Remote Imaging by Nanosecond Terahertz Spectrometer with Standoff Detector
Creation and application of the remote imaging spectrometer based on high power nanosecond terahertz source with standoff detector is reported. 2D transmission images of metal objects hided in nonconductive (dielectric) materials were recorded. Reflection images of metal objects mounted on silicon w...
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Veröffentlicht in: | Russian physics journal 2018, Vol.60 (9), p.1638-1643 |
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container_title | Russian physics journal |
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creator | Huang, J.-G. Huang, Z.-M. Andreev, Yu. M. Kokh, K. A. Lanskii, G. V. Potekaev, A. I. Svetlichnyi, V. A. |
description | Creation and application of the remote imaging spectrometer based on high power nanosecond terahertz source with standoff detector is reported. 2D transmission images of metal objects hided in nonconductive (dielectric) materials were recorded. Reflection images of metal objects mounted on silicon wafers are recorded with simultaneous determination of the wafer parameters (thickness/material). |
doi_str_mv | 10.1007/s11182-018-1262-4 |
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subjects | Condensed Matter Physics Detection equipment Hadrons Heavy Ions Image transmission Imaging systems Lasers Mathematical and Computational Physics Nuclear Physics Object recognition Optical Devices Optics Photonics Physics Physics and Astronomy Silicon Silicon wafers Theoretical |
title | Remote Imaging by Nanosecond Terahertz Spectrometer with Standoff Detector |
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