Analysis of line profiles from transient plasmas using a pseudo-Fano function
[Display omitted] •An analytical formula for line profile analysis is proposed.•Problem of solving a Voigt convolution integral is overcome.•Physical mechanisms affecting the intrinsic lines are described.•Emissivity profiles can be retrieved.•Relative gA values of six Co I lines were determined....
Gespeichert in:
| Veröffentlicht in: | Spectrochimica acta. Part B: Atomic spectroscopy 2017-09, Vol.135, p.73-81 |
|---|---|
| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 81 |
|---|---|
| container_issue | |
| container_start_page | 73 |
| container_title | Spectrochimica acta. Part B: Atomic spectroscopy |
| container_volume | 135 |
| creator | Baéz, Guido Díaz Pace, Diego D’Angelo, Cristian Di Rocco, Héctor O. |
| description | [Display omitted]
•An analytical formula for line profile analysis is proposed.•Problem of solving a Voigt convolution integral is overcome.•Physical mechanisms affecting the intrinsic lines are described.•Emissivity profiles can be retrieved.•Relative gA values of six Co I lines were determined. |
| doi_str_mv | 10.1016/j.sab.2017.07.005 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1955047632</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><els_id>S0584854717301775</els_id><sourcerecordid>1955047632</sourcerecordid><originalsourceid>FETCH-LOGICAL-c320t-54d0dc8f9af6c4a7466fd21993542b4bf59897186459ad9f9d0f0aad899fef1e3</originalsourceid><addsrcrecordid>eNp9kM1KxDAUhYMoOP48gLuA69abNmkbXA2Do8KgG12HTJNISqepua0wb-Oz-GRmGNfCgbs53-WcQ8gNg5wBq-66HPU2L4DVOSSBOCEL1tRlVopKnJIFiIZnjeD1OblA7ACgEIVYkJfloPs9eqTB0d4Plo4xON9bpC6GHZ2iHtDbYaJjr3Gnkc7ohw-q6Yh2NiFb6yH8fLt5aCcfhity5nSP9vrvXpL39cPb6inbvD4-r5abrC0LmDLBDZi2cVK7quW65lXlTMGkLAUvtnzrhGxkzZqKC6mNdNKAA61NI6Wzjtnyktwe_6a0n7PFSXVhjqkKKiaFAF5XZZFc7OhqY0CM1qkx-p2Oe8VAHWZTnUqzqcNsCpJAJOb-yNgU_8vbqLBN_VtrfLTtpEzw_9C_c0J2gg</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1955047632</pqid></control><display><type>article</type><title>Analysis of line profiles from transient plasmas using a pseudo-Fano function</title><source>Elsevier ScienceDirect Journals</source><creator>Baéz, Guido ; Díaz Pace, Diego ; D’Angelo, Cristian ; Di Rocco, Héctor O.</creator><creatorcontrib>Baéz, Guido ; Díaz Pace, Diego ; D’Angelo, Cristian ; Di Rocco, Héctor O.</creatorcontrib><description>[Display omitted]
•An analytical formula for line profile analysis is proposed.•Problem of solving a Voigt convolution integral is overcome.•Physical mechanisms affecting the intrinsic lines are described.•Emissivity profiles can be retrieved.•Relative gA values of six Co I lines were determined.</description><identifier>ISSN: 0584-8547</identifier><identifier>EISSN: 1873-3565</identifier><identifier>DOI: 10.1016/j.sab.2017.07.005</identifier><language>eng</language><publisher>Oxford: Elsevier B.V</publisher><subject>Analysis ; Background noise ; Electrons ; Emissivity ; Plasma ; Plasmas ; Profiles ; Temperature</subject><ispartof>Spectrochimica acta. Part B: Atomic spectroscopy, 2017-09, Vol.135, p.73-81</ispartof><rights>2017 Elsevier B.V.</rights><rights>Copyright Elsevier BV Sep 1, 2017</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c320t-54d0dc8f9af6c4a7466fd21993542b4bf59897186459ad9f9d0f0aad899fef1e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://dx.doi.org/10.1016/j.sab.2017.07.005$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3536,27903,27904,45974</link.rule.ids></links><search><creatorcontrib>Baéz, Guido</creatorcontrib><creatorcontrib>Díaz Pace, Diego</creatorcontrib><creatorcontrib>D’Angelo, Cristian</creatorcontrib><creatorcontrib>Di Rocco, Héctor O.</creatorcontrib><title>Analysis of line profiles from transient plasmas using a pseudo-Fano function</title><title>Spectrochimica acta. Part B: Atomic spectroscopy</title><description>[Display omitted]
•An analytical formula for line profile analysis is proposed.•Problem of solving a Voigt convolution integral is overcome.•Physical mechanisms affecting the intrinsic lines are described.•Emissivity profiles can be retrieved.•Relative gA values of six Co I lines were determined.</description><subject>Analysis</subject><subject>Background noise</subject><subject>Electrons</subject><subject>Emissivity</subject><subject>Plasma</subject><subject>Plasmas</subject><subject>Profiles</subject><subject>Temperature</subject><issn>0584-8547</issn><issn>1873-3565</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNp9kM1KxDAUhYMoOP48gLuA69abNmkbXA2Do8KgG12HTJNISqepua0wb-Oz-GRmGNfCgbs53-WcQ8gNg5wBq-66HPU2L4DVOSSBOCEL1tRlVopKnJIFiIZnjeD1OblA7ACgEIVYkJfloPs9eqTB0d4Plo4xON9bpC6GHZ2iHtDbYaJjr3Gnkc7ohw-q6Yh2NiFb6yH8fLt5aCcfhity5nSP9vrvXpL39cPb6inbvD4-r5abrC0LmDLBDZi2cVK7quW65lXlTMGkLAUvtnzrhGxkzZqKC6mNdNKAA61NI6Wzjtnyktwe_6a0n7PFSXVhjqkKKiaFAF5XZZFc7OhqY0CM1qkx-p2Oe8VAHWZTnUqzqcNsCpJAJOb-yNgU_8vbqLBN_VtrfLTtpEzw_9C_c0J2gg</recordid><startdate>20170901</startdate><enddate>20170901</enddate><creator>Baéz, Guido</creator><creator>Díaz Pace, Diego</creator><creator>D’Angelo, Cristian</creator><creator>Di Rocco, Héctor O.</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7QH</scope><scope>7SR</scope><scope>7U5</scope><scope>7UA</scope><scope>8FD</scope><scope>C1K</scope><scope>F1W</scope><scope>H97</scope><scope>JG9</scope><scope>L.G</scope><scope>L7M</scope></search><sort><creationdate>20170901</creationdate><title>Analysis of line profiles from transient plasmas using a pseudo-Fano function</title><author>Baéz, Guido ; Díaz Pace, Diego ; D’Angelo, Cristian ; Di Rocco, Héctor O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c320t-54d0dc8f9af6c4a7466fd21993542b4bf59897186459ad9f9d0f0aad899fef1e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Analysis</topic><topic>Background noise</topic><topic>Electrons</topic><topic>Emissivity</topic><topic>Plasma</topic><topic>Plasmas</topic><topic>Profiles</topic><topic>Temperature</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Baéz, Guido</creatorcontrib><creatorcontrib>Díaz Pace, Diego</creatorcontrib><creatorcontrib>D’Angelo, Cristian</creatorcontrib><creatorcontrib>Di Rocco, Héctor O.</creatorcontrib><collection>CrossRef</collection><collection>Aqualine</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Water Resources Abstracts</collection><collection>Technology Research Database</collection><collection>Environmental Sciences and Pollution Management</collection><collection>ASFA: Aquatic Sciences and Fisheries Abstracts</collection><collection>Aquatic Science & Fisheries Abstracts (ASFA) 3: Aquatic Pollution & Environmental Quality</collection><collection>Materials Research Database</collection><collection>Aquatic Science & Fisheries Abstracts (ASFA) Professional</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Spectrochimica acta. Part B: Atomic spectroscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Baéz, Guido</au><au>Díaz Pace, Diego</au><au>D’Angelo, Cristian</au><au>Di Rocco, Héctor O.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of line profiles from transient plasmas using a pseudo-Fano function</atitle><jtitle>Spectrochimica acta. Part B: Atomic spectroscopy</jtitle><date>2017-09-01</date><risdate>2017</risdate><volume>135</volume><spage>73</spage><epage>81</epage><pages>73-81</pages><issn>0584-8547</issn><eissn>1873-3565</eissn><abstract>[Display omitted]
•An analytical formula for line profile analysis is proposed.•Problem of solving a Voigt convolution integral is overcome.•Physical mechanisms affecting the intrinsic lines are described.•Emissivity profiles can be retrieved.•Relative gA values of six Co I lines were determined.</abstract><cop>Oxford</cop><pub>Elsevier B.V</pub><doi>10.1016/j.sab.2017.07.005</doi><tpages>9</tpages><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0584-8547 |
| ispartof | Spectrochimica acta. Part B: Atomic spectroscopy, 2017-09, Vol.135, p.73-81 |
| issn | 0584-8547 1873-3565 |
| language | eng |
| recordid | cdi_proquest_journals_1955047632 |
| source | Elsevier ScienceDirect Journals |
| subjects | Analysis Background noise Electrons Emissivity Plasma Plasmas Profiles Temperature |
| title | Analysis of line profiles from transient plasmas using a pseudo-Fano function |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T07%3A57%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analysis%20of%20line%20profiles%20from%20transient%20plasmas%20using%20a%20pseudo-Fano%C2%A0function&rft.jtitle=Spectrochimica%20acta.%20Part%20B:%20Atomic%20spectroscopy&rft.au=Ba%C3%A9z,%20Guido&rft.date=2017-09-01&rft.volume=135&rft.spage=73&rft.epage=81&rft.pages=73-81&rft.issn=0584-8547&rft.eissn=1873-3565&rft_id=info:doi/10.1016/j.sab.2017.07.005&rft_dat=%3Cproquest_cross%3E1955047632%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1955047632&rft_id=info:pmid/&rft_els_id=S0584854717301775&rfr_iscdi=true |