Electrochemical studies of silicon nitride electron blocking layer for all-solid-state inorganic electrochromic device

All-solid-state inorganic electrochromic devices (ECD) typically suffer from the leakage current which mainly arises from bulk defects and pinholes particularly in the ion conducting layer. The leakage current can lead to rapid self-bleaching of the ECD under open circuit, increased power consumptio...

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