Microstructural Degradation of Ti-45Al-8Nb Alloy During the Fabrication Process by Electron Beam Melting
The microstructural degradation of the high Nb-TiAl alloy during the fabrication process by electron beam melting (EBM) is reported. The lamellar structure of as-EBM samples in the bottom part of the build shows significant microstructure degradation, resulting in deterioration of tensile properties...
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| Veröffentlicht in: | JOM (1989) 2017-12, Vol.69 (12), p.2596-2601 |
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| container_end_page | 2601 |
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| container_issue | 12 |
| container_start_page | 2596 |
| container_title | JOM (1989) |
| container_volume | 69 |
| creator | Kan, Wenbin Liang, Yongfeng Peng, Hui Chen, Bo Guo, Hongbo Lin, Junpin |
| description | The microstructural degradation of the high Nb-TiAl alloy during the fabrication process by electron beam melting (EBM) is reported. The lamellar structure of as-EBM samples in the bottom part of the build shows significant microstructure degradation, resulting in deterioration of tensile properties at both ambient and high temperatures. Microstructural analysis has been conducted by electron backscattered diffraction and transmission Kikuchi diffraction microscopy. The results show that the degradation of the lamellar structure is not only caused by the coarsening under the high-frequency thermal cycling during the fabrication of following layers but also attributed by the discontinuous dynamic recrystallization of the unstable initial lamellar structure resulting from the rapid solidification. |
| doi_str_mv | 10.1007/s11837-017-2592-3 |
| format | Article |
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The lamellar structure of as-EBM samples in the bottom part of the build shows significant microstructure degradation, resulting in deterioration of tensile properties at both ambient and high temperatures. Microstructural analysis has been conducted by electron backscattered diffraction and transmission Kikuchi diffraction microscopy. The results show that the degradation of the lamellar structure is not only caused by the coarsening under the high-frequency thermal cycling during the fabrication of following layers but also attributed by the discontinuous dynamic recrystallization of the unstable initial lamellar structure resulting from the rapid solidification.</description><identifier>ISSN: 1047-4838</identifier><identifier>EISSN: 1543-1851</identifier><identifier>DOI: 10.1007/s11837-017-2592-3</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Alloys ; Chemistry/Food Science ; Degradation ; Dynamic recrystallization ; Earth Sciences ; Electron backscatter diffraction ; Electron beam melting ; Engineering ; Environment ; High temperature ; Lamellar structure ; Microstructural analysis ; Microstructure ; Physics ; Rapid solidification ; Solidification ; Tensile properties ; Thermal cycling ; Titanium base alloys</subject><ispartof>JOM (1989), 2017-12, Vol.69 (12), p.2596-2601</ispartof><rights>The Minerals, Metals & Materials Society 2017</rights><rights>Copyright Springer Science & Business Media Dec 2017</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c316t-7be6ef9c8cc006eb59c41d96558ade8024cec46b7cbe339c1beb86ce13cb05f93</citedby><cites>FETCH-LOGICAL-c316t-7be6ef9c8cc006eb59c41d96558ade8024cec46b7cbe339c1beb86ce13cb05f93</cites><orcidid>0000-0002-7531-1108</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11837-017-2592-3$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11837-017-2592-3$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,41488,42557,51319</link.rule.ids></links><search><creatorcontrib>Kan, Wenbin</creatorcontrib><creatorcontrib>Liang, Yongfeng</creatorcontrib><creatorcontrib>Peng, Hui</creatorcontrib><creatorcontrib>Chen, Bo</creatorcontrib><creatorcontrib>Guo, Hongbo</creatorcontrib><creatorcontrib>Lin, Junpin</creatorcontrib><title>Microstructural Degradation of Ti-45Al-8Nb Alloy During the Fabrication Process by Electron Beam Melting</title><title>JOM (1989)</title><addtitle>JOM</addtitle><description>The microstructural degradation of the high Nb-TiAl alloy during the fabrication process by electron beam melting (EBM) is reported. The lamellar structure of as-EBM samples in the bottom part of the build shows significant microstructure degradation, resulting in deterioration of tensile properties at both ambient and high temperatures. Microstructural analysis has been conducted by electron backscattered diffraction and transmission Kikuchi diffraction microscopy. 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The lamellar structure of as-EBM samples in the bottom part of the build shows significant microstructure degradation, resulting in deterioration of tensile properties at both ambient and high temperatures. Microstructural analysis has been conducted by electron backscattered diffraction and transmission Kikuchi diffraction microscopy. The results show that the degradation of the lamellar structure is not only caused by the coarsening under the high-frequency thermal cycling during the fabrication of following layers but also attributed by the discontinuous dynamic recrystallization of the unstable initial lamellar structure resulting from the rapid solidification.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11837-017-2592-3</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0002-7531-1108</orcidid></addata></record> |
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| subjects | Alloys Chemistry/Food Science Degradation Dynamic recrystallization Earth Sciences Electron backscatter diffraction Electron beam melting Engineering Environment High temperature Lamellar structure Microstructural analysis Microstructure Physics Rapid solidification Solidification Tensile properties Thermal cycling Titanium base alloys |
| title | Microstructural Degradation of Ti-45Al-8Nb Alloy During the Fabrication Process by Electron Beam Melting |
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