Relationship between constant-phase element (CPE) parameters and physical properties of films with a distributed resistivity
Several issues concerning constant-phase element (CPE) behavior in the impedance response of films with a distributed resistivity are addressed here. To carry it out we consider two theoretical distributed models that account for exact CPE behavior and which provided us with the phenomenology of pow...
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Veröffentlicht in: | Electrochimica acta 2017-01, Vol.225, p.592-604 |
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description | Several issues concerning constant-phase element (CPE) behavior in the impedance response of films with a distributed resistivity are addressed here. To carry it out we consider two theoretical distributed models that account for exact CPE behavior and which provided us with the phenomenology of power-law frequency responses usually found in the literature. We focus on the derivation of the relationship between CPE parameters and the physical properties of the film, which remains a challenging problem of paramount importance in impedance data interpretation. Results are compared to existing expressions widely used to extract film properties from CPE behavior, in particular to those derived by Hsu and Mansfeld [1] and by Hirschorn et al. [2]. A mathematical basis for the agreements or deviations observed in previous experimental works as well as for some conjectures formulated in related literature is provided. We also address some possible ambiguities that can arise when the experimental frequency range does not allow the recognition of the overall behavior. |
doi_str_mv | 10.1016/j.electacta.2016.12.087 |
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To carry it out we consider two theoretical distributed models that account for exact CPE behavior and which provided us with the phenomenology of power-law frequency responses usually found in the literature. We focus on the derivation of the relationship between CPE parameters and the physical properties of the film, which remains a challenging problem of paramount importance in impedance data interpretation. Results are compared to existing expressions widely used to extract film properties from CPE behavior, in particular to those derived by Hsu and Mansfeld [1] and by Hirschorn et al. [2]. A mathematical basis for the agreements or deviations observed in previous experimental works as well as for some conjectures formulated in related literature is provided. We also address some possible ambiguities that can arise when the experimental frequency range does not allow the recognition of the overall behavior.</description><identifier>ISSN: 0013-4686</identifier><identifier>EISSN: 1873-3859</identifier><identifier>DOI: 10.1016/j.electacta.2016.12.087</identifier><language>eng</language><publisher>Oxford: Elsevier Ltd</publisher><subject>Constant-Phase Element (CPE) ; Distributed resistivity ; Electrical resistivity ; Electrochemical impedance ; Impedance ; Mathematical models ; Phenomenology ; Physical properties ; Thin films</subject><ispartof>Electrochimica acta, 2017-01, Vol.225, p.592-604</ispartof><rights>2016 Elsevier Ltd</rights><rights>Copyright Elsevier BV Jan 20, 2017</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c380t-2e374941dca040e424d902995668e013423a010ed0e7a04245b34050ac62d98e3</citedby><cites>FETCH-LOGICAL-c380t-2e374941dca040e424d902995668e013423a010ed0e7a04245b34050ac62d98e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.sciencedirect.com/science/article/pii/S0013468616326330$$EHTML$$P50$$Gelsevier$$H</linktohtml><link.rule.ids>314,776,780,3537,27901,27902,65306</link.rule.ids></links><search><creatorcontrib>Córdoba-Torres, Pedro</creatorcontrib><title>Relationship between constant-phase element (CPE) parameters and physical properties of films with a distributed resistivity</title><title>Electrochimica acta</title><description>Several issues concerning constant-phase element (CPE) behavior in the impedance response of films with a distributed resistivity are addressed here. To carry it out we consider two theoretical distributed models that account for exact CPE behavior and which provided us with the phenomenology of power-law frequency responses usually found in the literature. We focus on the derivation of the relationship between CPE parameters and the physical properties of the film, which remains a challenging problem of paramount importance in impedance data interpretation. Results are compared to existing expressions widely used to extract film properties from CPE behavior, in particular to those derived by Hsu and Mansfeld [1] and by Hirschorn et al. [2]. A mathematical basis for the agreements or deviations observed in previous experimental works as well as for some conjectures formulated in related literature is provided. We also address some possible ambiguities that can arise when the experimental frequency range does not allow the recognition of the overall behavior.</description><subject>Constant-Phase Element (CPE)</subject><subject>Distributed resistivity</subject><subject>Electrical resistivity</subject><subject>Electrochemical impedance</subject><subject>Impedance</subject><subject>Mathematical models</subject><subject>Phenomenology</subject><subject>Physical properties</subject><subject>Thin films</subject><issn>0013-4686</issn><issn>1873-3859</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNqFUNtKAzEQDaJgvXyDAV_0YdfJpXt5LKVeoKCIPoc0maUp2901SVsKfrwpFV-FgeEM55yZOYTcMMgZsOJhlWOLJupUOU-DnPEcqvKEjFhVikxU4_qUjACYyGRRFefkIoQVAJRFCSPy_Y6tjq7vwtINdIFxh9hRk3DUXcyGpQ5I04I1dpHeTd9m93TQXq8xog9Ud5YOy31wRrd08P2APjoMtG9o49p1oDsXl1RT60L0brGJaKnHkJDburi_ImeNbgNe__ZL8vk4-5g-Z_PXp5fpZJ4ZUUHMOIpS1pJZo0ECSi5tDbyux0VRYfpLcqGBAVrAMjG4HC-EhDFoU3BbVyguye3RN534tcEQ1arf-C6tVKwWnPEkqhOrPLKM70Pw2KjBu7X2e8VAHaJWK_UXtTpErRhXKeqknByVmJ7YOvQqGIedQet84ivbu389fgAZfYzg</recordid><startdate>20170120</startdate><enddate>20170120</enddate><creator>Córdoba-Torres, Pedro</creator><general>Elsevier Ltd</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope></search><sort><creationdate>20170120</creationdate><title>Relationship between constant-phase element (CPE) parameters and physical properties of films with a distributed resistivity</title><author>Córdoba-Torres, Pedro</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c380t-2e374941dca040e424d902995668e013423a010ed0e7a04245b34050ac62d98e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Constant-Phase Element (CPE)</topic><topic>Distributed resistivity</topic><topic>Electrical resistivity</topic><topic>Electrochemical impedance</topic><topic>Impedance</topic><topic>Mathematical models</topic><topic>Phenomenology</topic><topic>Physical properties</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Córdoba-Torres, Pedro</creatorcontrib><collection>CrossRef</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Electrochimica acta</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Córdoba-Torres, Pedro</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Relationship between constant-phase element (CPE) parameters and physical properties of films with a distributed resistivity</atitle><jtitle>Electrochimica acta</jtitle><date>2017-01-20</date><risdate>2017</risdate><volume>225</volume><spage>592</spage><epage>604</epage><pages>592-604</pages><issn>0013-4686</issn><eissn>1873-3859</eissn><abstract>Several issues concerning constant-phase element (CPE) behavior in the impedance response of films with a distributed resistivity are addressed here. To carry it out we consider two theoretical distributed models that account for exact CPE behavior and which provided us with the phenomenology of power-law frequency responses usually found in the literature. We focus on the derivation of the relationship between CPE parameters and the physical properties of the film, which remains a challenging problem of paramount importance in impedance data interpretation. Results are compared to existing expressions widely used to extract film properties from CPE behavior, in particular to those derived by Hsu and Mansfeld [1] and by Hirschorn et al. [2]. A mathematical basis for the agreements or deviations observed in previous experimental works as well as for some conjectures formulated in related literature is provided. We also address some possible ambiguities that can arise when the experimental frequency range does not allow the recognition of the overall behavior.</abstract><cop>Oxford</cop><pub>Elsevier Ltd</pub><doi>10.1016/j.electacta.2016.12.087</doi><tpages>13</tpages></addata></record> |
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subjects | Constant-Phase Element (CPE) Distributed resistivity Electrical resistivity Electrochemical impedance Impedance Mathematical models Phenomenology Physical properties Thin films |
title | Relationship between constant-phase element (CPE) parameters and physical properties of films with a distributed resistivity |
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