The effect of deposition time on the structural, morphological and luminescence properties of Y2O2S:Eu3+ thin films prepared by pulsed laser deposition

Y 2 O 2 S:Eu 3+ thin films were deposited on Si (100) substrate using pulsed laser deposition technique (PLD) under 20 mTorr oxygen pressure. The effects of deposition time on the structural and photoluminescence properties were studied. X-ray diffraction analysis shows the formation of cubic and he...

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Veröffentlicht in:	Applied physics. A, Materials science & processing Materials science & processing, 2018-05, Vol.124 (5), p.1-9, Article 356
Hauptverfasser:	Korir, P. C., Dejene, F. B.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied physics Characterization and Evaluation of Materials Condensed Matter Physics Crystal structure Crystallites Electron micrographs Emission Europium Hexagonal phase Luminescence Machines Manufacturing Materials science Nanotechnology Optical and Electronic Materials Optical properties Photoluminescence Physics Physics and Astronomy Plasma Pressure effects Processes Pulsed laser deposition Silicon substrates Surfaces and Interfaces Thin Films X-ray diffraction Yttrium oxide
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