Investigation of Structural, Optical, and Electrical Properties of In‐Doped SnO2 Thin Films Deposited by Spray Pyrolysis

In this work, undoped and 1–5 at.% In‐doped SnO2‐δ films are deposited onto glass substrates at 350 °C by spray pyrolysis technique. The influence of dopant concentration is investigated using X‐ray diffraction (XRD), UV‐Visible spectroscopy, and Hall Effect measurements using van der Pauw method. X...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Physica status solidi. C 2017-10, Vol.14 (10), p.n/a
Hauptverfasser:	Hadri, Adil, El Hat, Abderrahim, Sekkati, Mouaad, Mzerd, Ahmed
Format:	Artikel
Sprache:	eng
Schlagworte:	Diffraction Doped films Doping Electrical properties Hall effect Mathematical analysis Optical properties Optoelectronic devices Preferred orientation Scattering SnO2 Spray pyrolysis Substrates thin film Thin films Tin dioxide X-ray diffraction X-rays
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Schreiben Sie den ersten Kommentar!