Local atomic structure of Fe/Cr multilayers: Depth-resolved method

A depth-resolved method for the investigation of the local atomic structure by combining data of X-ray reflectivity and angle-resolved EXAFS is proposed. The solution of the problem can be divided into three stages: 1) determination of the element concentration profile with the depth z from X-ray re...

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Veröffentlicht in:	Journal of magnetism and magnetic materials 2017-10, Vol.440, p.203-206
Hauptverfasser:	Babanov, Yu.A., Ponomarev, D.A., Devyaterikov, D.I., Salamatov, Yu.A., Romashev, L.N., Ustinov, V.V., Vasin, V.V., Ageev, A.L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Absorptivity Algorithms Aluminum oxide Atomic structure Chemical compounds Energy consumption EXAFS Fluorescence Inverse problems Kondo-like behavior Multilayers Reflectance Reflectivity Regularization X-ray fluorescence
Online-Zugang:	Volltext
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