Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films
Bi1-xSbx solid solutions have attracted much attention as promising thermoelectric (TE) materials for cooling devices at temperatures below 200 K and as unique model materials for solid-state science because of a high sensitivity of their band structure to changes in composition, temperature, pressu...
Gespeichert in:
Veröffentlicht in: | Journal of electronic materials 2017-07, Vol.46 (7), p.3821 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | 7 |
container_start_page | 3821 |
container_title | Journal of electronic materials |
container_volume | 46 |
creator | Rogacheva, E I Nashchekina, O N Orlova, D S Doroshenko, A N Dresselhaus, M S |
description | Bi1-xSbx solid solutions have attracted much attention as promising thermoelectric (TE) materials for cooling devices at temperatures below 200 K and as unique model materials for solid-state science because of a high sensitivity of their band structure to changes in composition, temperature, pressure, etc. Earlier, we revealed a non-monotonic behavior of the concentration dependences of TE properties for polycrystalline Bi1-xSbx solid solutions and attributed these anomalies to percolation effects in the solid solution, transition to a gapless state, and to a semimetal-semiconductor transition. The goal of the present work is to find out whether the non-monotonic behavior of the concentration dependences of TE properties is observed in the thin film state as well. The objects of the study are Bi1-xSbx thin films with thicknesses in the range d = 250-300 nm prepared by thermal evaporation of Bi1-xSbx crystals (x = 0-0.09) onto mica substrates. It was shown that the anomalies in the dependence of the TE properties on Bi1-xSbx crystal composition are reproduced in thin films. |
doi_str_mv | 10.1007/s11664-017-5415-y |
format | Article |
fullrecord | <record><control><sourceid>proquest</sourceid><recordid>TN_cdi_proquest_journals_1906360597</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>1906360597</sourcerecordid><originalsourceid>FETCH-proquest_journals_19063605973</originalsourceid><addsrcrecordid>eNqNi81qAjEUhUNpodOfB-gu0HX03maS0a1S0Z1QFy5kpA53MDKTjLkZsG_fUfoAhQPnwPcdId4QRghQjBnR2lwBFsrkaNTPncjQ5FrhxG7vRQbaojIf2jyKJ-YTABqcYCZ2K183PfmKZKjlPLRdYJdc8HJIOpLcHCm2gRqqUnSVXMfQUUyO-OrPXMn9QaK6lF-H27yUw8N5uXBNyy_iof5umF7_-lm8Lz4386XqYjj3xGl_Cn30A9rjFKy2YKaF_p_1C8yhSbk</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1906360597</pqid></control><display><type>article</type><title>Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films</title><source>SpringerLink Journals - AutoHoldings</source><creator>Rogacheva, E I ; Nashchekina, O N ; Orlova, D S ; Doroshenko, A N ; Dresselhaus, M S</creator><creatorcontrib>Rogacheva, E I ; Nashchekina, O N ; Orlova, D S ; Doroshenko, A N ; Dresselhaus, M S</creatorcontrib><description>Bi1-xSbx solid solutions have attracted much attention as promising thermoelectric (TE) materials for cooling devices at temperatures below 200 K and as unique model materials for solid-state science because of a high sensitivity of their band structure to changes in composition, temperature, pressure, etc. Earlier, we revealed a non-monotonic behavior of the concentration dependences of TE properties for polycrystalline Bi1-xSbx solid solutions and attributed these anomalies to percolation effects in the solid solution, transition to a gapless state, and to a semimetal-semiconductor transition. The goal of the present work is to find out whether the non-monotonic behavior of the concentration dependences of TE properties is observed in the thin film state as well. The objects of the study are Bi1-xSbx thin films with thicknesses in the range d = 250-300 nm prepared by thermal evaporation of Bi1-xSbx crystals (x = 0-0.09) onto mica substrates. It was shown that the anomalies in the dependence of the TE properties on Bi1-xSbx crystal composition are reproduced in thin films.</description><identifier>ISSN: 0361-5235</identifier><identifier>EISSN: 1543-186X</identifier><identifier>DOI: 10.1007/s11664-017-5415-y</identifier><language>eng</language><publisher>Warrendale: Springer Nature B.V</publisher><subject>Anomalies ; Band structure of solids ; Bismuth ; Concentration (composition) ; Cooling ; Crystals ; Devices ; Evaporation ; Mathematical models ; Mica ; Percolation ; Sensitivity ; Solid solutions ; Substrates ; Thermoelectric cooling ; Thermoelectric materials ; Thin films</subject><ispartof>Journal of electronic materials, 2017-07, Vol.46 (7), p.3821</ispartof><rights>Journal of Electronic Materials is a copyright of Springer, 2017.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Rogacheva, E I</creatorcontrib><creatorcontrib>Nashchekina, O N</creatorcontrib><creatorcontrib>Orlova, D S</creatorcontrib><creatorcontrib>Doroshenko, A N</creatorcontrib><creatorcontrib>Dresselhaus, M S</creatorcontrib><title>Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films</title><title>Journal of electronic materials</title><description>Bi1-xSbx solid solutions have attracted much attention as promising thermoelectric (TE) materials for cooling devices at temperatures below 200 K and as unique model materials for solid-state science because of a high sensitivity of their band structure to changes in composition, temperature, pressure, etc. Earlier, we revealed a non-monotonic behavior of the concentration dependences of TE properties for polycrystalline Bi1-xSbx solid solutions and attributed these anomalies to percolation effects in the solid solution, transition to a gapless state, and to a semimetal-semiconductor transition. The goal of the present work is to find out whether the non-monotonic behavior of the concentration dependences of TE properties is observed in the thin film state as well. The objects of the study are Bi1-xSbx thin films with thicknesses in the range d = 250-300 nm prepared by thermal evaporation of Bi1-xSbx crystals (x = 0-0.09) onto mica substrates. It was shown that the anomalies in the dependence of the TE properties on Bi1-xSbx crystal composition are reproduced in thin films.</description><subject>Anomalies</subject><subject>Band structure of solids</subject><subject>Bismuth</subject><subject>Concentration (composition)</subject><subject>Cooling</subject><subject>Crystals</subject><subject>Devices</subject><subject>Evaporation</subject><subject>Mathematical models</subject><subject>Mica</subject><subject>Percolation</subject><subject>Sensitivity</subject><subject>Solid solutions</subject><subject>Substrates</subject><subject>Thermoelectric cooling</subject><subject>Thermoelectric materials</subject><subject>Thin films</subject><issn>0361-5235</issn><issn>1543-186X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>8G5</sourceid><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><sourceid>GUQSH</sourceid><sourceid>M2O</sourceid><recordid>eNqNi81qAjEUhUNpodOfB-gu0HX03maS0a1S0Z1QFy5kpA53MDKTjLkZsG_fUfoAhQPnwPcdId4QRghQjBnR2lwBFsrkaNTPncjQ5FrhxG7vRQbaojIf2jyKJ-YTABqcYCZ2K183PfmKZKjlPLRdYJdc8HJIOpLcHCm2gRqqUnSVXMfQUUyO-OrPXMn9QaK6lF-H27yUw8N5uXBNyy_iof5umF7_-lm8Lz4386XqYjj3xGl_Cn30A9rjFKy2YKaF_p_1C8yhSbk</recordid><startdate>20170701</startdate><enddate>20170701</enddate><creator>Rogacheva, E I</creator><creator>Nashchekina, O N</creator><creator>Orlova, D S</creator><creator>Doroshenko, A N</creator><creator>Dresselhaus, M S</creator><general>Springer Nature B.V</general><scope>3V.</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>L6V</scope><scope>M2O</scope><scope>M2P</scope><scope>M7S</scope><scope>MBDVC</scope><scope>P5Z</scope><scope>P62</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope><scope>Q9U</scope><scope>S0X</scope></search><sort><creationdate>20170701</creationdate><title>Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films</title><author>Rogacheva, E I ; Nashchekina, O N ; Orlova, D S ; Doroshenko, A N ; Dresselhaus, M S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-proquest_journals_19063605973</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Anomalies</topic><topic>Band structure of solids</topic><topic>Bismuth</topic><topic>Concentration (composition)</topic><topic>Cooling</topic><topic>Crystals</topic><topic>Devices</topic><topic>Evaporation</topic><topic>Mathematical models</topic><topic>Mica</topic><topic>Percolation</topic><topic>Sensitivity</topic><topic>Solid solutions</topic><topic>Substrates</topic><topic>Thermoelectric cooling</topic><topic>Thermoelectric materials</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rogacheva, E I</creatorcontrib><creatorcontrib>Nashchekina, O N</creatorcontrib><creatorcontrib>Orlova, D S</creatorcontrib><creatorcontrib>Doroshenko, A N</creatorcontrib><creatorcontrib>Dresselhaus, M S</creatorcontrib><collection>ProQuest Central (Corporate)</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science & Engineering Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection</collection><collection>Materials Science Database</collection><collection>ProQuest Engineering Collection</collection><collection>Research Library</collection><collection>Science Database</collection><collection>Engineering Database</collection><collection>Research Library (Corporate)</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Materials Science Collection</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>Engineering Collection</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><jtitle>Journal of electronic materials</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rogacheva, E I</au><au>Nashchekina, O N</au><au>Orlova, D S</au><au>Doroshenko, A N</au><au>Dresselhaus, M S</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films</atitle><jtitle>Journal of electronic materials</jtitle><date>2017-07-01</date><risdate>2017</risdate><volume>46</volume><issue>7</issue><spage>3821</spage><pages>3821-</pages><issn>0361-5235</issn><eissn>1543-186X</eissn><abstract>Bi1-xSbx solid solutions have attracted much attention as promising thermoelectric (TE) materials for cooling devices at temperatures below 200 K and as unique model materials for solid-state science because of a high sensitivity of their band structure to changes in composition, temperature, pressure, etc. Earlier, we revealed a non-monotonic behavior of the concentration dependences of TE properties for polycrystalline Bi1-xSbx solid solutions and attributed these anomalies to percolation effects in the solid solution, transition to a gapless state, and to a semimetal-semiconductor transition. The goal of the present work is to find out whether the non-monotonic behavior of the concentration dependences of TE properties is observed in the thin film state as well. The objects of the study are Bi1-xSbx thin films with thicknesses in the range d = 250-300 nm prepared by thermal evaporation of Bi1-xSbx crystals (x = 0-0.09) onto mica substrates. It was shown that the anomalies in the dependence of the TE properties on Bi1-xSbx crystal composition are reproduced in thin films.</abstract><cop>Warrendale</cop><pub>Springer Nature B.V</pub><doi>10.1007/s11664-017-5415-y</doi></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0361-5235 |
ispartof | Journal of electronic materials, 2017-07, Vol.46 (7), p.3821 |
issn | 0361-5235 1543-186X |
language | eng |
recordid | cdi_proquest_journals_1906360597 |
source | SpringerLink Journals - AutoHoldings |
subjects | Anomalies Band structure of solids Bismuth Concentration (composition) Cooling Crystals Devices Evaporation Mathematical models Mica Percolation Sensitivity Solid solutions Substrates Thermoelectric cooling Thermoelectric materials Thin films |
title | Influence of Composition on the Thermoelectric Properties of Bi^sub 1-x^Sb^sub x^ Thin Films |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T12%3A48%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Influence%20of%20Composition%20on%20the%20Thermoelectric%20Properties%20of%20Bi%5Esub%201-x%5ESb%5Esub%20x%5E%20Thin%20Films&rft.jtitle=Journal%20of%20electronic%20materials&rft.au=Rogacheva,%20E%20I&rft.date=2017-07-01&rft.volume=46&rft.issue=7&rft.spage=3821&rft.pages=3821-&rft.issn=0361-5235&rft.eissn=1543-186X&rft_id=info:doi/10.1007/s11664-017-5415-y&rft_dat=%3Cproquest%3E1906360597%3C/proquest%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1906360597&rft_id=info:pmid/&rfr_iscdi=true |