$Characterization of AIIIBV superlattices by means of synchrotron diffraction topography and high‐resolution X‐ray diffraction$

Characterization of AIIIBV superlattices by means of synchrotron diffraction topography and high‐resolution X‐ray diffraction

New possibilities are presented for the characterization of AIIIBV mixed superlattice compounds by the complementary use of synchrotron diffraction topography and rocking curves. In particular, using a synchrotron white beam and the section diffraction pattern of a 5 µm slit taken at a 10 cm film‐to...

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Veröffentlicht in:	Journal of applied crystallography 2017-08, Vol.50 (4), p.1192-1199
Hauptverfasser:	Wierzchowski, Wojciech, Wieteska, Krzysztof, Gaca, Jarosław, Wójcik, Marek, Możdżonek, Małgorzata, Strupiński, Włodzimierz, Wesołowski, Marek, Paulmann, Carsten
Format:	Artikel
Sprache:	eng
Schlagworte:	AIIIBV compounds Chemical composition Crystallography Diffraction Diffraction patterns High resolution high‐resolution diffraction Identification methods Interference fringes Lamella Planes Superlattices synchrotron diffraction topography Thickness Topography X-ray diffraction
Online-Zugang:	Volltext
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