Selective etching of Si, SiGe, Ge and its usage for increasing the efficiency of silicon solar cells

Dependences of the etch rates for KOH and HF:H 2 O 2 :CH 3 COOH solutions on SiGe layer composition were investigated. The obtained results has been proposed to use for formation of the submicron relief on the silicon surface via selective etching of the structures with Ge(Si) self-assembled nanoisl...

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Veröffentlicht in:Semiconductors (Woodbury, N.Y.) N.Y.), 2017-12, Vol.51 (12), p.1542-1546
Hauptverfasser: Baidakova, N. A., Verbus, V. A., Morozova, E. E., Novikov, A. V., Skorohodov, E. V., Shaleev, M. V., Yurasov, D. V., Hombe, A., Kurokawa, Y., Usami, N.
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Sprache:eng
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