Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films

Bi1-xSbx solid solutions have attracted much attention as promising thermoelectric (TE) materials for cooling devices at temperatures below 200 K and as unique model materials for solid-state science because of a high sensitivity of their band structure to changes in composition, temperature, pressu...

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Veröffentlicht in:Journal of electronic materials 2017-07, Vol.46 (7), p.3821
Hauptverfasser: Rogacheva, E I, Nashchekina, O N, Orlova, D S, Doroshenko, A N, Dresselhaus, M S
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creator Rogacheva, E I
Nashchekina, O N
Orlova, D S
Doroshenko, A N
Dresselhaus, M S
description Bi1-xSbx solid solutions have attracted much attention as promising thermoelectric (TE) materials for cooling devices at temperatures below 200 K and as unique model materials for solid-state science because of a high sensitivity of their band structure to changes in composition, temperature, pressure, etc. Earlier, we revealed a non-monotonic behavior of the concentration dependences of TE properties for polycrystalline Bi1-xSbx solid solutions and attributed these anomalies to percolation effects in the solid solution, transition to a gapless state, and to a semimetal-semiconductor transition. The goal of the present work is to find out whether the non-monotonic behavior of the concentration dependences of TE properties is observed in the thin film state as well. The objects of the study are Bi1-xSbx thin films with thicknesses in the range d = 250-300 nm prepared by thermal evaporation of Bi1-xSbx crystals (x = 0-0.09) onto mica substrates. It was shown that the anomalies in the dependence of the TE properties on Bi1-xSbx crystal composition are reproduced in thin films.
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fullrecord <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_1906360597</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1906360597</sourcerecordid><originalsourceid>FETCH-proquest_journals_19063605973</originalsourceid><addsrcrecordid>eNqNi81qAjEUhUNpodOfB-gu0HX03maS0a1S0Z1QFy5kpA53MDKTjLkZsG_fUfoAhQPnwPcdId4QRghQjBnR2lwBFsrkaNTPncjQ5FrhxG7vRQbaojIf2jyKJ-YTABqcYCZ2K183PfmKZKjlPLRdYJdc8HJIOpLcHCm2gRqqUnSVXMfQUUyO-OrPXMn9QaK6lF-H27yUw8N5uXBNyy_iof5umF7_-lm8Lz4386XqYjj3xGl_Cn30A9rjFKy2YKaF_p_1C8yhSbk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1906360597</pqid></control><display><type>article</type><title>Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films</title><source>SpringerLink Journals - AutoHoldings</source><creator>Rogacheva, E I ; Nashchekina, O N ; Orlova, D S ; Doroshenko, A N ; Dresselhaus, M S</creator><creatorcontrib>Rogacheva, E I ; Nashchekina, O N ; Orlova, D S ; Doroshenko, A N ; Dresselhaus, M S</creatorcontrib><description>Bi1-xSbx solid solutions have attracted much attention as promising thermoelectric (TE) materials for cooling devices at temperatures below 200 K and as unique model materials for solid-state science because of a high sensitivity of their band structure to changes in composition, temperature, pressure, etc. Earlier, we revealed a non-monotonic behavior of the concentration dependences of TE properties for polycrystalline Bi1-xSbx solid solutions and attributed these anomalies to percolation effects in the solid solution, transition to a gapless state, and to a semimetal-semiconductor transition. The goal of the present work is to find out whether the non-monotonic behavior of the concentration dependences of TE properties is observed in the thin film state as well. The objects of the study are Bi1-xSbx thin films with thicknesses in the range d = 250-300 nm prepared by thermal evaporation of Bi1-xSbx crystals (x = 0-0.09) onto mica substrates. It was shown that the anomalies in the dependence of the TE properties on Bi1-xSbx crystal composition are reproduced in thin films.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-017-5415-y</identifier><language>eng</language><publisher>Warrendale: Springer Nature B.V</publisher><subject>Anomalies ; Band structure of solids ; Bismuth ; Concentration (composition) ; Cooling ; Crystals ; Devices ; Evaporation ; Mathematical models ; Mica ; Percolation ; Sensitivity ; Solid solutions ; Substrates ; Thermoelectric cooling ; Thermoelectric materials ; Thin films</subject><ispartof>Journal of electronic materials, 2017-07, Vol.46 (7), p.3821</ispartof><rights>Journal of Electronic Materials is a copyright of Springer, 2017.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Rogacheva, E I</creatorcontrib><creatorcontrib>Nashchekina, O N</creatorcontrib><creatorcontrib>Orlova, D S</creatorcontrib><creatorcontrib>Doroshenko, A N</creatorcontrib><creatorcontrib>Dresselhaus, M S</creatorcontrib><title>Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films</title><title>Journal of electronic materials</title><description>Bi1-xSbx solid solutions have attracted much attention as promising thermoelectric (TE) materials for cooling devices at temperatures below 200 K and as unique model materials for solid-state science because of a high sensitivity of their band structure to changes in composition, temperature, pressure, etc. Earlier, we revealed a non-monotonic behavior of the concentration dependences of TE properties for polycrystalline Bi1-xSbx solid solutions and attributed these anomalies to percolation effects in the solid solution, transition to a gapless state, and to a semimetal-semiconductor transition. The goal of the present work is to find out whether the non-monotonic behavior of the concentration dependences of TE properties is observed in the thin film state as well. The objects of the study are Bi1-xSbx thin films with thicknesses in the range d = 250-300 nm prepared by thermal evaporation of Bi1-xSbx crystals (x = 0-0.09) onto mica substrates. It was shown that the anomalies in the dependence of the TE properties on Bi1-xSbx crystal composition are reproduced in thin films.</description><subject>Anomalies</subject><subject>Band structure of solids</subject><subject>Bismuth</subject><subject>Concentration (composition)</subject><subject>Cooling</subject><subject>Crystals</subject><subject>Devices</subject><subject>Evaporation</subject><subject>Mathematical models</subject><subject>Mica</subject><subject>Percolation</subject><subject>Sensitivity</subject><subject>Solid solutions</subject><subject>Substrates</subject><subject>Thermoelectric cooling</subject><subject>Thermoelectric materials</subject><subject>Thin films</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNqNi81qAjEUhUNpodOfB-gu0HX03maS0a1S0Z1QFy5kpA53MDKTjLkZsG_fUfoAhQPnwPcdId4QRghQjBnR2lwBFsrkaNTPncjQ5FrhxG7vRQbaojIf2jyKJ-YTABqcYCZ2K183PfmKZKjlPLRdYJdc8HJIOpLcHCm2gRqqUnSVXMfQUUyO-OrPXMn9QaK6lF-H27yUw8N5uXBNyy_iof5umF7_-lm8Lz4386XqYjj3xGl_Cn30A9rjFKy2YKaF_p_1C8yhSbk</recordid><startdate>20170701</startdate><enddate>20170701</enddate><creator>Rogacheva, E I</creator><creator>Nashchekina, O N</creator><creator>Orlova, D S</creator><creator>Doroshenko, A N</creator><creator>Dresselhaus, M S</creator><general>Springer Nature B.V</general><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope></search><sort><creationdate>20170701</creationdate><title>Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films</title><author>Rogacheva, E I ; Nashchekina, O N ; Orlova, D S ; Doroshenko, A N ; Dresselhaus, M S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_19063605973</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Anomalies</topic><topic>Band structure of solids</topic><topic>Bismuth</topic><topic>Concentration (composition)</topic><topic>Cooling</topic><topic>Crystals</topic><topic>Devices</topic><topic>Evaporation</topic><topic>Mathematical models</topic><topic>Mica</topic><topic>Percolation</topic><topic>Sensitivity</topic><topic>Solid solutions</topic><topic>Substrates</topic><topic>Thermoelectric cooling</topic><topic>Thermoelectric materials</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rogacheva, E I</creatorcontrib><creatorcontrib>Nashchekina, O N</creatorcontrib><creatorcontrib>Orlova, D S</creatorcontrib><creatorcontrib>Doroshenko, A N</creatorcontrib><creatorcontrib>Dresselhaus, M S</creatorcontrib><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rogacheva, E I</au><au>Nashchekina, O N</au><au>Orlova, D S</au><au>Doroshenko, A N</au><au>Dresselhaus, M S</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films</atitle><jtitle>Journal of electronic materials</jtitle><date>2017-07-01</date><risdate>2017</risdate><volume>46</volume><issue>7</issue><spage>3821</spage><pages>3821-</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><abstract>Bi1-xSbx solid solutions have attracted much attention as promising thermoelectric (TE) materials for cooling devices at temperatures below 200 K and as unique model materials for solid-state science because of a high sensitivity of their band structure to changes in composition, temperature, pressure, etc. Earlier, we revealed a non-monotonic behavior of the concentration dependences of TE properties for polycrystalline Bi1-xSbx solid solutions and attributed these anomalies to percolation effects in the solid solution, transition to a gapless state, and to a semimetal-semiconductor transition. The goal of the present work is to find out whether the non-monotonic behavior of the concentration dependences of TE properties is observed in the thin film state as well. The objects of the study are Bi1-xSbx thin films with thicknesses in the range d = 250-300 nm prepared by thermal evaporation of Bi1-xSbx crystals (x = 0-0.09) onto mica substrates. It was shown that the anomalies in the dependence of the TE properties on Bi1-xSbx crystal composition are reproduced in thin films.</abstract><cop>Warrendale</cop><pub>Springer Nature B.V</pub><doi>10.1007/s11664-017-5415-y</doi></addata></record>
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subjects Anomalies
Band structure of solids
Bismuth
Concentration (composition)
Cooling
Crystals
Devices
Evaporation
Mathematical models
Mica
Percolation
Sensitivity
Solid solutions
Substrates
Thermoelectric cooling
Thermoelectric materials
Thin films
title Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T12%3A48%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Influence%20of%20Composition%20on%20the%20Thermoelectric%20Properties%20of%20Bi%5Esub%201-x%5ESb%5Esub%20x%5E%20Thin%20Films&rft.jtitle=Journal%20of%20electronic%20materials&rft.au=Rogacheva,%20E%20I&rft.date=2017-07-01&rft.volume=46&rft.issue=7&rft.spage=3821&rft.pages=3821-&rft.issn=0361-5235&rft.eissn=1543-186X&rft_id=info:doi/10.1007/s11664-017-5415-y&rft_dat=%3Cproquest%3E1906360597%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1906360597&rft_id=info:pmid/&rfr_iscdi=true