Thermo-optical properties of conducted polythiophene polymer films used in electroluminescent devices
In this paper we present results of ellipsometric studies of thin organic poly-3hexylthiophene–(P3HT) and poly-3octylthiophene ( P3OT) films performed in temperature range 20–300 °C. The optical dispersion spectra of refractive and extinction indices of presented organic films was determined in wave...
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| Veröffentlicht in: | Optical and quantum electronics 2016-08, Vol.48 (8), p.1-8, Article 392 |
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| creator | Jaglarz, Janusz Nosidlak, Natalia Wolska, Natalia |
| description | In this paper we present results of ellipsometric studies of thin organic poly-3hexylthiophene–(P3HT) and poly-3octylthiophene
(
P3OT) films performed in temperature range 20–300 °C. The optical dispersion spectra of refractive and extinction indices of presented organic films was determined in wavelength range 190–1700 nm for temperatures within in a given range. Also thermo-ellipsometric investigations allowed to find temperature dependence on film thickness. The determination of thermal changes of thickness and refractive index allowed us to calculate thermo-optical coefficients (TOC) for P3HT and P3OT layers for many wavelengths in measured spectral range. The obtained values of thermo-optical coefficients of thin P3HT layers, determined from combined ellipsometric and spectro-photometric investigations, are negative in visible part of spectral range of the order of 10
−4
[1/K] . |
| doi_str_mv | 10.1007/s11082-016-0649-0 |
| format | Article |
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(
P3OT) films performed in temperature range 20–300 °C. The optical dispersion spectra of refractive and extinction indices of presented organic films was determined in wavelength range 190–1700 nm for temperatures within in a given range. Also thermo-ellipsometric investigations allowed to find temperature dependence on film thickness. The determination of thermal changes of thickness and refractive index allowed us to calculate thermo-optical coefficients (TOC) for P3HT and P3OT layers for many wavelengths in measured spectral range. The obtained values of thermo-optical coefficients of thin P3HT layers, determined from combined ellipsometric and spectro-photometric investigations, are negative in visible part of spectral range of the order of 10
−4
[1/K] .</description><identifier>ISSN: 0306-8919</identifier><identifier>EISSN: 1572-817X</identifier><identifier>DOI: 10.1007/s11082-016-0649-0</identifier><language>eng</language><publisher>New York: Springer US</publisher><subject>Advanced Materials for Photonics and Electronics ; Characterization and Evaluation of Materials ; Computer Communication Networks ; Electrical Engineering ; Electroluminescence ; Ellipsometry ; Film thickness ; Lasers ; Optical Devices ; Optical properties ; Optics ; Photonics ; Physics ; Physics and Astronomy ; Polymer films ; Polythiophene ; Refractivity ; Spectra ; Temperature dependence ; Thin films</subject><ispartof>Optical and quantum electronics, 2016-08, Vol.48 (8), p.1-8, Article 392</ispartof><rights>The Author(s) 2016</rights><rights>Copyright Springer Science & Business Media 2016</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c359t-9cdb2a47f266fe16311efc0c09f47ac64022bf7953ee8c0b555f67851d57193c3</citedby><cites>FETCH-LOGICAL-c359t-9cdb2a47f266fe16311efc0c09f47ac64022bf7953ee8c0b555f67851d57193c3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11082-016-0649-0$$EPDF$$P50$$Gspringer$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11082-016-0649-0$$EHTML$$P50$$Gspringer$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,27915,27916,41479,42548,51310</link.rule.ids></links><search><creatorcontrib>Jaglarz, Janusz</creatorcontrib><creatorcontrib>Nosidlak, Natalia</creatorcontrib><creatorcontrib>Wolska, Natalia</creatorcontrib><title>Thermo-optical properties of conducted polythiophene polymer films used in electroluminescent devices</title><title>Optical and quantum electronics</title><addtitle>Opt Quant Electron</addtitle><description>In this paper we present results of ellipsometric studies of thin organic poly-3hexylthiophene–(P3HT) and poly-3octylthiophene
(
P3OT) films performed in temperature range 20–300 °C. The optical dispersion spectra of refractive and extinction indices of presented organic films was determined in wavelength range 190–1700 nm for temperatures within in a given range. Also thermo-ellipsometric investigations allowed to find temperature dependence on film thickness. The determination of thermal changes of thickness and refractive index allowed us to calculate thermo-optical coefficients (TOC) for P3HT and P3OT layers for many wavelengths in measured spectral range. The obtained values of thermo-optical coefficients of thin P3HT layers, determined from combined ellipsometric and spectro-photometric investigations, are negative in visible part of spectral range of the order of 10
−4
[1/K] .</description><subject>Advanced Materials for Photonics and Electronics</subject><subject>Characterization and Evaluation of Materials</subject><subject>Computer Communication Networks</subject><subject>Electrical Engineering</subject><subject>Electroluminescence</subject><subject>Ellipsometry</subject><subject>Film thickness</subject><subject>Lasers</subject><subject>Optical Devices</subject><subject>Optical properties</subject><subject>Optics</subject><subject>Photonics</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Polymer films</subject><subject>Polythiophene</subject><subject>Refractivity</subject><subject>Spectra</subject><subject>Temperature dependence</subject><subject>Thin films</subject><issn>0306-8919</issn><issn>1572-817X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>C6C</sourceid><recordid>eNp1kE1LxDAQhoMouK7-AG8Fz9GZtmnaoyx-wYKXFbyFbjpxu7RNTVJh_71Z68GLp2Hged9hHsauEW4RQN55RChTDlhwKPKKwwlboJApL1G-n7IFZFDwssLqnF14vweIlIAFo82OXG-5HUOr6y4ZnR3JhZZ8Yk2i7dBMOlCTjLY7hF1rxx0N9LP15BLTdr1PJh-BdkioIx2c7aa-HchrGkLS0FeryV-yM1N3nq5-55K9PT5sVs98_fr0srpfc52JKvBKN9u0zqVJi8IQFhkiGQ0aKpPLWhc5pOnWyEpkRKWGrRDCFLIU2AiJVaazJbuZe-MbnxP5oPZ2ckM8qbAsMY-FICOFM6Wd9d6RUaNr-9odFII62lSzTRVtqqNNBTGTzhkf2eGD3J_mf0PfNSp5qA</recordid><startdate>20160801</startdate><enddate>20160801</enddate><creator>Jaglarz, Janusz</creator><creator>Nosidlak, Natalia</creator><creator>Wolska, Natalia</creator><general>Springer US</general><general>Springer Nature B.V</general><scope>C6C</scope><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20160801</creationdate><title>Thermo-optical properties of conducted polythiophene polymer films used in electroluminescent devices</title><author>Jaglarz, Janusz ; Nosidlak, Natalia ; Wolska, Natalia</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c359t-9cdb2a47f266fe16311efc0c09f47ac64022bf7953ee8c0b555f67851d57193c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Advanced Materials for Photonics and Electronics</topic><topic>Characterization and Evaluation of Materials</topic><topic>Computer Communication Networks</topic><topic>Electrical Engineering</topic><topic>Electroluminescence</topic><topic>Ellipsometry</topic><topic>Film thickness</topic><topic>Lasers</topic><topic>Optical Devices</topic><topic>Optical properties</topic><topic>Optics</topic><topic>Photonics</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Polymer films</topic><topic>Polythiophene</topic><topic>Refractivity</topic><topic>Spectra</topic><topic>Temperature dependence</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Jaglarz, Janusz</creatorcontrib><creatorcontrib>Nosidlak, Natalia</creatorcontrib><creatorcontrib>Wolska, Natalia</creatorcontrib><collection>Springer Nature OA Free Journals</collection><collection>CrossRef</collection><jtitle>Optical and quantum electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Jaglarz, Janusz</au><au>Nosidlak, Natalia</au><au>Wolska, Natalia</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thermo-optical properties of conducted polythiophene polymer films used in electroluminescent devices</atitle><jtitle>Optical and quantum electronics</jtitle><stitle>Opt Quant Electron</stitle><date>2016-08-01</date><risdate>2016</risdate><volume>48</volume><issue>8</issue><spage>1</spage><epage>8</epage><pages>1-8</pages><artnum>392</artnum><issn>0306-8919</issn><eissn>1572-817X</eissn><abstract>In this paper we present results of ellipsometric studies of thin organic poly-3hexylthiophene–(P3HT) and poly-3octylthiophene
(
P3OT) films performed in temperature range 20–300 °C. The optical dispersion spectra of refractive and extinction indices of presented organic films was determined in wavelength range 190–1700 nm for temperatures within in a given range. Also thermo-ellipsometric investigations allowed to find temperature dependence on film thickness. The determination of thermal changes of thickness and refractive index allowed us to calculate thermo-optical coefficients (TOC) for P3HT and P3OT layers for many wavelengths in measured spectral range. The obtained values of thermo-optical coefficients of thin P3HT layers, determined from combined ellipsometric and spectro-photometric investigations, are negative in visible part of spectral range of the order of 10
−4
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| subjects | Advanced Materials for Photonics and Electronics Characterization and Evaluation of Materials Computer Communication Networks Electrical Engineering Electroluminescence Ellipsometry Film thickness Lasers Optical Devices Optical properties Optics Photonics Physics Physics and Astronomy Polymer films Polythiophene Refractivity Spectra Temperature dependence Thin films |
| title | Thermo-optical properties of conducted polythiophene polymer films used in electroluminescent devices |
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