Experimentally Derived Resistivity for Dielectric Samples From the CRRES Internal Discharge Monitor
Resistivity values were experimentally determined using charge-storage methods for six samples remaining from the construction of the internal discharge monitor flown on the Combined Release and Radiation Effects Satellite (CRRES). Three tests were performed over a period of three to five weeks each...
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| Veröffentlicht in: | IEEE transactions on plasma science 2006-10, Vol.34 (5), p.1973-1978 |
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| container_end_page | 1978 |
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| container_issue | 5 |
| container_start_page | 1973 |
| container_title | IEEE transactions on plasma science |
| container_volume | 34 |
| creator | Green, N.W. Frederickson, A.R. Dennison, J.R. |
| description | Resistivity values were experimentally determined using charge-storage methods for six samples remaining from the construction of the internal discharge monitor flown on the Combined Release and Radiation Effects Satellite (CRRES). Three tests were performed over a period of three to five weeks each in a vacuum of ~5times10 -6 torr with an average temperature of ~25degC to simulate a space environment. Samples tested included FR4, polytetrafluoroethylene (PTFE), and alumina with copper electrodes attached to one or more of the sample surfaces. FR4 circuit-board material was found to have a dark-current resistivity of ~1times10 18 Omegamiddotcm and a moderately high polarization current. Fiber-filled PTFE exhibited little polarization current and a dark-current resistivity of ~3times10 20 Omegamiddotcm. Alumina had a measured dark-current resistivity of ~3middot10 17 Omegamiddotcm, with a very large and more rapid polarization. Experimentally determined resistivity values were two to three orders of magnitude more than found using standard American Society for Testing and Materials (ASTM) test methods. The 1-min wait time suggested for the standard ASTM tests is much shorter than the measured polarization current-decay times for each sample indicating that the primary currents used to determine ASTM resistivity are caused by the polarization of molecules in the applied electric field rather than charge transport through the bulk of the dielectric. Testing over much longer periods of time in vacuum is required to allow this polarization current to decay away and to allow the observation of charged-particle transport through a dielectric material. Application of a simple physics-based model allows separation of the polarization current and dark-current components from long-duration measurements of resistivity over day- to month-long time scales. Model parameters are directly related to the magnitude of charge transfer and storage and the rate of charge transport |
| doi_str_mv | 10.1109/TPS.2006.883372 |
| format | Article |
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Three tests were performed over a period of three to five weeks each in a vacuum of ~5times10 -6 torr with an average temperature of ~25degC to simulate a space environment. Samples tested included FR4, polytetrafluoroethylene (PTFE), and alumina with copper electrodes attached to one or more of the sample surfaces. FR4 circuit-board material was found to have a dark-current resistivity of ~1times10 18 Omegamiddotcm and a moderately high polarization current. Fiber-filled PTFE exhibited little polarization current and a dark-current resistivity of ~3times10 20 Omegamiddotcm. Alumina had a measured dark-current resistivity of ~3middot10 17 Omegamiddotcm, with a very large and more rapid polarization. Experimentally determined resistivity values were two to three orders of magnitude more than found using standard American Society for Testing and Materials (ASTM) test methods. The 1-min wait time suggested for the standard ASTM tests is much shorter than the measured polarization current-decay times for each sample indicating that the primary currents used to determine ASTM resistivity are caused by the polarization of molecules in the applied electric field rather than charge transport through the bulk of the dielectric. Testing over much longer periods of time in vacuum is required to allow this polarization current to decay away and to allow the observation of charged-particle transport through a dielectric material. Application of a simple physics-based model allows separation of the polarization current and dark-current components from long-duration measurements of resistivity over day- to month-long time scales. Model parameters are directly related to the magnitude of charge transfer and storage and the rate of charge transport</description><identifier>ISSN: 0093-3813</identifier><identifier>EISSN: 1939-9375</identifier><identifier>DOI: 10.1109/TPS.2006.883372</identifier><identifier>CODEN: ITPSBD</identifier><language>eng</language><publisher>New York, NY: IEEE</publisher><subject>Astronomy ; Charge transport ; Conductivity ; Current measurement ; dielectric ; Dielectric measurements ; Dielectrics ; Discharge ; Earth, ocean, space ; Electric currents ; Electric rates ; Electric resistance ; Electrical resistivity ; Exact sciences and technology ; Fundamental aspects of astrophysics ; Fundamental astronomy and astrophysics. Instrumentation, techniques, and astronomical observations ; Instruments, apparatus, components and techniques common to several branches of physics and astronomy ; Magnetohydrodynamics and plasmas ; Materials testing ; Monitors ; Performance evaluation ; Physics ; Polarization ; Polytetrafluoroethylenes ; Radiation effects ; Radiation monitoring ; resistivity ; Satellites ; space environment effects ; Spaceborne and space research instruments, apparatus and components (satellites, space vehicles, etc.) ; spacecraft charging ; Time measurement</subject><ispartof>IEEE transactions on plasma science, 2006-10, Vol.34 (5), p.1973-1978</ispartof><rights>2006 INIST-CNRS</rights><rights>Copyright Institute of Electrical and Electronics Engineers, Inc. (IEEE) Oct 2006</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c397t-f8c36b2d949b78606f564a1cbe7af671d8678b249c54554556f7cc773b42b3633</citedby><cites>FETCH-LOGICAL-c397t-f8c36b2d949b78606f564a1cbe7af671d8678b249c54554556f7cc773b42b3633</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1710072$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,314,776,780,785,786,792,23909,23910,25118,27901,27902,54733</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1710072$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc><backlink>$$Uhttp://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=18251930$$DView record in Pascal Francis$$Hfree_for_read</backlink></links><search><creatorcontrib>Green, N.W.</creatorcontrib><creatorcontrib>Frederickson, A.R.</creatorcontrib><creatorcontrib>Dennison, J.R.</creatorcontrib><title>Experimentally Derived Resistivity for Dielectric Samples From the CRRES Internal Discharge Monitor</title><title>IEEE transactions on plasma science</title><addtitle>TPS</addtitle><description>Resistivity values were experimentally determined using charge-storage methods for six samples remaining from the construction of the internal discharge monitor flown on the Combined Release and Radiation Effects Satellite (CRRES). Three tests were performed over a period of three to five weeks each in a vacuum of ~5times10 -6 torr with an average temperature of ~25degC to simulate a space environment. Samples tested included FR4, polytetrafluoroethylene (PTFE), and alumina with copper electrodes attached to one or more of the sample surfaces. FR4 circuit-board material was found to have a dark-current resistivity of ~1times10 18 Omegamiddotcm and a moderately high polarization current. Fiber-filled PTFE exhibited little polarization current and a dark-current resistivity of ~3times10 20 Omegamiddotcm. Alumina had a measured dark-current resistivity of ~3middot10 17 Omegamiddotcm, with a very large and more rapid polarization. Experimentally determined resistivity values were two to three orders of magnitude more than found using standard American Society for Testing and Materials (ASTM) test methods. The 1-min wait time suggested for the standard ASTM tests is much shorter than the measured polarization current-decay times for each sample indicating that the primary currents used to determine ASTM resistivity are caused by the polarization of molecules in the applied electric field rather than charge transport through the bulk of the dielectric. Testing over much longer periods of time in vacuum is required to allow this polarization current to decay away and to allow the observation of charged-particle transport through a dielectric material. Application of a simple physics-based model allows separation of the polarization current and dark-current components from long-duration measurements of resistivity over day- to month-long time scales. Model parameters are directly related to the magnitude of charge transfer and storage and the rate of charge transport</description><subject>Astronomy</subject><subject>Charge transport</subject><subject>Conductivity</subject><subject>Current measurement</subject><subject>dielectric</subject><subject>Dielectric measurements</subject><subject>Dielectrics</subject><subject>Discharge</subject><subject>Earth, ocean, space</subject><subject>Electric currents</subject><subject>Electric rates</subject><subject>Electric resistance</subject><subject>Electrical resistivity</subject><subject>Exact sciences and technology</subject><subject>Fundamental aspects of astrophysics</subject><subject>Fundamental astronomy and astrophysics. Instrumentation, techniques, and astronomical observations</subject><subject>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</subject><subject>Magnetohydrodynamics and plasmas</subject><subject>Materials testing</subject><subject>Monitors</subject><subject>Performance evaluation</subject><subject>Physics</subject><subject>Polarization</subject><subject>Polytetrafluoroethylenes</subject><subject>Radiation effects</subject><subject>Radiation monitoring</subject><subject>resistivity</subject><subject>Satellites</subject><subject>space environment effects</subject><subject>Spaceborne and space research instruments, apparatus and components (satellites, space vehicles, etc.)</subject><subject>spacecraft charging</subject><subject>Time measurement</subject><issn>0093-3813</issn><issn>1939-9375</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2006</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNpdkctLAzEQh4MoWB9nD16CIHjZNo_dPI5SWxUUpdXzkk1nNZLu1iQV-9-bUkEQAkOYb34M3yB0RsmQUqJHL8_zISNEDJXiXLI9NKCa60JzWe2jASGaF1xRfoiOYvwghJYVYQNkJ98rCG4JXTLeb_BN_nzBAs8gupjcl0sb3PYB3zjwYFNwFs_NcuUh4mnolzi9Ax7PZpM5vu8ShM74jEb7bsIb4Me-c6kPJ-igNT7C6W89Rq_Tycv4rnh4ur0fXz8UlmuZilZZLhq20KVupBJEtJUoDbUNSNMKSRdKSNWwUtuqrLZPtNJaKXlTsoYLzo_R1S53FfrPNcRUL_Mq4L3poF_HmuYQJoUiZUYv_qEf_Xq7faZ0RSUnJcvQaAfZ0McYoK1X2ZQJm5qSeuu8zs7rrfN65zxPXP7GmmiNb4PprIt_Y4pV-Sgkc-c7zgHAX1tSQnLKD08YiRo</recordid><startdate>20061001</startdate><enddate>20061001</enddate><creator>Green, N.W.</creator><creator>Frederickson, A.R.</creator><creator>Dennison, J.R.</creator><general>IEEE</general><general>Institute of Electrical and Electronics Engineers</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>IQODW</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><scope>F28</scope><scope>FR3</scope></search><sort><creationdate>20061001</creationdate><title>Experimentally Derived Resistivity for Dielectric Samples From the CRRES Internal Discharge Monitor</title><author>Green, N.W. ; Frederickson, A.R. ; Dennison, J.R.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c397t-f8c36b2d949b78606f564a1cbe7af671d8678b249c54554556f7cc773b42b3633</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Astronomy</topic><topic>Charge transport</topic><topic>Conductivity</topic><topic>Current measurement</topic><topic>dielectric</topic><topic>Dielectric measurements</topic><topic>Dielectrics</topic><topic>Discharge</topic><topic>Earth, ocean, space</topic><topic>Electric currents</topic><topic>Electric rates</topic><topic>Electric resistance</topic><topic>Electrical resistivity</topic><topic>Exact sciences and technology</topic><topic>Fundamental aspects of astrophysics</topic><topic>Fundamental astronomy and astrophysics. Instrumentation, techniques, and astronomical observations</topic><topic>Instruments, apparatus, components and techniques common to several branches of physics and astronomy</topic><topic>Magnetohydrodynamics and plasmas</topic><topic>Materials testing</topic><topic>Monitors</topic><topic>Performance evaluation</topic><topic>Physics</topic><topic>Polarization</topic><topic>Polytetrafluoroethylenes</topic><topic>Radiation effects</topic><topic>Radiation monitoring</topic><topic>resistivity</topic><topic>Satellites</topic><topic>space environment effects</topic><topic>Spaceborne and space research instruments, apparatus and components (satellites, space vehicles, etc.)</topic><topic>spacecraft charging</topic><topic>Time measurement</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Green, N.W.</creatorcontrib><creatorcontrib>Frederickson, A.R.</creatorcontrib><creatorcontrib>Dennison, J.R.</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>Pascal-Francis</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>ANTE: Abstracts in New Technology & Engineering</collection><collection>Engineering Research Database</collection><jtitle>IEEE transactions on plasma science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Green, N.W.</au><au>Frederickson, A.R.</au><au>Dennison, J.R.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Experimentally Derived Resistivity for Dielectric Samples From the CRRES Internal Discharge Monitor</atitle><jtitle>IEEE transactions on plasma science</jtitle><stitle>TPS</stitle><date>2006-10-01</date><risdate>2006</risdate><volume>34</volume><issue>5</issue><spage>1973</spage><epage>1978</epage><pages>1973-1978</pages><issn>0093-3813</issn><eissn>1939-9375</eissn><coden>ITPSBD</coden><abstract>Resistivity values were experimentally determined using charge-storage methods for six samples remaining from the construction of the internal discharge monitor flown on the Combined Release and Radiation Effects Satellite (CRRES). Three tests were performed over a period of three to five weeks each in a vacuum of ~5times10 -6 torr with an average temperature of ~25degC to simulate a space environment. Samples tested included FR4, polytetrafluoroethylene (PTFE), and alumina with copper electrodes attached to one or more of the sample surfaces. FR4 circuit-board material was found to have a dark-current resistivity of ~1times10 18 Omegamiddotcm and a moderately high polarization current. Fiber-filled PTFE exhibited little polarization current and a dark-current resistivity of ~3times10 20 Omegamiddotcm. Alumina had a measured dark-current resistivity of ~3middot10 17 Omegamiddotcm, with a very large and more rapid polarization. Experimentally determined resistivity values were two to three orders of magnitude more than found using standard American Society for Testing and Materials (ASTM) test methods. The 1-min wait time suggested for the standard ASTM tests is much shorter than the measured polarization current-decay times for each sample indicating that the primary currents used to determine ASTM resistivity are caused by the polarization of molecules in the applied electric field rather than charge transport through the bulk of the dielectric. Testing over much longer periods of time in vacuum is required to allow this polarization current to decay away and to allow the observation of charged-particle transport through a dielectric material. Application of a simple physics-based model allows separation of the polarization current and dark-current components from long-duration measurements of resistivity over day- to month-long time scales. Model parameters are directly related to the magnitude of charge transfer and storage and the rate of charge transport</abstract><cop>New York, NY</cop><pub>IEEE</pub><doi>10.1109/TPS.2006.883372</doi><tpages>6</tpages></addata></record> |
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| ispartof | IEEE transactions on plasma science, 2006-10, Vol.34 (5), p.1973-1978 |
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| subjects | Astronomy Charge transport Conductivity Current measurement dielectric Dielectric measurements Dielectrics Discharge Earth, ocean, space Electric currents Electric rates Electric resistance Electrical resistivity Exact sciences and technology Fundamental aspects of astrophysics Fundamental astronomy and astrophysics. Instrumentation, techniques, and astronomical observations Instruments, apparatus, components and techniques common to several branches of physics and astronomy Magnetohydrodynamics and plasmas Materials testing Monitors Performance evaluation Physics Polarization Polytetrafluoroethylenes Radiation effects Radiation monitoring resistivity Satellites space environment effects Spaceborne and space research instruments, apparatus and components (satellites, space vehicles, etc.) spacecraft charging Time measurement |
| title | Experimentally Derived Resistivity for Dielectric Samples From the CRRES Internal Discharge Monitor |
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