Summary of ISO/TC 201 standard: ISO 19668—Surface chemical analysis—X‐ray photoelectron spectroscopy—Estimating and reporting detection limits for elements in homogeneous materials
This International Standard specifies a procedure by which elemental detection limits in X‐ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable...
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| Veröffentlicht in: | Surface and interface analysis 2018-01, Vol.50 (1), p.87-89 |
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| container_title | Surface and interface analysis |
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| creator | Shard, A. G. Clifford, C. A. |
| description | This International Standard specifies a procedure by which elemental detection limits in X‐ray photoelectron spectroscopy (XPS) can be estimated from data for a particular sample in common analytical situations and reported. This document is applicable to homogeneous materials and is not applicable if the depth distribution of elements is inhomogeneous within the information depth of the technique. |
| doi_str_mv | 10.1002/sia.6339 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0142-2421 |
| ispartof | Surface and interface analysis, 2018-01, Vol.50 (1), p.87-89 |
| issn | 0142-2421 1096-9918 |
| language | eng |
| recordid | cdi_proquest_journals_1974937305 |
| source | Wiley Online Library Journals Frontfile Complete |
| subjects | Chemical analysis detectability detection limits Ions peak area Spectrum analysis uncertainty X ray photoelectron spectroscopy X-rays XPS |
| title | Summary of ISO/TC 201 standard: ISO 19668—Surface chemical analysis—X‐ray photoelectron spectroscopy—Estimating and reporting detection limits for elements in homogeneous materials |
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