A Regulated Charge Pump for Tunneling Floating-Gate Transistors

Flash memory is an important component in many embedded system-on-a-chip applications, which drives the need to generate high write/erase voltages in generic CMOS processes. In this paper, we present a regulated, high-voltage charge pump for erasing Flash memory and floating-gate transistors. This 0...

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Veröffentlicht in:IEEE transactions on circuits and systems. I, Regular papers Regular papers, 2017-03, Vol.64 (3), p.516-527
Hauptverfasser: Rumberg, Brandon, Graham, David W., Navidi, Mir Mohammad
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Navidi, Mir Mohammad
description Flash memory is an important component in many embedded system-on-a-chip applications, which drives the need to generate high write/erase voltages in generic CMOS processes. In this paper, we present a regulated, high-voltage charge pump for erasing Flash memory and floating-gate transistors. This 0.069-mm 2 charge pump was fabricated in a 0.35 μm standard CMOS process. While operating from a 2.5 V supply, the charge pump generates regulated voltages up to 16 V with a PSRR of 52 dB and an output impedance of 6.8 kQ. To reduce power consumption for use in battery-powered applications, this charge pump uses a variable-frequency regulation technique and a new circuit for minimizing short-circuit current in the clock-generation circuitry; the resulting charge pump is able to erase the charge on floating-gate transistors using only 1.45μJ.
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subjects Analog memory
Batteries
Charge pumps
closed-loop systems
CMOS
CMOS integrated circuits
CMOS process
Components industry
Computer memory
Embedded systems
flash memories
Flash memory (computers)
floating-gate transistors
Input output
Logic gates
Power consumption
Semiconductor devices
Short circuits
short-circuit currents
System on chip
Transistors
Tunneling
variable-frequency regulation
Voltage control
title A Regulated Charge Pump for Tunneling Floating-Gate Transistors
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