Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy

Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Microscopy and microanalysis 2015-08, Vol.21 (S3), p.2337-2338
Hauptverfasser: Dahmen, Tim, Kohr, Holger, de Jonge, Niels, Slusallek, Philipp
Format: Artikel
Sprache:eng
Schlagworte:
A06 Advanced Analytical TEM/STEM
Algorithms
Analytical and Instrumentation Science Symposia
Electrons
Fourier transforms
Transmission electron microscopy
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page 2338
container_issue S3
container_start_page 2337
container_title Microscopy and microanalysis
container_volume 21
creator Dahmen, Tim
Kohr, Holger
de Jonge, Niels
Slusallek, Philipp
description
doi_str_mv 10.1017/S1431927615012465
format Article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1871976403</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927615012465</cupid><sourcerecordid>4317025391</sourcerecordid><originalsourceid>FETCH-LOGICAL-c1575-cba2286d33083f7971b4c0ee916e011fd77fb972d41b8c80a6c45a568a2a393</originalsourceid><addsrcrecordid>eNp1UE1LxDAQDaLguvoDvAU8VzNN89GjLLsqrAi295KmacnSJmvSPey_t3X3IIinecy8j-EhdA_kEQiIpwIyCnkqODACacbZBVpMK5ZIAHb5gyGZ79foJsYdIYQSwReo-zTauziGgx6td7gYgxpNZ03ErQ945YfaOtPg0vZjgpVr8MZr1ePChJlTaOWcdR0ug3JxsDHOJuve6DFM4N3q4KP2--MtumpVH83deS5RsVmXq9dk-_HytnreJhqYYImuVZpK3lBKJG1FLqDONDEmB24IQNsI0da5SJsMaqklUVxnTDEuVapoTpfo4eS6D_7rYOJY7fwhuCmwAikgFzwjdGLBiTU_F4Npq32wgwrHCkg1t1n9aXPS0LNGDXWwTWd-Wf-r-gaEbXcE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1871976403</pqid></control><display><type>article</type><title>Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy</title><source>Cambridge University Press Journals Complete</source><creator>Dahmen, Tim ; Kohr, Holger ; de Jonge, Niels ; Slusallek, Philipp</creator><creatorcontrib>Dahmen, Tim ; Kohr, Holger ; de Jonge, Niels ; Slusallek, Philipp</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927615012465</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>A06 Advanced Analytical TEM/STEM ; Algorithms ; Analytical and Instrumentation Science Symposia ; Electrons ; Fourier transforms ; Transmission electron microscopy</subject><ispartof>Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.2337-2338</ispartof><rights>Copyright © Microscopy Society of America 2015</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c1575-cba2286d33083f7971b4c0ee916e011fd77fb972d41b8c80a6c45a568a2a393</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927615012465/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,780,784,27923,27924,55627</link.rule.ids></links><search><creatorcontrib>Dahmen, Tim</creatorcontrib><creatorcontrib>Kohr, Holger</creatorcontrib><creatorcontrib>de Jonge, Niels</creatorcontrib><creatorcontrib>Slusallek, Philipp</creatorcontrib><title>Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>A06 Advanced Analytical TEM/STEM</subject><subject>Algorithms</subject><subject>Analytical and Instrumentation Science Symposia</subject><subject>Electrons</subject><subject>Fourier transforms</subject><subject>Transmission electron microscopy</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2015</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1UE1LxDAQDaLguvoDvAU8VzNN89GjLLsqrAi295KmacnSJmvSPey_t3X3IIinecy8j-EhdA_kEQiIpwIyCnkqODACacbZBVpMK5ZIAHb5gyGZ79foJsYdIYQSwReo-zTauziGgx6td7gYgxpNZ03ErQ945YfaOtPg0vZjgpVr8MZr1ePChJlTaOWcdR0ug3JxsDHOJuve6DFM4N3q4KP2--MtumpVH83deS5RsVmXq9dk-_HytnreJhqYYImuVZpK3lBKJG1FLqDONDEmB24IQNsI0da5SJsMaqklUVxnTDEuVapoTpfo4eS6D_7rYOJY7fwhuCmwAikgFzwjdGLBiTU_F4Npq32wgwrHCkg1t1n9aXPS0LNGDXWwTWd-Wf-r-gaEbXcE</recordid><startdate>201508</startdate><enddate>201508</enddate><creator>Dahmen, Tim</creator><creator>Kohr, Holger</creator><creator>de Jonge, Niels</creator><creator>Slusallek, Philipp</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AEUYN</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>201508</creationdate><title>Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy</title><author>Dahmen, Tim ; Kohr, Holger ; de Jonge, Niels ; Slusallek, Philipp</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c1575-cba2286d33083f7971b4c0ee916e011fd77fb972d41b8c80a6c45a568a2a393</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2015</creationdate><topic>A06 Advanced Analytical TEM/STEM</topic><topic>Algorithms</topic><topic>Analytical and Instrumentation Science Symposia</topic><topic>Electrons</topic><topic>Fourier transforms</topic><topic>Transmission electron microscopy</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Dahmen, Tim</creatorcontrib><creatorcontrib>Kohr, Holger</creatorcontrib><creatorcontrib>de Jonge, Niels</creatorcontrib><creatorcontrib>Slusallek, Philipp</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing &amp; Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest One Sustainability</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Dahmen, Tim</au><au>Kohr, Holger</au><au>de Jonge, Niels</au><au>Slusallek, Philipp</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2015-08</date><risdate>2015</risdate><volume>21</volume><issue>S3</issue><spage>2337</spage><epage>2338</epage><pages>2337-2338</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927615012465</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
fulltext fulltext
identifier ISSN: 1431-9276
ispartof Microscopy and microanalysis, 2015-08, Vol.21 (S3), p.2337-2338
issn 1431-9276
1435-8115
language eng
recordid cdi_proquest_journals_1871976403
source Cambridge University Press Journals Complete
subjects A06 Advanced Analytical TEM/STEM
Algorithms
Analytical and Instrumentation Science Symposia
Electrons
Fourier transforms
Transmission electron microscopy
title Reconstruction Strategies for Combined Tilt- and Focal Series Scanning Transmission Electron Microscopy
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-11T10%3A28%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Reconstruction%20Strategies%20for%20Combined%20Tilt-%20and%20Focal%20Series%20Scanning%20Transmission%20Electron%20Microscopy&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Dahmen,%20Tim&rft.date=2015-08&rft.volume=21&rft.issue=S3&rft.spage=2337&rft.epage=2338&rft.pages=2337-2338&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927615012465&rft_dat=%3Cproquest_cross%3E4317025391%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1871976403&rft_id=info:pmid/&rft_cupid=10_1017_S1431927615012465&rfr_iscdi=true