An Improved KFCM Clustering Method Used for Multiple Fault Diagnosis of Analog Circuits

This study presents a new method for multiple fault diagnosis in moderate-sized analog circuits. Based on this method, a classifier is independently designed for each of the circuit components. Each of these classifiers only classifies the defect modes associated with the related component. The resu...

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Veröffentlicht in:	Circuits, systems, and signal processing systems, and signal processing, 2017-09, Vol.36 (9), p.3491-3513
Hauptverfasser:	Khanlari, Masoumeh, Ehsanian, Mehdi
Format:	Artikel
Sprache:	eng
Schlagworte:	Accuracy Algorithms Analog circuits Circuit design Circuits and Systems Classification Classifiers Clustering Clusters Electrical Engineering Electronics and Microelectronics Engineering Fault diagnosis Instrumentation Signal,Image and Speech Processing
Online-Zugang:	Volltext
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