Effect of deposition time on structural and physical properties of Cu2CdSnS4 thin films prepared by spray pyrolysis technique: experimental and ab initio study
Cu 2 CdSnS 4 (CCdTS) thin films were synthesized using chemical spray pyrolysis deposition technique. The effect of various deposition times (20, 40, 60 min) on growth of these films was investigated. The as-synthesized Cu 2 CdSnS 4 thin films were characterized by X-ray diffraction (XRD), ultraviol...
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| Veröffentlicht in: | Optical and quantum electronics 2017-04, Vol.49 (4), p.1-12, Article 165 |
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| creator | Rouchdi, M. Salmani, E. Hassanain, N. Mzerd, A. |
| description | Cu
2
CdSnS
4
(CCdTS) thin films were synthesized using chemical spray pyrolysis deposition technique. The effect of various deposition times (20, 40, 60 min) on growth of these films was investigated. The as-synthesized Cu
2
CdSnS
4
thin films were characterized by X-ray diffraction (XRD), ultraviolet–visible (UV–Vis) spectroscopy, Raman spectroscopy and Hall Effect measurements. The XRD pattern of Cu
2
CdSnS
4
structured in stannite phase with preferential orientations along (112) planes. Raman spectrum revealed very strong peak at about 333 cm
−1
. The films have the direct optical band gaps of 1.39–1.5 eV. The optimum hole mobility was found to be 3.212 × 10
1
cm
2
v
−1
s
−1
for the film deposited on 60 min. The electronic structure and optical properties of the stannite structure Cu
2
CdSnS
4
were obtained by ab initio calculations using the Korringa–Kohn–Rostoker method combined with the Coherent Potential Approximation (CPA), as well as CPA confirms our results. |
| doi_str_mv | 10.1007/s11082-017-1005-8 |
| format | Article |
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2
CdSnS
4
(CCdTS) thin films were synthesized using chemical spray pyrolysis deposition technique. The effect of various deposition times (20, 40, 60 min) on growth of these films was investigated. The as-synthesized Cu
2
CdSnS
4
thin films were characterized by X-ray diffraction (XRD), ultraviolet–visible (UV–Vis) spectroscopy, Raman spectroscopy and Hall Effect measurements. The XRD pattern of Cu
2
CdSnS
4
structured in stannite phase with preferential orientations along (112) planes. Raman spectrum revealed very strong peak at about 333 cm
−1
. The films have the direct optical band gaps of 1.39–1.5 eV. The optimum hole mobility was found to be 3.212 × 10
1
cm
2
v
−1
s
−1
for the film deposited on 60 min. The electronic structure and optical properties of the stannite structure Cu
2
CdSnS
4
were obtained by ab initio calculations using the Korringa–Kohn–Rostoker method combined with the Coherent Potential Approximation (CPA), as well as CPA confirms our results.</description><identifier>ISSN: 0306-8919</identifier><identifier>EISSN: 1572-817X</identifier><identifier>DOI: 10.1007/s11082-017-1005-8</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Characterization and Evaluation of Materials ; Computer Communication Networks ; Electrical Engineering ; Energy gap ; Hall effect ; Lasers ; Optical Devices ; Optical properties ; Optics ; Photonics ; Physical properties ; Physics ; Physics and Astronomy ; Raman spectroscopy ; Spray pyrolysis ; Thin films ; X-ray diffraction</subject><ispartof>Optical and quantum electronics, 2017-04, Vol.49 (4), p.1-12, Article 165</ispartof><rights>Springer Science+Business Media New York 2017</rights><rights>Copyright Springer Science & Business Media 2017</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c316t-cfeeb65da458f3246e1265d38f40ea46b7f71eef92e3ae32c091d88a4f9d21423</citedby><cites>FETCH-LOGICAL-c316t-cfeeb65da458f3246e1265d38f40ea46b7f71eef92e3ae32c091d88a4f9d21423</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11082-017-1005-8$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11082-017-1005-8$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,776,780,27903,27904,41467,42536,51297</link.rule.ids></links><search><creatorcontrib>Rouchdi, M.</creatorcontrib><creatorcontrib>Salmani, E.</creatorcontrib><creatorcontrib>Hassanain, N.</creatorcontrib><creatorcontrib>Mzerd, A.</creatorcontrib><title>Effect of deposition time on structural and physical properties of Cu2CdSnS4 thin films prepared by spray pyrolysis technique: experimental and ab initio study</title><title>Optical and quantum electronics</title><addtitle>Opt Quant Electron</addtitle><description>Cu
2
CdSnS
4
(CCdTS) thin films were synthesized using chemical spray pyrolysis deposition technique. The effect of various deposition times (20, 40, 60 min) on growth of these films was investigated. The as-synthesized Cu
2
CdSnS
4
thin films were characterized by X-ray diffraction (XRD), ultraviolet–visible (UV–Vis) spectroscopy, Raman spectroscopy and Hall Effect measurements. The XRD pattern of Cu
2
CdSnS
4
structured in stannite phase with preferential orientations along (112) planes. Raman spectrum revealed very strong peak at about 333 cm
−1
. The films have the direct optical band gaps of 1.39–1.5 eV. The optimum hole mobility was found to be 3.212 × 10
1
cm
2
v
−1
s
−1
for the film deposited on 60 min. The electronic structure and optical properties of the stannite structure Cu
2
CdSnS
4
were obtained by ab initio calculations using the Korringa–Kohn–Rostoker method combined with the Coherent Potential Approximation (CPA), as well as CPA confirms our results.</description><subject>Characterization and Evaluation of Materials</subject><subject>Computer Communication Networks</subject><subject>Electrical Engineering</subject><subject>Energy gap</subject><subject>Hall effect</subject><subject>Lasers</subject><subject>Optical Devices</subject><subject>Optical properties</subject><subject>Optics</subject><subject>Photonics</subject><subject>Physical properties</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Raman spectroscopy</subject><subject>Spray pyrolysis</subject><subject>Thin films</subject><subject>X-ray diffraction</subject><issn>0306-8919</issn><issn>1572-817X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNp1UctKAzEUDaJgrX6Au4Dr0dzMK-NOSn1AwUUV3A3pzI1NaTNjkgHna_xVb2kXblxdDpxXchi7BnELQpR3AUAomQgoE8J5ok7YBPJSJgrKj1M2EakoElVBdc4uQtgIIYosFxP2MzcGm8g7w1vsu2Cj7RyPdoecboh-aOLg9ZZr1_J-PQbbEOh916OPFsNeOBvkrF26Zcbj2jpu7HYXiIK99tjy1chD7_XI-9F3WzIIPGKzdvZrwHuO32REaS4eM_SKW7dvQeFDO16yM6O3Aa-Od8reH-dvs-dk8fr0MntYJE0KRUwag7gq8lZnuTKpzAoESTBVJhOos2JVmhIQTSUx1ZjKRlTQKqUzU7USMplO2c3Bl55GxUKsN93gHUXWoBQoELIoiQUHVuO7EDyauqfy2o81iHq_Q33YoaYd9jivFWnkQUO_YN0n-j_O_4p-AeJQjpo</recordid><startdate>20170401</startdate><enddate>20170401</enddate><creator>Rouchdi, M.</creator><creator>Salmani, E.</creator><creator>Hassanain, N.</creator><creator>Mzerd, A.</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20170401</creationdate><title>Effect of deposition time on structural and physical properties of Cu2CdSnS4 thin films prepared by spray pyrolysis technique: experimental and ab initio study</title><author>Rouchdi, M. ; Salmani, E. ; Hassanain, N. ; Mzerd, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-cfeeb65da458f3246e1265d38f40ea46b7f71eef92e3ae32c091d88a4f9d21423</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Characterization and Evaluation of Materials</topic><topic>Computer Communication Networks</topic><topic>Electrical Engineering</topic><topic>Energy gap</topic><topic>Hall effect</topic><topic>Lasers</topic><topic>Optical Devices</topic><topic>Optical properties</topic><topic>Optics</topic><topic>Photonics</topic><topic>Physical properties</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Raman spectroscopy</topic><topic>Spray pyrolysis</topic><topic>Thin films</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Rouchdi, M.</creatorcontrib><creatorcontrib>Salmani, E.</creatorcontrib><creatorcontrib>Hassanain, N.</creatorcontrib><creatorcontrib>Mzerd, A.</creatorcontrib><collection>CrossRef</collection><jtitle>Optical and quantum electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Rouchdi, M.</au><au>Salmani, E.</au><au>Hassanain, N.</au><au>Mzerd, A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effect of deposition time on structural and physical properties of Cu2CdSnS4 thin films prepared by spray pyrolysis technique: experimental and ab initio study</atitle><jtitle>Optical and quantum electronics</jtitle><stitle>Opt Quant Electron</stitle><date>2017-04-01</date><risdate>2017</risdate><volume>49</volume><issue>4</issue><spage>1</spage><epage>12</epage><pages>1-12</pages><artnum>165</artnum><issn>0306-8919</issn><eissn>1572-817X</eissn><abstract>Cu
2
CdSnS
4
(CCdTS) thin films were synthesized using chemical spray pyrolysis deposition technique. The effect of various deposition times (20, 40, 60 min) on growth of these films was investigated. The as-synthesized Cu
2
CdSnS
4
thin films were characterized by X-ray diffraction (XRD), ultraviolet–visible (UV–Vis) spectroscopy, Raman spectroscopy and Hall Effect measurements. The XRD pattern of Cu
2
CdSnS
4
structured in stannite phase with preferential orientations along (112) planes. Raman spectrum revealed very strong peak at about 333 cm
−1
. The films have the direct optical band gaps of 1.39–1.5 eV. The optimum hole mobility was found to be 3.212 × 10
1
cm
2
v
−1
s
−1
for the film deposited on 60 min. The electronic structure and optical properties of the stannite structure Cu
2
CdSnS
4
were obtained by ab initio calculations using the Korringa–Kohn–Rostoker method combined with the Coherent Potential Approximation (CPA), as well as CPA confirms our results.</abstract><cop>New York</cop><pub>Springer US</pub><doi>10.1007/s11082-017-1005-8</doi><tpages>12</tpages></addata></record> |
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| ispartof | Optical and quantum electronics, 2017-04, Vol.49 (4), p.1-12, Article 165 |
| issn | 0306-8919 1572-817X |
| language | eng |
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| subjects | Characterization and Evaluation of Materials Computer Communication Networks Electrical Engineering Energy gap Hall effect Lasers Optical Devices Optical properties Optics Photonics Physical properties Physics Physics and Astronomy Raman spectroscopy Spray pyrolysis Thin films X-ray diffraction |
| title | Effect of deposition time on structural and physical properties of Cu2CdSnS4 thin films prepared by spray pyrolysis technique: experimental and ab initio study |
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