Remote Imaging by Nanosecond Terahertz Spectrometer with Standoff Detector

Creation and application of the remote imaging spectrometer based on high power nanosecond terahertz source with standoff detector is reported. 2D transmission images of metal objects hided in nonconductive (dielectric) materials were recorded. Reflection images of metal objects mounted on silicon w...

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Veröffentlicht in:Russian physics journal 2018, Vol.60 (9), p.1638-1643
Hauptverfasser: Huang, J.-G., Huang, Z.-M., Andreev, Yu. M., Kokh, K. A., Lanskii, G. V., Potekaev, A. I., Svetlichnyi, V. A.
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container_end_page 1643
container_issue 9
container_start_page 1638
container_title Russian physics journal
container_volume 60
creator Huang, J.-G.
Huang, Z.-M.
Andreev, Yu. M.
Kokh, K. A.
Lanskii, G. V.
Potekaev, A. I.
Svetlichnyi, V. A.
description Creation and application of the remote imaging spectrometer based on high power nanosecond terahertz source with standoff detector is reported. 2D transmission images of metal objects hided in nonconductive (dielectric) materials were recorded. Reflection images of metal objects mounted on silicon wafers are recorded with simultaneous determination of the wafer parameters (thickness/material).
doi_str_mv 10.1007/s11182-018-1262-4
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source SpringerNature Journals
subjects Condensed Matter Physics
Detection equipment
Hadrons
Heavy Ions
Image transmission
Imaging systems
Lasers
Mathematical and Computational Physics
Nuclear Physics
Object recognition
Optical Devices
Optics
Photonics
Physics
Physics and Astronomy
Silicon
Silicon wafers
Theoretical
title Remote Imaging by Nanosecond Terahertz Spectrometer with Standoff Detector
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