Perpendicular magnetic anisotropy in CoXPd100−X alloys for magnetic tunnel junctions

•CoPd alloy perpendicular anisotropy dependent on composition and thickness.•CIPT results show that TMR tracks with PMA of CoPd.•Potential replacement for Co/Pd multilayers. CoFeB/MgO-based perpendicular magnetic tunnel junctions (p-MTJ’s) with high anisotropy and low damping are critical for spin-t...

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Veröffentlicht in:Journal of magnetism and magnetic materials 2017-08, Vol.436, p.113-116
Hauptverfasser: Clark, B.D., Natarajarathinam, A., Tadisina, Z.R., Chen, P.J., Shull, R.D., Gupta, S.
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container_end_page 116
container_issue
container_start_page 113
container_title Journal of magnetism and magnetic materials
container_volume 436
creator Clark, B.D.
Natarajarathinam, A.
Tadisina, Z.R.
Chen, P.J.
Shull, R.D.
Gupta, S.
description •CoPd alloy perpendicular anisotropy dependent on composition and thickness.•CIPT results show that TMR tracks with PMA of CoPd.•Potential replacement for Co/Pd multilayers. CoFeB/MgO-based perpendicular magnetic tunnel junctions (p-MTJ’s) with high anisotropy and low damping are critical for spin-torque transfer random access memory (STT-RAM). Most schemes of making the pinned CoFeB fully perpendicular require ferrimagnets with high damping constants, a high temperature-grown L10 alloy, or an overly complex multilayered synthetic antiferromagnet (SyAF). We report a compositional study of perpendicular CoxPd alloy-pinned Co20Fe60B20/MgO based MTJ stacks, grown at moderate temperatures in a planetary deposition system. The perpendicular anisotropy of the CoxPd alloy films can be tuned based on the layer thickness and composition. The films were characterized by alternating gradient magnetometry (AGM), energy-dispersive X-rays (EDX), and X-ray diffraction (XRD). Current-in-plane tunneling (CIPT) measurements have also been performed on the compositionally varied CoxPd MTJ stacks. The CoxPd alloy becomes fully perpendicular at approximately x=30% (atomic fraction) Co. Full-film MTJ stacks of Si/SiO2/MgO (13)/CoXPd100−x (50)/Ta (0.3)/CoFeB (1)/MgO (1.6)/CoFeB (1)/Ta (5)/Ru (10), with the numbers enclosed in parentheses being the layer thicknesses in nm, were sputtered onto thermally oxidized silicon substrates and in-situ lamp annealed at 400°C for 5min. CIPT measurements indicate that the highest TMR is observed for the CoPd composition with the highest perpendicular magnetic anisotropy.
doi_str_mv 10.1016/j.jmmm.2017.04.047
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CoFeB/MgO-based perpendicular magnetic tunnel junctions (p-MTJ’s) with high anisotropy and low damping are critical for spin-torque transfer random access memory (STT-RAM). Most schemes of making the pinned CoFeB fully perpendicular require ferrimagnets with high damping constants, a high temperature-grown L10 alloy, or an overly complex multilayered synthetic antiferromagnet (SyAF). We report a compositional study of perpendicular CoxPd alloy-pinned Co20Fe60B20/MgO based MTJ stacks, grown at moderate temperatures in a planetary deposition system. The perpendicular anisotropy of the CoxPd alloy films can be tuned based on the layer thickness and composition. The films were characterized by alternating gradient magnetometry (AGM), energy-dispersive X-rays (EDX), and X-ray diffraction (XRD). Current-in-plane tunneling (CIPT) measurements have also been performed on the compositionally varied CoxPd MTJ stacks. The CoxPd alloy becomes fully perpendicular at approximately x=30% (atomic fraction) Co. Full-film MTJ stacks of Si/SiO2/MgO (13)/CoXPd100−x (50)/Ta (0.3)/CoFeB (1)/MgO (1.6)/CoFeB (1)/Ta (5)/Ru (10), with the numbers enclosed in parentheses being the layer thicknesses in nm, were sputtered onto thermally oxidized silicon substrates and in-situ lamp annealed at 400°C for 5min. 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CoFeB/MgO-based perpendicular magnetic tunnel junctions (p-MTJ’s) with high anisotropy and low damping are critical for spin-torque transfer random access memory (STT-RAM). Most schemes of making the pinned CoFeB fully perpendicular require ferrimagnets with high damping constants, a high temperature-grown L10 alloy, or an overly complex multilayered synthetic antiferromagnet (SyAF). We report a compositional study of perpendicular CoxPd alloy-pinned Co20Fe60B20/MgO based MTJ stacks, grown at moderate temperatures in a planetary deposition system. The perpendicular anisotropy of the CoxPd alloy films can be tuned based on the layer thickness and composition. The films were characterized by alternating gradient magnetometry (AGM), energy-dispersive X-rays (EDX), and X-ray diffraction (XRD). Current-in-plane tunneling (CIPT) measurements have also been performed on the compositionally varied CoxPd MTJ stacks. The CoxPd alloy becomes fully perpendicular at approximately x=30% (atomic fraction) Co. Full-film MTJ stacks of Si/SiO2/MgO (13)/CoXPd100−x (50)/Ta (0.3)/CoFeB (1)/MgO (1.6)/CoFeB (1)/Ta (5)/Ru (10), with the numbers enclosed in parentheses being the layer thicknesses in nm, were sputtered onto thermally oxidized silicon substrates and in-situ lamp annealed at 400°C for 5min. CIPT measurements indicate that the highest TMR is observed for the CoPd composition with the highest perpendicular magnetic anisotropy.</description><subject>Anisotropy</subject><subject>Antiferromagnetism</subject><subject>Cobalt base alloys</subject><subject>CoPd alloy</subject><subject>Damping</subject><subject>Ferrimagnetism</subject><subject>Ferrimagnets</subject><subject>Magnesium oxide</subject><subject>Magnetic anisotropy</subject><subject>Magnetism</subject><subject>Perpendicular magnetic anisotropy</subject><subject>Perpendicular magnetic tunnel junctions</subject><subject>Random access memory</subject><subject>Silicon dioxide</subject><subject>Silicon substrates</subject><subject>Stacks</subject><subject>STT-MRAM</subject><subject>Thickness</subject><subject>Tunnel junctions</subject><subject>X-ray diffraction</subject><issn>0304-8853</issn><issn>1873-4766</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNp9kMtKxDAUhoMoOI6-gKuC69aTS5MOuJHBGww4CxV3oc1FUtpkTFph3sC1j-iT2GFcuBJ-OJvvO-fwI3SOocCA-WVbtH3fFwSwKIBNEQdohitBcyY4P0QzoMDyqirpMTpJqQUAzCo-Qy9rEzfGa6fGro5ZX795MziV1d6lMMSw2WbOZ8vwutYY4Pvz6zWruy5sU2bDH3wYvTdd1o5eDS74dIqObN0lc_Y75-j59uZpeZ-vHu8elterXFFBhpwaai1rMFe4Ki21paANVBYoWTRYEFDcWq0JB6xNqWmtiG6YpgI4QMNJTefoYr93E8P7aNIg2zBGP52UeEEFA4rFYqLInlIxpBSNlZvo-jpuJQa560-2ctef3PUngU0Rk3S1l8z0_4czUSbljFdGu2jUIHVw_-k_Xe56iw</recordid><startdate>20170815</startdate><enddate>20170815</enddate><creator>Clark, B.D.</creator><creator>Natarajarathinam, A.</creator><creator>Tadisina, Z.R.</creator><creator>Chen, P.J.</creator><creator>Shull, R.D.</creator><creator>Gupta, S.</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20170815</creationdate><title>Perpendicular magnetic anisotropy in CoXPd100−X alloys for magnetic tunnel junctions</title><author>Clark, B.D. ; Natarajarathinam, A. ; Tadisina, Z.R. ; Chen, P.J. ; Shull, R.D. ; Gupta, S.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c372t-3e3ff4b16c185f3f573b08f0329b1720c6ffdd2601de5d3ac2db4d370600b62a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Anisotropy</topic><topic>Antiferromagnetism</topic><topic>Cobalt base alloys</topic><topic>CoPd alloy</topic><topic>Damping</topic><topic>Ferrimagnetism</topic><topic>Ferrimagnets</topic><topic>Magnesium oxide</topic><topic>Magnetic anisotropy</topic><topic>Magnetism</topic><topic>Perpendicular magnetic anisotropy</topic><topic>Perpendicular magnetic tunnel junctions</topic><topic>Random access memory</topic><topic>Silicon dioxide</topic><topic>Silicon substrates</topic><topic>Stacks</topic><topic>STT-MRAM</topic><topic>Thickness</topic><topic>Tunnel junctions</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Clark, B.D.</creatorcontrib><creatorcontrib>Natarajarathinam, A.</creatorcontrib><creatorcontrib>Tadisina, Z.R.</creatorcontrib><creatorcontrib>Chen, P.J.</creatorcontrib><creatorcontrib>Shull, R.D.</creatorcontrib><creatorcontrib>Gupta, S.</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of magnetism and magnetic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Clark, B.D.</au><au>Natarajarathinam, A.</au><au>Tadisina, Z.R.</au><au>Chen, P.J.</au><au>Shull, R.D.</au><au>Gupta, S.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Perpendicular magnetic anisotropy in CoXPd100−X alloys for magnetic tunnel junctions</atitle><jtitle>Journal of magnetism and magnetic materials</jtitle><date>2017-08-15</date><risdate>2017</risdate><volume>436</volume><spage>113</spage><epage>116</epage><pages>113-116</pages><issn>0304-8853</issn><eissn>1873-4766</eissn><abstract>•CoPd alloy perpendicular anisotropy dependent on composition and thickness.•CIPT results show that TMR tracks with PMA of CoPd.•Potential replacement for Co/Pd multilayers. CoFeB/MgO-based perpendicular magnetic tunnel junctions (p-MTJ’s) with high anisotropy and low damping are critical for spin-torque transfer random access memory (STT-RAM). Most schemes of making the pinned CoFeB fully perpendicular require ferrimagnets with high damping constants, a high temperature-grown L10 alloy, or an overly complex multilayered synthetic antiferromagnet (SyAF). We report a compositional study of perpendicular CoxPd alloy-pinned Co20Fe60B20/MgO based MTJ stacks, grown at moderate temperatures in a planetary deposition system. The perpendicular anisotropy of the CoxPd alloy films can be tuned based on the layer thickness and composition. The films were characterized by alternating gradient magnetometry (AGM), energy-dispersive X-rays (EDX), and X-ray diffraction (XRD). Current-in-plane tunneling (CIPT) measurements have also been performed on the compositionally varied CoxPd MTJ stacks. The CoxPd alloy becomes fully perpendicular at approximately x=30% (atomic fraction) Co. Full-film MTJ stacks of Si/SiO2/MgO (13)/CoXPd100−x (50)/Ta (0.3)/CoFeB (1)/MgO (1.6)/CoFeB (1)/Ta (5)/Ru (10), with the numbers enclosed in parentheses being the layer thicknesses in nm, were sputtered onto thermally oxidized silicon substrates and in-situ lamp annealed at 400°C for 5min. CIPT measurements indicate that the highest TMR is observed for the CoPd composition with the highest perpendicular magnetic anisotropy.</abstract><cop>Amsterdam</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jmmm.2017.04.047</doi><tpages>4</tpages><oa>free_for_read</oa></addata></record>
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subjects Anisotropy
Antiferromagnetism
Cobalt base alloys
CoPd alloy
Damping
Ferrimagnetism
Ferrimagnets
Magnesium oxide
Magnetic anisotropy
Magnetism
Perpendicular magnetic anisotropy
Perpendicular magnetic tunnel junctions
Random access memory
Silicon dioxide
Silicon substrates
Stacks
STT-MRAM
Thickness
Tunnel junctions
X-ray diffraction
title Perpendicular magnetic anisotropy in CoXPd100−X alloys for magnetic tunnel junctions
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