The erosion groove effects on RF planar magnetron sputtering
Magnetron sputtering erodes the target non-uniformly, leading to the formation of a circular deep trench called groove, which will have a direct effect on plasma and thin film deposition properties. These effects are highlighted by measurements of the electrical parameters and the deposition rate. M...
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Veröffentlicht in: | Surface & coatings technology 2017-01, Vol.309, p.573-578 |
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creator | Tadjine, Rabah Alim, Mounes M. Kechouane, Mohamed |
description | Magnetron sputtering erodes the target non-uniformly, leading to the formation of a circular deep trench called groove, which will have a direct effect on plasma and thin film deposition properties. These effects are highlighted by measurements of the electrical parameters and the deposition rate. Moreover, the measurements of the discharge electrical equivalent plasma impedance indicate clearly, that the occurrence of the target erosion effects is related to the ion sheath thickness formed in front of the eroded target groove. The effects of the eroded target, on discharge parameters, appear from a certain pressure transition range (0.1–0.5Pa). The eroded target lowers the self-bias voltage by 50%, reduces the deposition rate by almost 40% and increases the ion current density at the substrate. The use of an eroded target improves the plasma confinement, and the electrical equivalent impedance becomes less capacitive and more resistive. Our results show that measuring the plasma impedance might be used as a tool for monitoring the groove formation.
•Electrical characterization of an RF magnetron sputtering•The effects of an eroded target on magnetron sputtering•Study the effect of target erosion on depositing parameters•The study is based on measurements of equivalent plasma impedance, ionic current density.•This work also attempts to explain simply a possible mechanism for the observed effect. |
doi_str_mv | 10.1016/j.surfcoat.2016.12.009 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1955049113</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0257897216312956</els_id><sourcerecordid>1955049113</sourcerecordid><originalsourceid>FETCH-LOGICAL-c340t-8cb702aa003bf2277465bfa9fec8aefcbd803c15beefe1fa6bc2eaa1a752c9f33</originalsourceid><addsrcrecordid>eNqFkFFLwzAUhYMoOKd_QQo-t94kbdOAD8pwKgwEmc8hzW5my9bUJBX892ZMn326nMu953A-Qq4pFBRofdsXYfLWOB0LlnRBWQEgT8iMNkLmnJfilMyAVSJvpGDn5CKEHgCokOWM3K0_MEPvQueGbOud-0rSWjQxZGnztszGnR60z_Z6O2D0aRfGKUb03bC9JGdW7wJe_c45eV8-rhfP-er16WXxsMoNLyHmjWkFMK0BeGsZE6Ksq9ZqmVIajda0mwa4oVWLaJFaXbeGodZUi4oZaTmfk5uj7-jd54Qhqt5NfkiRisqqglJSeriqj1cm1QkerRp9t9f-W1FQB1KqV3-k1IGUokwlUunx_viIqcNXh14F0-FgcNP5BEJtXPefxQ8GCnbQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1955049113</pqid></control><display><type>article</type><title>The erosion groove effects on RF planar magnetron sputtering</title><source>Access via ScienceDirect (Elsevier)</source><creator>Tadjine, Rabah ; Alim, Mounes M. ; Kechouane, Mohamed</creator><creatorcontrib>Tadjine, Rabah ; Alim, Mounes M. ; Kechouane, Mohamed</creatorcontrib><description>Magnetron sputtering erodes the target non-uniformly, leading to the formation of a circular deep trench called groove, which will have a direct effect on plasma and thin film deposition properties. These effects are highlighted by measurements of the electrical parameters and the deposition rate. Moreover, the measurements of the discharge electrical equivalent plasma impedance indicate clearly, that the occurrence of the target erosion effects is related to the ion sheath thickness formed in front of the eroded target groove. The effects of the eroded target, on discharge parameters, appear from a certain pressure transition range (0.1–0.5Pa). The eroded target lowers the self-bias voltage by 50%, reduces the deposition rate by almost 40% and increases the ion current density at the substrate. The use of an eroded target improves the plasma confinement, and the electrical equivalent impedance becomes less capacitive and more resistive. Our results show that measuring the plasma impedance might be used as a tool for monitoring the groove formation.
•Electrical characterization of an RF magnetron sputtering•The effects of an eroded target on magnetron sputtering•Study the effect of target erosion on depositing parameters•The study is based on measurements of equivalent plasma impedance, ionic current density.•This work also attempts to explain simply a possible mechanism for the observed effect.</description><identifier>ISSN: 0257-8972</identifier><identifier>EISSN: 1879-3347</identifier><identifier>DOI: 10.1016/j.surfcoat.2016.12.009</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Deposition ; Effects ; Equivalence ; Erosion ; Impedance ; Ion current density ; Magnetron sputtering ; Plasma ; Plasma diagnostic ; Plasma impedance ; Plasmas (physics) ; Pressure ; RF plasma discharge ; Target erosion ; Thin films</subject><ispartof>Surface & coatings technology, 2017-01, Vol.309, p.573-578</ispartof><rights>2016 Elsevier B.V.</rights><rights>Copyright Elsevier BV Jan 15, 2017</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c340t-8cb702aa003bf2277465bfa9fec8aefcbd803c15beefe1fa6bc2eaa1a752c9f33</citedby><cites>FETCH-LOGICAL-c340t-8cb702aa003bf2277465bfa9fec8aefcbd803c15beefe1fa6bc2eaa1a752c9f33</cites><orcidid>0000-0002-5736-1945</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.surfcoat.2016.12.009$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,780,784,3550,27924,27925,45995</link.rule.ids></links><search><creatorcontrib>Tadjine, Rabah</creatorcontrib><creatorcontrib>Alim, Mounes M.</creatorcontrib><creatorcontrib>Kechouane, Mohamed</creatorcontrib><title>The erosion groove effects on RF planar magnetron sputtering</title><title>Surface & coatings technology</title><description>Magnetron sputtering erodes the target non-uniformly, leading to the formation of a circular deep trench called groove, which will have a direct effect on plasma and thin film deposition properties. These effects are highlighted by measurements of the electrical parameters and the deposition rate. Moreover, the measurements of the discharge electrical equivalent plasma impedance indicate clearly, that the occurrence of the target erosion effects is related to the ion sheath thickness formed in front of the eroded target groove. The effects of the eroded target, on discharge parameters, appear from a certain pressure transition range (0.1–0.5Pa). The eroded target lowers the self-bias voltage by 50%, reduces the deposition rate by almost 40% and increases the ion current density at the substrate. The use of an eroded target improves the plasma confinement, and the electrical equivalent impedance becomes less capacitive and more resistive. Our results show that measuring the plasma impedance might be used as a tool for monitoring the groove formation.
•Electrical characterization of an RF magnetron sputtering•The effects of an eroded target on magnetron sputtering•Study the effect of target erosion on depositing parameters•The study is based on measurements of equivalent plasma impedance, ionic current density.•This work also attempts to explain simply a possible mechanism for the observed effect.</description><subject>Deposition</subject><subject>Effects</subject><subject>Equivalence</subject><subject>Erosion</subject><subject>Impedance</subject><subject>Ion current density</subject><subject>Magnetron sputtering</subject><subject>Plasma</subject><subject>Plasma diagnostic</subject><subject>Plasma impedance</subject><subject>Plasmas (physics)</subject><subject>Pressure</subject><subject>RF plasma discharge</subject><subject>Target erosion</subject><subject>Thin films</subject><issn>0257-8972</issn><issn>1879-3347</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNqFkFFLwzAUhYMoOKd_QQo-t94kbdOAD8pwKgwEmc8hzW5my9bUJBX892ZMn326nMu953A-Qq4pFBRofdsXYfLWOB0LlnRBWQEgT8iMNkLmnJfilMyAVSJvpGDn5CKEHgCokOWM3K0_MEPvQueGbOud-0rSWjQxZGnztszGnR60z_Z6O2D0aRfGKUb03bC9JGdW7wJe_c45eV8-rhfP-er16WXxsMoNLyHmjWkFMK0BeGsZE6Ksq9ZqmVIajda0mwa4oVWLaJFaXbeGodZUi4oZaTmfk5uj7-jd54Qhqt5NfkiRisqqglJSeriqj1cm1QkerRp9t9f-W1FQB1KqV3-k1IGUokwlUunx_viIqcNXh14F0-FgcNP5BEJtXPefxQ8GCnbQ</recordid><startdate>20170115</startdate><enddate>20170115</enddate><creator>Tadjine, Rabah</creator><creator>Alim, Mounes M.</creator><creator>Kechouane, Mohamed</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7QQ</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><orcidid>https://orcid.org/0000-0002-5736-1945</orcidid></search><sort><creationdate>20170115</creationdate><title>The erosion groove effects on RF planar magnetron sputtering</title><author>Tadjine, Rabah ; Alim, Mounes M. ; Kechouane, Mohamed</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c340t-8cb702aa003bf2277465bfa9fec8aefcbd803c15beefe1fa6bc2eaa1a752c9f33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Deposition</topic><topic>Effects</topic><topic>Equivalence</topic><topic>Erosion</topic><topic>Impedance</topic><topic>Ion current density</topic><topic>Magnetron sputtering</topic><topic>Plasma</topic><topic>Plasma diagnostic</topic><topic>Plasma impedance</topic><topic>Plasmas (physics)</topic><topic>Pressure</topic><topic>RF plasma discharge</topic><topic>Target erosion</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tadjine, Rabah</creatorcontrib><creatorcontrib>Alim, Mounes M.</creatorcontrib><creatorcontrib>Kechouane, Mohamed</creatorcontrib><collection>CrossRef</collection><collection>Ceramic Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Surface & coatings technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tadjine, Rabah</au><au>Alim, Mounes M.</au><au>Kechouane, Mohamed</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>The erosion groove effects on RF planar magnetron sputtering</atitle><jtitle>Surface & coatings technology</jtitle><date>2017-01-15</date><risdate>2017</risdate><volume>309</volume><spage>573</spage><epage>578</epage><pages>573-578</pages><issn>0257-8972</issn><eissn>1879-3347</eissn><abstract>Magnetron sputtering erodes the target non-uniformly, leading to the formation of a circular deep trench called groove, which will have a direct effect on plasma and thin film deposition properties. These effects are highlighted by measurements of the electrical parameters and the deposition rate. Moreover, the measurements of the discharge electrical equivalent plasma impedance indicate clearly, that the occurrence of the target erosion effects is related to the ion sheath thickness formed in front of the eroded target groove. The effects of the eroded target, on discharge parameters, appear from a certain pressure transition range (0.1–0.5Pa). The eroded target lowers the self-bias voltage by 50%, reduces the deposition rate by almost 40% and increases the ion current density at the substrate. The use of an eroded target improves the plasma confinement, and the electrical equivalent impedance becomes less capacitive and more resistive. Our results show that measuring the plasma impedance might be used as a tool for monitoring the groove formation.
•Electrical characterization of an RF magnetron sputtering•The effects of an eroded target on magnetron sputtering•Study the effect of target erosion on depositing parameters•The study is based on measurements of equivalent plasma impedance, ionic current density.•This work also attempts to explain simply a possible mechanism for the observed effect.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/j.surfcoat.2016.12.009</doi><tpages>6</tpages><orcidid>https://orcid.org/0000-0002-5736-1945</orcidid></addata></record> |
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subjects | Deposition Effects Equivalence Erosion Impedance Ion current density Magnetron sputtering Plasma Plasma diagnostic Plasma impedance Plasmas (physics) Pressure RF plasma discharge Target erosion Thin films |
title | The erosion groove effects on RF planar magnetron sputtering |
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