Annealing effect of the InAs dot-in-well structure grown by MBE
•Annealing effect has been studied for the InAs dot-in-well structure.•The QDs with large size in DWELL are vulnerable to the annealing process above 550 °C.•Lasing wavelength of 1.31 μm was achieved by growing the top cladding layer at 540 °C.•Lasing wavelength of 1.18 μm was obtained by growing th...
Gespeichert in:
Veröffentlicht in: | Journal of crystal growth 2017-12, Vol.480, p.115-118 |
---|---|
Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | 118 |
---|---|
container_issue | |
container_start_page | 115 |
container_title | Journal of crystal growth |
container_volume | 480 |
creator | Zhao, Xuyi Wang, Peng Cao, Chunfang Yan, Jinyi Zha, Fangxing Wang, Hailong Gong, Qian |
description | •Annealing effect has been studied for the InAs dot-in-well structure.•The QDs with large size in DWELL are vulnerable to the annealing process above 550 °C.•Lasing wavelength of 1.31 μm was achieved by growing the top cladding layer at 540 °C.•Lasing wavelength of 1.18 μm was obtained by growing the top cladding layer at 600 °C.
We have demonstrated that in situ annealing effect has to be taken into account in order to realize the 1.31 μm InAs quantum dot (QD) lasers with the dot-in-well (DWELL) structure. The photoluminescence (PL) properties have been investigated for the InAs DWELL samples annealed at different temperatures in situ, simulating the annealing process during the growth of the top cladding AlGaAs layer in the laser structure. The QDs with large size in the DWELL structure are vulnerable to the annealing process at temperatures above 550 °C, revealed by the drastic change in the PL spectra. However, the DWELL structure is stable during the annealing process at 540 °C for three hours. The thermal stability of the QDs in the DWELL structure has to be considered in the growth of QD lasers for long wavelength operation. |
doi_str_mv | 10.1016/j.jcrysgro.2017.10.020 |
format | Article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1977220732</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0022024817306279</els_id><sourcerecordid>1977220732</sourcerecordid><originalsourceid>FETCH-LOGICAL-c340t-d6e9213ae12d8933539941a64e4e1419db53f19efa4ee3db48fdc223ea8082983</originalsourceid><addsrcrecordid>eNqFkE1LAzEQhoMoWKt_QQKet04-urs5aS1VCxUveg7bZFJ3WbM12bX035tSPXuZgeH9YB5CrhlMGLD8tpk0JuzjJnQTDqxIxwlwOCEjVhYimwLwUzJKk2fAZXlOLmJsAJKTwYjczbzHqq39hqJzaHraOdp_IF36WaS267PaZztsWxr7MJh-CEhT087T9Z6-PCwuyZmr2ohXv3tM3h8Xb_PnbPX6tJzPVpkREvrM5qg4ExUybkslxFQoJVmVS5TIJFN2PRWOKXSVRBR2LUtnDecCqxJKrkoxJjfH3G3ovgaMvW66IfhUqZkqCs6hEDyp8qPKhC7GgE5vQ_1Zhb1moA-wdKP_YOkDrMM9wUrG-6MR0w_fNQYdTY3eoK1DgqJtV_8X8QOpMXSz</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1977220732</pqid></control><display><type>article</type><title>Annealing effect of the InAs dot-in-well structure grown by MBE</title><source>Elsevier ScienceDirect Journals</source><creator>Zhao, Xuyi ; Wang, Peng ; Cao, Chunfang ; Yan, Jinyi ; Zha, Fangxing ; Wang, Hailong ; Gong, Qian</creator><creatorcontrib>Zhao, Xuyi ; Wang, Peng ; Cao, Chunfang ; Yan, Jinyi ; Zha, Fangxing ; Wang, Hailong ; Gong, Qian</creatorcontrib><description>•Annealing effect has been studied for the InAs dot-in-well structure.•The QDs with large size in DWELL are vulnerable to the annealing process above 550 °C.•Lasing wavelength of 1.31 μm was achieved by growing the top cladding layer at 540 °C.•Lasing wavelength of 1.18 μm was obtained by growing the top cladding layer at 600 °C.
We have demonstrated that in situ annealing effect has to be taken into account in order to realize the 1.31 μm InAs quantum dot (QD) lasers with the dot-in-well (DWELL) structure. The photoluminescence (PL) properties have been investigated for the InAs DWELL samples annealed at different temperatures in situ, simulating the annealing process during the growth of the top cladding AlGaAs layer in the laser structure. The QDs with large size in the DWELL structure are vulnerable to the annealing process at temperatures above 550 °C, revealed by the drastic change in the PL spectra. However, the DWELL structure is stable during the annealing process at 540 °C for three hours. The thermal stability of the QDs in the DWELL structure has to be considered in the growth of QD lasers for long wavelength operation.</description><identifier>ISSN: 0022-0248</identifier><identifier>EISSN: 1873-5002</identifier><identifier>DOI: 10.1016/j.jcrysgro.2017.10.020</identifier><language>eng</language><publisher>Amsterdam: Elsevier B.V</publisher><subject>A1. Photoluminescence ; A3. Molecular beam epitaxy ; A3. Quantum dots ; Aluminum gallium arsenides ; Annealing ; B2. Semiconducting III–V materials ; B3. Heterojunction semiconductor devices ; Cladding ; Indium arsenides ; Luminescence ; Molecular beam epitaxy ; Photoluminescence ; Quantum dot lasers ; Quantum dots ; Semiconductors ; Thermal stability</subject><ispartof>Journal of crystal growth, 2017-12, Vol.480, p.115-118</ispartof><rights>2017 Elsevier B.V.</rights><rights>Copyright Elsevier BV Dec 15, 2017</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c340t-d6e9213ae12d8933539941a64e4e1419db53f19efa4ee3db48fdc223ea8082983</citedby><cites>FETCH-LOGICAL-c340t-d6e9213ae12d8933539941a64e4e1419db53f19efa4ee3db48fdc223ea8082983</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.jcrysgro.2017.10.020$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3536,27903,27904,45974</link.rule.ids></links><search><creatorcontrib>Zhao, Xuyi</creatorcontrib><creatorcontrib>Wang, Peng</creatorcontrib><creatorcontrib>Cao, Chunfang</creatorcontrib><creatorcontrib>Yan, Jinyi</creatorcontrib><creatorcontrib>Zha, Fangxing</creatorcontrib><creatorcontrib>Wang, Hailong</creatorcontrib><creatorcontrib>Gong, Qian</creatorcontrib><title>Annealing effect of the InAs dot-in-well structure grown by MBE</title><title>Journal of crystal growth</title><description>•Annealing effect has been studied for the InAs dot-in-well structure.•The QDs with large size in DWELL are vulnerable to the annealing process above 550 °C.•Lasing wavelength of 1.31 μm was achieved by growing the top cladding layer at 540 °C.•Lasing wavelength of 1.18 μm was obtained by growing the top cladding layer at 600 °C.
We have demonstrated that in situ annealing effect has to be taken into account in order to realize the 1.31 μm InAs quantum dot (QD) lasers with the dot-in-well (DWELL) structure. The photoluminescence (PL) properties have been investigated for the InAs DWELL samples annealed at different temperatures in situ, simulating the annealing process during the growth of the top cladding AlGaAs layer in the laser structure. The QDs with large size in the DWELL structure are vulnerable to the annealing process at temperatures above 550 °C, revealed by the drastic change in the PL spectra. However, the DWELL structure is stable during the annealing process at 540 °C for three hours. The thermal stability of the QDs in the DWELL structure has to be considered in the growth of QD lasers for long wavelength operation.</description><subject>A1. Photoluminescence</subject><subject>A3. Molecular beam epitaxy</subject><subject>A3. Quantum dots</subject><subject>Aluminum gallium arsenides</subject><subject>Annealing</subject><subject>B2. Semiconducting III–V materials</subject><subject>B3. Heterojunction semiconductor devices</subject><subject>Cladding</subject><subject>Indium arsenides</subject><subject>Luminescence</subject><subject>Molecular beam epitaxy</subject><subject>Photoluminescence</subject><subject>Quantum dot lasers</subject><subject>Quantum dots</subject><subject>Semiconductors</subject><subject>Thermal stability</subject><issn>0022-0248</issn><issn>1873-5002</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNqFkE1LAzEQhoMoWKt_QQKet04-urs5aS1VCxUveg7bZFJ3WbM12bX035tSPXuZgeH9YB5CrhlMGLD8tpk0JuzjJnQTDqxIxwlwOCEjVhYimwLwUzJKk2fAZXlOLmJsAJKTwYjczbzHqq39hqJzaHraOdp_IF36WaS267PaZztsWxr7MJh-CEhT087T9Z6-PCwuyZmr2ohXv3tM3h8Xb_PnbPX6tJzPVpkREvrM5qg4ExUybkslxFQoJVmVS5TIJFN2PRWOKXSVRBR2LUtnDecCqxJKrkoxJjfH3G3ovgaMvW66IfhUqZkqCs6hEDyp8qPKhC7GgE5vQ_1Zhb1moA-wdKP_YOkDrMM9wUrG-6MR0w_fNQYdTY3eoK1DgqJtV_8X8QOpMXSz</recordid><startdate>20171215</startdate><enddate>20171215</enddate><creator>Zhao, Xuyi</creator><creator>Wang, Peng</creator><creator>Cao, Chunfang</creator><creator>Yan, Jinyi</creator><creator>Zha, Fangxing</creator><creator>Wang, Hailong</creator><creator>Gong, Qian</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20171215</creationdate><title>Annealing effect of the InAs dot-in-well structure grown by MBE</title><author>Zhao, Xuyi ; Wang, Peng ; Cao, Chunfang ; Yan, Jinyi ; Zha, Fangxing ; Wang, Hailong ; Gong, Qian</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c340t-d6e9213ae12d8933539941a64e4e1419db53f19efa4ee3db48fdc223ea8082983</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>A1. Photoluminescence</topic><topic>A3. Molecular beam epitaxy</topic><topic>A3. Quantum dots</topic><topic>Aluminum gallium arsenides</topic><topic>Annealing</topic><topic>B2. Semiconducting III–V materials</topic><topic>B3. Heterojunction semiconductor devices</topic><topic>Cladding</topic><topic>Indium arsenides</topic><topic>Luminescence</topic><topic>Molecular beam epitaxy</topic><topic>Photoluminescence</topic><topic>Quantum dot lasers</topic><topic>Quantum dots</topic><topic>Semiconductors</topic><topic>Thermal stability</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Zhao, Xuyi</creatorcontrib><creatorcontrib>Wang, Peng</creatorcontrib><creatorcontrib>Cao, Chunfang</creatorcontrib><creatorcontrib>Yan, Jinyi</creatorcontrib><creatorcontrib>Zha, Fangxing</creatorcontrib><creatorcontrib>Wang, Hailong</creatorcontrib><creatorcontrib>Gong, Qian</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of crystal growth</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Zhao, Xuyi</au><au>Wang, Peng</au><au>Cao, Chunfang</au><au>Yan, Jinyi</au><au>Zha, Fangxing</au><au>Wang, Hailong</au><au>Gong, Qian</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Annealing effect of the InAs dot-in-well structure grown by MBE</atitle><jtitle>Journal of crystal growth</jtitle><date>2017-12-15</date><risdate>2017</risdate><volume>480</volume><spage>115</spage><epage>118</epage><pages>115-118</pages><issn>0022-0248</issn><eissn>1873-5002</eissn><abstract>•Annealing effect has been studied for the InAs dot-in-well structure.•The QDs with large size in DWELL are vulnerable to the annealing process above 550 °C.•Lasing wavelength of 1.31 μm was achieved by growing the top cladding layer at 540 °C.•Lasing wavelength of 1.18 μm was obtained by growing the top cladding layer at 600 °C.
We have demonstrated that in situ annealing effect has to be taken into account in order to realize the 1.31 μm InAs quantum dot (QD) lasers with the dot-in-well (DWELL) structure. The photoluminescence (PL) properties have been investigated for the InAs DWELL samples annealed at different temperatures in situ, simulating the annealing process during the growth of the top cladding AlGaAs layer in the laser structure. The QDs with large size in the DWELL structure are vulnerable to the annealing process at temperatures above 550 °C, revealed by the drastic change in the PL spectra. However, the DWELL structure is stable during the annealing process at 540 °C for three hours. The thermal stability of the QDs in the DWELL structure has to be considered in the growth of QD lasers for long wavelength operation.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jcrysgro.2017.10.020</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0022-0248 |
ispartof | Journal of crystal growth, 2017-12, Vol.480, p.115-118 |
issn | 0022-0248 1873-5002 |
language | eng |
recordid | cdi_proquest_journals_1977220732 |
source | Elsevier ScienceDirect Journals |
subjects | A1. Photoluminescence A3. Molecular beam epitaxy A3. Quantum dots Aluminum gallium arsenides Annealing B2. Semiconducting III–V materials B3. Heterojunction semiconductor devices Cladding Indium arsenides Luminescence Molecular beam epitaxy Photoluminescence Quantum dot lasers Quantum dots Semiconductors Thermal stability |
title | Annealing effect of the InAs dot-in-well structure grown by MBE |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T22%3A27%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Annealing%20effect%20of%20the%20InAs%20dot-in-well%20structure%20grown%20by%20MBE&rft.jtitle=Journal%20of%20crystal%20growth&rft.au=Zhao,%20Xuyi&rft.date=2017-12-15&rft.volume=480&rft.spage=115&rft.epage=118&rft.pages=115-118&rft.issn=0022-0248&rft.eissn=1873-5002&rft_id=info:doi/10.1016/j.jcrysgro.2017.10.020&rft_dat=%3Cproquest_cross%3E1977220732%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1977220732&rft_id=info:pmid/&rft_els_id=S0022024817306279&rfr_iscdi=true |