A 0.7-V, 8.9-μA compact temperature-compensated CMOS subthreshold voltage reference with high reliability

This paper focuses on the study of a compact tem-perature-compensated CMOS voltage reference (VR) with high reliability. The temperature coefficient (TC) of the gate-source voltage for a subthreshold NMOSFET has been derived and utilized to perform effective temperature compensation with a proportio...

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Veröffentlicht in:	Analog integrated circuits and signal processing 2017, Vol.91 (1), p.53-61
Hauptverfasser:	Huang, Sen, Diao, Shengxi, Lin, Fujiang
Format:	Artikel
Sprache:	eng
Schlagworte:	Circuits and Systems CMOS Electric potential Electrical Engineering Engineering Negative feedback Power supplies Reliability Resistors Signal,Image and Speech Processing Temperature Temperature compensation Temperature range
Online-Zugang:	Volltext
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