Preparation and Characterization of PbO-SrO-Na2O-Nb2O5-SiO2 Glass Ceramics Thin Film for High-Energy Storage Application

PbO-SrO-Na 2 O-Nb 2 O 5 -SiO 2 (PSNNS) glass ceramic thin films were prepared by pulsed laser deposition technology on heavily doped silicon substrates. The influence of annealing temperatures on microstructures, dielectric properties and energy storage performances of the as-prepared films were inv...

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Veröffentlicht in:	Journal of electronic materials 2018-05, Vol.47 (5), p.2940-2944
Hauptverfasser:	Tan, Feihu, Zhang, Qingmeng, Zhao, Hongbin, Wei, Feng, Du, Jun
Format:	Artikel
Sprache:	eng
Schlagworte:	Annealing Characterization and Evaluation of Materials Chemistry and Materials Science Dielectric properties Dielectric strength Electronics and Microelectronics Energy storage Field strength Glass ceramics Heat treatment Instrumentation Lead niobates Materials research Materials Science Optical and Electronic Materials Phase assemblages Pulsed laser deposition Silicon dioxide Silicon substrates Solid State Physics Thin films
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