Effects of annealing temperature on nanomechanical and microstructural properties of Cu-doped In2O3 thin films

In this study, the effects of post-annealing on the microstructural, surface morphological and nanomechanical properties of Cu-doped In 2 O 3 (CIO) thin films were investigated using X-ray diffraction, scanning electron microscopy and nanoindentation techniques, respectively. The CIO thin films were...

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Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2017-12, Vol.123 (12), p.1-6, Article 726
Hauptverfasser: Jian, Sheng-Rui, Chen, Guo-Ju, Lee, Jyh-Wei
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Sprache:eng
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