Controlling the properties of ZnO thin films by varying precursor concentration
This paper reports the synthesis of zinc oxide (ZnO) nanofibers, changing the molar concentration (M) of zinc acetate dihydrate (ZnAc) using 2-methoxyethanol and monoethanolamine. X-ray diffraction pattern reveal that ZnO thin films indicate good crystallinity at high precursor concentration. Atomic...
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Veröffentlicht in: | Journal of alloys and compounds 2018-04, Vol.741, p.957-968 |
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description | This paper reports the synthesis of zinc oxide (ZnO) nanofibers, changing the molar concentration (M) of zinc acetate dihydrate (ZnAc) using 2-methoxyethanol and monoethanolamine. X-ray diffraction pattern reveal that ZnO thin films indicate good crystallinity at high precursor concentration. Atomic force microscopy (AFM) images show the formation of ZnO nanofibers. The optical properties changing with increasing concentration are understood from the recorded transmittance, absorbance and reflectance measurements. The band-gap narrowing (from 3.28 eV to 3.22 eV) of n-type ZnO thin films is observed through the absorption edge by an increase in molar concentration. n-ZnO/p-Si heterojunction structure exhibits low rectifying ratio (RR). The current-voltage (I-V) characteristics show that the conductivity increases as the molar concentration of precursor decreases from 0.5 to 0.2 M. An optimum value of molar percentage for precursor concentration of ZnAc is promising for photovoltaic and display applications.
[Display omitted]
•ZnO thin films were fabricated on glass substrates.•Solution molarity affected main optic parameters.•The diode parameters of ZnO/p-Si were found to depend on molar rate. |
doi_str_mv | 10.1016/j.jallcom.2018.01.079 |
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[Display omitted]
•ZnO thin films were fabricated on glass substrates.•Solution molarity affected main optic parameters.•The diode parameters of ZnO/p-Si were found to depend on molar rate.</description><identifier>ISSN: 0925-8388</identifier><identifier>EISSN: 1873-4669</identifier><identifier>DOI: 10.1016/j.jallcom.2018.01.079</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Atomic force microscopy ; Atomic structure ; Current voltage characteristics ; Diffraction patterns ; Glass substrates ; Heterojunction ; Heterojunctions ; Molarity ; Monoethanolamine (MEA) ; Nanofibers ; Optical properties ; Precursors ; Reflectance ; Thin films ; X-ray diffraction ; Zinc acetate ; Zinc oxide ; Zinc oxides ; ZnO</subject><ispartof>Journal of alloys and compounds, 2018-04, Vol.741, p.957-968</ispartof><rights>2018 Elsevier B.V.</rights><rights>Copyright Elsevier BV Apr 15, 2018</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c337t-c8b3cc9cfb673e7a6bd308d501344138da40e7bc85c0269885146e87618f2bfc3</citedby><cites>FETCH-LOGICAL-c337t-c8b3cc9cfb673e7a6bd308d501344138da40e7bc85c0269885146e87618f2bfc3</cites><orcidid>0000-0002-1913-9833</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.jallcom.2018.01.079$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,778,782,3539,27907,27908,45978</link.rule.ids></links><search><creatorcontrib>Soylu, M.</creatorcontrib><creatorcontrib>Coskun, M.</creatorcontrib><title>Controlling the properties of ZnO thin films by varying precursor concentration</title><title>Journal of alloys and compounds</title><description>This paper reports the synthesis of zinc oxide (ZnO) nanofibers, changing the molar concentration (M) of zinc acetate dihydrate (ZnAc) using 2-methoxyethanol and monoethanolamine. X-ray diffraction pattern reveal that ZnO thin films indicate good crystallinity at high precursor concentration. Atomic force microscopy (AFM) images show the formation of ZnO nanofibers. The optical properties changing with increasing concentration are understood from the recorded transmittance, absorbance and reflectance measurements. The band-gap narrowing (from 3.28 eV to 3.22 eV) of n-type ZnO thin films is observed through the absorption edge by an increase in molar concentration. n-ZnO/p-Si heterojunction structure exhibits low rectifying ratio (RR). The current-voltage (I-V) characteristics show that the conductivity increases as the molar concentration of precursor decreases from 0.5 to 0.2 M. An optimum value of molar percentage for precursor concentration of ZnAc is promising for photovoltaic and display applications.
[Display omitted]
•ZnO thin films were fabricated on glass substrates.•Solution molarity affected main optic parameters.•The diode parameters of ZnO/p-Si were found to depend on molar rate.</description><subject>Atomic force microscopy</subject><subject>Atomic structure</subject><subject>Current voltage characteristics</subject><subject>Diffraction patterns</subject><subject>Glass substrates</subject><subject>Heterojunction</subject><subject>Heterojunctions</subject><subject>Molarity</subject><subject>Monoethanolamine (MEA)</subject><subject>Nanofibers</subject><subject>Optical properties</subject><subject>Precursors</subject><subject>Reflectance</subject><subject>Thin films</subject><subject>X-ray diffraction</subject><subject>Zinc acetate</subject><subject>Zinc oxide</subject><subject>Zinc oxides</subject><subject>ZnO</subject><issn>0925-8388</issn><issn>1873-4669</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><recordid>eNqFkE9LxDAQxYMouK5-BCHguXXSpGl6Eln8Bwt70YuX0KZTTek2Ncku-O3Nsnv3NDC892Z-j5BbBjkDJu-HfGjG0bhtXgBTObAcqvqMLJiqeCakrM_JAuqizBRX6pJchTAAAKs5W5DNyk3Ru3G00xeN30hn72b00WKgrqef0yZt7UR7O24DbX_pvvG_B-3s0ex8cJ4aNxlMIU20bromF30zBrw5zSX5eH56X71m683L2-pxnRnOq5gZ1XJjatO3suJYNbLtOKiuBMaFYFx1jQCsWqNKA4WslSqZkKgqyVRftL3hS3J3zE3__uwwRD24nZ_SSV2AELIsalBJVR5VxrsQPPZ69nabCDQDfehOD_rUnT50p4Hp1F3yPRx9mBD2Fr0OxmLC7GzCjrpz9p-EPwIFeyQ</recordid><startdate>20180415</startdate><enddate>20180415</enddate><creator>Soylu, M.</creator><creator>Coskun, M.</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><orcidid>https://orcid.org/0000-0002-1913-9833</orcidid></search><sort><creationdate>20180415</creationdate><title>Controlling the properties of ZnO thin films by varying precursor concentration</title><author>Soylu, M. ; Coskun, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c337t-c8b3cc9cfb673e7a6bd308d501344138da40e7bc85c0269885146e87618f2bfc3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2018</creationdate><topic>Atomic force microscopy</topic><topic>Atomic structure</topic><topic>Current voltage characteristics</topic><topic>Diffraction patterns</topic><topic>Glass substrates</topic><topic>Heterojunction</topic><topic>Heterojunctions</topic><topic>Molarity</topic><topic>Monoethanolamine (MEA)</topic><topic>Nanofibers</topic><topic>Optical properties</topic><topic>Precursors</topic><topic>Reflectance</topic><topic>Thin films</topic><topic>X-ray diffraction</topic><topic>Zinc acetate</topic><topic>Zinc oxide</topic><topic>Zinc oxides</topic><topic>ZnO</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Soylu, M.</creatorcontrib><creatorcontrib>Coskun, M.</creatorcontrib><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of alloys and compounds</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Soylu, M.</au><au>Coskun, M.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Controlling the properties of ZnO thin films by varying precursor concentration</atitle><jtitle>Journal of alloys and compounds</jtitle><date>2018-04-15</date><risdate>2018</risdate><volume>741</volume><spage>957</spage><epage>968</epage><pages>957-968</pages><issn>0925-8388</issn><eissn>1873-4669</eissn><abstract>This paper reports the synthesis of zinc oxide (ZnO) nanofibers, changing the molar concentration (M) of zinc acetate dihydrate (ZnAc) using 2-methoxyethanol and monoethanolamine. X-ray diffraction pattern reveal that ZnO thin films indicate good crystallinity at high precursor concentration. Atomic force microscopy (AFM) images show the formation of ZnO nanofibers. The optical properties changing with increasing concentration are understood from the recorded transmittance, absorbance and reflectance measurements. The band-gap narrowing (from 3.28 eV to 3.22 eV) of n-type ZnO thin films is observed through the absorption edge by an increase in molar concentration. n-ZnO/p-Si heterojunction structure exhibits low rectifying ratio (RR). The current-voltage (I-V) characteristics show that the conductivity increases as the molar concentration of precursor decreases from 0.5 to 0.2 M. An optimum value of molar percentage for precursor concentration of ZnAc is promising for photovoltaic and display applications.
[Display omitted]
•ZnO thin films were fabricated on glass substrates.•Solution molarity affected main optic parameters.•The diode parameters of ZnO/p-Si were found to depend on molar rate.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jallcom.2018.01.079</doi><tpages>12</tpages><orcidid>https://orcid.org/0000-0002-1913-9833</orcidid></addata></record> |
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source | Elsevier ScienceDirect Journals |
subjects | Atomic force microscopy Atomic structure Current voltage characteristics Diffraction patterns Glass substrates Heterojunction Heterojunctions Molarity Monoethanolamine (MEA) Nanofibers Optical properties Precursors Reflectance Thin films X-ray diffraction Zinc acetate Zinc oxide Zinc oxides ZnO |
title | Controlling the properties of ZnO thin films by varying precursor concentration |
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