Superior performance of V^sub 2^O^sub 5^ as hole selective contact over other transition metal oxides in silicon heterojunction solar cells
Transition metal oxides (TMOs) have recently been proved to efficiently serve as hole-selective contacts in crystalline silicon (c-Si) heterojunction solar cells. In the present work, two TMO/c-Si heterojunctions are explored using MoO3 (reference) and V2O5 as an alternative candidate. It has been f...
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creator | Almora, Osbel Gerling, Luis G Voz, Cristóbal Alcubilla, Ramón Puigdollers, Joaquim Garcia-Belmonte, Germà |
description | Transition metal oxides (TMOs) have recently been proved to efficiently serve as hole-selective contacts in crystalline silicon (c-Si) heterojunction solar cells. In the present work, two TMO/c-Si heterojunctions are explored using MoO3 (reference) and V2O5 as an alternative candidate. It has been found that V2O5 devices present larger (16% improvement) power conversion efficiency mainly due to their higher open-circuit voltage. While V2O5/c-Si devices with textured front surfaces exhibit larger short-circuit currents, it is also observed that flat solar cell architectures allow for passivation of the V2O5/n-Si interface, giving significant carrier lifetimes of 200 ...s (equivalent to a surface recombination velocity of Seff ~140 cm s-1) as derived from impedance analysis. As a consequence, a significant open-circuit voltage of 662 mV is achieved. It is found that, at the TMO/c-Si contact, a TMO work function enhancement ?FTMO occurs during the heterojunction formation with the consequent dipole layer enlargement ?'=?+?FTMO. Our results provide new insights into the TMO/c-Si contact energetics, carrier transport across the interface and surface recombination allowing for further understanding of the nature of TMO/c-Si heterojunctions. |
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In the present work, two TMO/c-Si heterojunctions are explored using MoO3 (reference) and V2O5 as an alternative candidate. It has been found that V2O5 devices present larger (16% improvement) power conversion efficiency mainly due to their higher open-circuit voltage. While V2O5/c-Si devices with textured front surfaces exhibit larger short-circuit currents, it is also observed that flat solar cell architectures allow for passivation of the V2O5/n-Si interface, giving significant carrier lifetimes of 200 ...s (equivalent to a surface recombination velocity of Seff ~140 cm s-1) as derived from impedance analysis. As a consequence, a significant open-circuit voltage of 662 mV is achieved. It is found that, at the TMO/c-Si contact, a TMO work function enhancement ?FTMO occurs during the heterojunction formation with the consequent dipole layer enlargement ?'=?+?FTMO. Our results provide new insights into the TMO/c-Si contact energetics, carrier transport across the interface and surface recombination allowing for further understanding of the nature of TMO/c-Si heterojunctions.</description><identifier>ISSN: 0927-0248</identifier><language>eng</language><publisher>Amsterdam: Elsevier BV</publisher><subject>Carrier transport ; Devices ; Energy conversion efficiency ; Enlargement ; Heterojunctions ; Metal oxides ; Metals ; Open circuit voltage ; Oxides ; Photovoltaic cells ; Recombination ; Silicon ; Solar cells ; Spectrum analysis ; Transition metal oxides ; Vanadium pentoxide ; Voltage</subject><ispartof>Solar energy materials and solar cells, 2017-08, Vol.168, p.221</ispartof><rights>Copyright Elsevier BV Aug 2017</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,778,782</link.rule.ids></links><search><creatorcontrib>Almora, Osbel</creatorcontrib><creatorcontrib>Gerling, Luis G</creatorcontrib><creatorcontrib>Voz, Cristóbal</creatorcontrib><creatorcontrib>Alcubilla, Ramón</creatorcontrib><creatorcontrib>Puigdollers, Joaquim</creatorcontrib><creatorcontrib>Garcia-Belmonte, Germà</creatorcontrib><title>Superior performance of V^sub 2^O^sub 5^ as hole selective contact over other transition metal oxides in silicon heterojunction solar cells</title><title>Solar energy materials and solar cells</title><description>Transition metal oxides (TMOs) have recently been proved to efficiently serve as hole-selective contacts in crystalline silicon (c-Si) heterojunction solar cells. 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In the present work, two TMO/c-Si heterojunctions are explored using MoO3 (reference) and V2O5 as an alternative candidate. It has been found that V2O5 devices present larger (16% improvement) power conversion efficiency mainly due to their higher open-circuit voltage. While V2O5/c-Si devices with textured front surfaces exhibit larger short-circuit currents, it is also observed that flat solar cell architectures allow for passivation of the V2O5/n-Si interface, giving significant carrier lifetimes of 200 ...s (equivalent to a surface recombination velocity of Seff ~140 cm s-1) as derived from impedance analysis. As a consequence, a significant open-circuit voltage of 662 mV is achieved. It is found that, at the TMO/c-Si contact, a TMO work function enhancement ?FTMO occurs during the heterojunction formation with the consequent dipole layer enlargement ?'=?+?FTMO. Our results provide new insights into the TMO/c-Si contact energetics, carrier transport across the interface and surface recombination allowing for further understanding of the nature of TMO/c-Si heterojunctions.</abstract><cop>Amsterdam</cop><pub>Elsevier BV</pub></addata></record> |
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subjects | Carrier transport Devices Energy conversion efficiency Enlargement Heterojunctions Metal oxides Metals Open circuit voltage Oxides Photovoltaic cells Recombination Silicon Solar cells Spectrum analysis Transition metal oxides Vanadium pentoxide Voltage |
title | Superior performance of V^sub 2^O^sub 5^ as hole selective contact over other transition metal oxides in silicon heterojunction solar cells |
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