efficiency Mapping Photoluminescence Photovoltaic cells Quantum efficiency Sawing Silicon Solar cells Wire |
| title | Evaluation of saw damage using diamond-coated wire in crystalline silicon solar cells by photoluminescence imaging |
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