Structural, microstructural and optical investigations of (Bi0.5Na0.5) TiO3-LaFeO3 system
The polycrystalline samples of (((Bi 0.5 Na 0.5 ) 1−x La x )(Ti 1−x Fe x )O 3 ) (BNTLF) with x = 0.0, 0.1, 0.2, 0.3, 0.4 and 0.5 system were prepared using a solid-state reaction technique. The formation of the desired materials and their structural properties were carried out by using the X-ray dif...
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| Veröffentlicht in: | Journal of materials science. Materials in electronics 2017-06, Vol.28 (12), p.8554-8561 |
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| creator | Swain, Shwetapadma Ojha, Babita Mohanty, Suchismita |
| description | The polycrystalline samples of (((Bi
0.5
Na
0.5
)
1−x
La
x
)(Ti
1−x
Fe
x
)O
3
) (BNTLF) with x = 0.0, 0.1, 0.2, 0.3, 0.4 and 0.5 system were prepared using a solid-state reaction technique. The formation of the desired materials and their structural properties were carried out by using the X-ray diffractions. Field Emission Scanning electron microscope confirms the polycrystalline nature of the samples contains uniform grain distribution of unequal size and EDX analysis confirmed the degree of doping. Transmission electron microscopy image shows the particle size. The presence of functional group was confirmed by Fourier transform infrared spectroscopy. The dominant bands in the Raman spectra are analyzed by observing the changes in their respective peak position, width and intensities as the x increases. |
| doi_str_mv | 10.1007/s10854-017-6578-2 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1966288434</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1966288434</sourcerecordid><originalsourceid>FETCH-LOGICAL-c316t-996c45abaf0a864adeb20a03558e2e930266b3558e51e1be52a34f40a1c4b1e13</originalsourceid><addsrcrecordid>eNp1UE1LAzEQDaJgrf4AbwteFEydfG72qMWqUOzBCnoK2W22pLS7NckK_femrogXL_PFe29mHkLnBEYEIL8JBJTgGEiOpcgVpgdoQETOMFf07RANoBA55oLSY3QSwgoAJGdqgN5fou-q2Hmzvs42rvJt-B1kpllk7Ta6KtWu-bQhuqWJrm1C1tbZ5Z2DkXg2KVxlczdjeGomdsaysAvRbk7RUW3WwZ795CF6ndzPx494Ont4Gt9OccWIjLgoZMWFKU0NRkluFrakYIAJoSy1BQMqZfndCWJJaQU1jNccDKl4mSZsiC563a1vP7p0o161nW_SSk0KKalSnPGEIj1q_2HwttZb7zbG7zQBvXdQ9w7q5KDeO6hp4tCeExK2WVr_R_lf0hcybHIQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1966288434</pqid></control><display><type>article</type><title>Structural, microstructural and optical investigations of (Bi0.5Na0.5) TiO3-LaFeO3 system</title><source>SpringerLink Journals</source><creator>Swain, Shwetapadma ; Ojha, Babita ; Mohanty, Suchismita</creator><creatorcontrib>Swain, Shwetapadma ; Ojha, Babita ; Mohanty, Suchismita</creatorcontrib><description>The polycrystalline samples of (((Bi
0.5
Na
0.5
)
1−x
La
x
)(Ti
1−x
Fe
x
)O
3
) (BNTLF) with x = 0.0, 0.1, 0.2, 0.3, 0.4 and 0.5 system were prepared using a solid-state reaction technique. The formation of the desired materials and their structural properties were carried out by using the X-ray diffractions. Field Emission Scanning electron microscope confirms the polycrystalline nature of the samples contains uniform grain distribution of unequal size and EDX analysis confirmed the degree of doping. Transmission electron microscopy image shows the particle size. The presence of functional group was confirmed by Fourier transform infrared spectroscopy. The dominant bands in the Raman spectra are analyzed by observing the changes in their respective peak position, width and intensities as the x increases.</description><identifier>ISSN: 0957-4522</identifier><identifier>EISSN: 1573-482X</identifier><identifier>DOI: 10.1007/s10854-017-6578-2</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Chemistry and Materials Science ; Electron microscopes ; Electron microscopy ; Field emission microscopy ; Fourier transforms ; Functional groups ; Image transmission ; Infrared analysis ; Materials Science ; Optical and Electronic Materials ; Polycrystals ; Raman spectra ; Spectrum analysis</subject><ispartof>Journal of materials science. Materials in electronics, 2017-06, Vol.28 (12), p.8554-8561</ispartof><rights>Springer Science+Business Media New York 2017</rights><rights>Journal of Materials Science: Materials in Electronics is a copyright of Springer, (2017). All Rights Reserved.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c316t-996c45abaf0a864adeb20a03558e2e930266b3558e51e1be52a34f40a1c4b1e13</citedby><cites>FETCH-LOGICAL-c316t-996c45abaf0a864adeb20a03558e2e930266b3558e51e1be52a34f40a1c4b1e13</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s10854-017-6578-2$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s10854-017-6578-2$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27901,27902,41464,42533,51294</link.rule.ids></links><search><creatorcontrib>Swain, Shwetapadma</creatorcontrib><creatorcontrib>Ojha, Babita</creatorcontrib><creatorcontrib>Mohanty, Suchismita</creatorcontrib><title>Structural, microstructural and optical investigations of (Bi0.5Na0.5) TiO3-LaFeO3 system</title><title>Journal of materials science. Materials in electronics</title><addtitle>J Mater Sci: Mater Electron</addtitle><description>The polycrystalline samples of (((Bi
0.5
Na
0.5
)
1−x
La
x
)(Ti
1−x
Fe
x
)O
3
) (BNTLF) with x = 0.0, 0.1, 0.2, 0.3, 0.4 and 0.5 system were prepared using a solid-state reaction technique. The formation of the desired materials and their structural properties were carried out by using the X-ray diffractions. Field Emission Scanning electron microscope confirms the polycrystalline nature of the samples contains uniform grain distribution of unequal size and EDX analysis confirmed the degree of doping. Transmission electron microscopy image shows the particle size. The presence of functional group was confirmed by Fourier transform infrared spectroscopy. The dominant bands in the Raman spectra are analyzed by observing the changes in their respective peak position, width and intensities as the x increases.</description><subject>Characterization and Evaluation of Materials</subject><subject>Chemistry and Materials Science</subject><subject>Electron microscopes</subject><subject>Electron microscopy</subject><subject>Field emission microscopy</subject><subject>Fourier transforms</subject><subject>Functional groups</subject><subject>Image transmission</subject><subject>Infrared analysis</subject><subject>Materials Science</subject><subject>Optical and Electronic Materials</subject><subject>Polycrystals</subject><subject>Raman spectra</subject><subject>Spectrum analysis</subject><issn>0957-4522</issn><issn>1573-482X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>BENPR</sourceid><recordid>eNp1UE1LAzEQDaJgrf4AbwteFEydfG72qMWqUOzBCnoK2W22pLS7NckK_femrogXL_PFe29mHkLnBEYEIL8JBJTgGEiOpcgVpgdoQETOMFf07RANoBA55oLSY3QSwgoAJGdqgN5fou-q2Hmzvs42rvJt-B1kpllk7Ta6KtWu-bQhuqWJrm1C1tbZ5Z2DkXg2KVxlczdjeGomdsaysAvRbk7RUW3WwZ795CF6ndzPx494Ont4Gt9OccWIjLgoZMWFKU0NRkluFrakYIAJoSy1BQMqZfndCWJJaQU1jNccDKl4mSZsiC563a1vP7p0o161nW_SSk0KKalSnPGEIj1q_2HwttZb7zbG7zQBvXdQ9w7q5KDeO6hp4tCeExK2WVr_R_lf0hcybHIQ</recordid><startdate>20170601</startdate><enddate>20170601</enddate><creator>Swain, Shwetapadma</creator><creator>Ojha, Babita</creator><creator>Mohanty, Suchismita</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PHGZM</scope><scope>PHGZT</scope><scope>PKEHL</scope><scope>PQEST</scope><scope>PQGLB</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>S0W</scope></search><sort><creationdate>20170601</creationdate><title>Structural, microstructural and optical investigations of (Bi0.5Na0.5) TiO3-LaFeO3 system</title><author>Swain, Shwetapadma ; Ojha, Babita ; Mohanty, Suchismita</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-996c45abaf0a864adeb20a03558e2e930266b3558e51e1be52a34f40a1c4b1e13</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Chemistry and Materials Science</topic><topic>Electron microscopes</topic><topic>Electron microscopy</topic><topic>Field emission microscopy</topic><topic>Fourier transforms</topic><topic>Functional groups</topic><topic>Image transmission</topic><topic>Infrared analysis</topic><topic>Materials Science</topic><topic>Optical and Electronic Materials</topic><topic>Polycrystals</topic><topic>Raman spectra</topic><topic>Spectrum analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Swain, Shwetapadma</creatorcontrib><creatorcontrib>Ojha, Babita</creatorcontrib><creatorcontrib>Mohanty, Suchismita</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><collection>SciTech Premium Collection</collection><collection>Materials Research Database</collection><collection>Materials Science Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest Central (New)</collection><collection>ProQuest One Academic (New)</collection><collection>ProQuest One Academic Middle East (New)</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Applied & Life Sciences</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>DELNET Engineering & Technology Collection</collection><jtitle>Journal of materials science. Materials in electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Swain, Shwetapadma</au><au>Ojha, Babita</au><au>Mohanty, Suchismita</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Structural, microstructural and optical investigations of (Bi0.5Na0.5) TiO3-LaFeO3 system</atitle><jtitle>Journal of materials science. Materials in electronics</jtitle><stitle>J Mater Sci: Mater Electron</stitle><date>2017-06-01</date><risdate>2017</risdate><volume>28</volume><issue>12</issue><spage>8554</spage><epage>8561</epage><pages>8554-8561</pages><issn>0957-4522</issn><eissn>1573-482X</eissn><abstract>The polycrystalline samples of (((Bi
0.5
Na
0.5
)
1−x
La
x
)(Ti
1−x
Fe
x
)O
3
) (BNTLF) with x = 0.0, 0.1, 0.2, 0.3, 0.4 and 0.5 system were prepared using a solid-state reaction technique. The formation of the desired materials and their structural properties were carried out by using the X-ray diffractions. Field Emission Scanning electron microscope confirms the polycrystalline nature of the samples contains uniform grain distribution of unequal size and EDX analysis confirmed the degree of doping. Transmission electron microscopy image shows the particle size. The presence of functional group was confirmed by Fourier transform infrared spectroscopy. The dominant bands in the Raman spectra are analyzed by observing the changes in their respective peak position, width and intensities as the x increases.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s10854-017-6578-2</doi><tpages>8</tpages></addata></record> |
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| subjects | Characterization and Evaluation of Materials Chemistry and Materials Science Electron microscopes Electron microscopy Field emission microscopy Fourier transforms Functional groups Image transmission Infrared analysis Materials Science Optical and Electronic Materials Polycrystals Raman spectra Spectrum analysis |
| title | Structural, microstructural and optical investigations of (Bi0.5Na0.5) TiO3-LaFeO3 system |
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