Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area
Two-photon absorption (TPA) pulsed-laser testing is used to analyze the TPA-induced single-event latchup sensitive-area of a specially designed test structure. This method takes into account the existence of an onset region in which the probability of triggering latchup transits between 0 and 1 as t...
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| Veröffentlicht in: | IEEE transactions on nuclear science 2018-01, Vol.65 (1), p.502-509 |
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| creator | Wang, Peng Sternberg, Andrew L. Kozub, John A. Zhang, En Xia Dodds, Nathaniel A. Jordan, Scott L. Fleetwood, Daniel M. Reed, Robert A. Schrimpf, Ronald D. |
| description | Two-photon absorption (TPA) pulsed-laser testing is used to analyze the TPA-induced single-event latchup sensitive-area of a specially designed test structure. This method takes into account the existence of an onset region in which the probability of triggering latchup transits between 0 and 1 as the laser pulse energy increases. This variability is attributed to a combination of laser pulse-to-pulse variability and variations in local carrier density and temperature. For each spatial position, the latchup probability associated with a given energy is calculated. Calculation of latchup cross section at lower laser energies, relative to onset, is improved significantly by taking into account the full probability distribution. The transition from low probability of latchup to high probability is more abrupt near the source contacts than for surrounding areas. |
| doi_str_mv | 10.1109/TNS.2017.2781199 |
| format | Article |
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(SNL-NM), Albuquerque, NM (United States)</creatorcontrib><description>Two-photon absorption (TPA) pulsed-laser testing is used to analyze the TPA-induced single-event latchup sensitive-area of a specially designed test structure. This method takes into account the existence of an onset region in which the probability of triggering latchup transits between 0 and 1 as the laser pulse energy increases. This variability is attributed to a combination of laser pulse-to-pulse variability and variations in local carrier density and temperature. For each spatial position, the latchup probability associated with a given energy is calculated. Calculation of latchup cross section at lower laser energies, relative to onset, is improved significantly by taking into account the full probability distribution. The transition from low probability of latchup to high probability is more abrupt near the source contacts than for surrounding areas.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.2017.2781199</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Carrier density ; Cross section ; Energy ; Energy measurement ; Lasers ; Mathematical analysis ; Measurement by laser beam ; NUCLEAR PHYSICS AND RADIATION PHYSICS ; onset region ; Oscilloscopes ; Photodiodes ; Photon absorption ; Probability distribution ; Pulse measurements ; sensitive area ; single-event latchup (SEL) ; Spatial distribution ; Test procedures ; Transits ; two-photon absorption (TPA) ; Uncertainty ; Variability</subject><ispartof>IEEE transactions on nuclear science, 2018-01, Vol.65 (1), p.502-509</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. 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(SNL-NM), Albuquerque, NM (United States)</creatorcontrib><title>Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>Two-photon absorption (TPA) pulsed-laser testing is used to analyze the TPA-induced single-event latchup sensitive-area of a specially designed test structure. This method takes into account the existence of an onset region in which the probability of triggering latchup transits between 0 and 1 as the laser pulse energy increases. This variability is attributed to a combination of laser pulse-to-pulse variability and variations in local carrier density and temperature. For each spatial position, the latchup probability associated with a given energy is calculated. Calculation of latchup cross section at lower laser energies, relative to onset, is improved significantly by taking into account the full probability distribution. The transition from low probability of latchup to high probability is more abrupt near the source contacts than for surrounding areas.</description><subject>Carrier density</subject><subject>Cross section</subject><subject>Energy</subject><subject>Energy measurement</subject><subject>Lasers</subject><subject>Mathematical analysis</subject><subject>Measurement by laser beam</subject><subject>NUCLEAR PHYSICS AND RADIATION PHYSICS</subject><subject>onset region</subject><subject>Oscilloscopes</subject><subject>Photodiodes</subject><subject>Photon absorption</subject><subject>Probability distribution</subject><subject>Pulse measurements</subject><subject>sensitive area</subject><subject>single-event latchup (SEL)</subject><subject>Spatial distribution</subject><subject>Test procedures</subject><subject>Transits</subject><subject>two-photon absorption (TPA)</subject><subject>Uncertainty</subject><subject>Variability</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2018</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kNFLwzAQh4MoOKfvgi9FnzMvadMmj2VMNyg62HwOWXJ1HbOdTTrYf29Hh0_H7_h-B_cR8shgwhio1_XHasKBZROeScaUuiIjJoSkTGTymowAmKQqUeqW3Hm_62MiQIzIPK_N_uQrHzVltF7m0bLbe3S0MB5buqhdZ9FFq6r-3iOdHbEOUWGC3XaHaIW1r0J1RJq3aO7JTWn66sNljsnX22w9ndPi830xzQtq4xQCFTJGodKYc3CcC8tN5lJwqoyx5IKrjUpSEGAUIrhEQQrWsA1k_d5spHPxmDwPdxsfKu1tFdBubVPXaINmCVcZZD30MkCHtvnt0Ae9a7q2_9RrpqTMuIoT2VMwULZtvG-x1Ie2-jHtSTPQZ6m6l6rPUvVFal95GioVIv7jkqWKcRH_AQrIcHk</recordid><startdate>20180101</startdate><enddate>20180101</enddate><creator>Wang, Peng</creator><creator>Sternberg, Andrew L.</creator><creator>Kozub, John A.</creator><creator>Zhang, En Xia</creator><creator>Dodds, Nathaniel A.</creator><creator>Jordan, Scott L.</creator><creator>Fleetwood, Daniel M.</creator><creator>Reed, Robert A.</creator><creator>Schrimpf, Ronald D.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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(SNL-NM), Albuquerque, NM (United States)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2018-01-01</date><risdate>2018</risdate><volume>65</volume><issue>1</issue><spage>502</spage><epage>509</epage><pages>502-509</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><abstract>Two-photon absorption (TPA) pulsed-laser testing is used to analyze the TPA-induced single-event latchup sensitive-area of a specially designed test structure. This method takes into account the existence of an onset region in which the probability of triggering latchup transits between 0 and 1 as the laser pulse energy increases. This variability is attributed to a combination of laser pulse-to-pulse variability and variations in local carrier density and temperature. For each spatial position, the latchup probability associated with a given energy is calculated. Calculation of latchup cross section at lower laser energies, relative to onset, is improved significantly by taking into account the full probability distribution. 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| subjects | Carrier density Cross section Energy Energy measurement Lasers Mathematical analysis Measurement by laser beam NUCLEAR PHYSICS AND RADIATION PHYSICS onset region Oscilloscopes Photodiodes Photon absorption Probability distribution Pulse measurements sensitive area single-event latchup (SEL) Spatial distribution Test procedures Transits two-photon absorption (TPA) Uncertainty Variability |
| title | Analysis of TPA Pulsed-Laser-Induced Single-Event Latchup Sensitive-Area |
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