An integrated tailoring model for thermal cycling tests of spacecraft electronics
Thermal tests of electronic units are critically important for the reliability validation and performance demonstration of spacecraft hardware. A tailoring equation like that provided by MIL-STD-1540s is necessary for the testing condition planning of these thermal tests, however, the tailoring equa...
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| Veröffentlicht in: | IEEE transactions on aerospace and electronic systems 2016-12, Vol.52 (6), p.2685-2696 |
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| container_title | IEEE transactions on aerospace and electronic systems |
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| creator | Ji, Xin-Yan Li, Yun-Ze Wang, Jing Yang, Xiao-Ning Bi, Yan-Qiang Cao, Zhi-Song Li, Xi-Yuan Liu, Guo-Qing |
| description | Thermal tests of electronic units are critically important for the reliability validation and performance demonstration of spacecraft hardware. A tailoring equation like that provided by MIL-STD-1540s is necessary for the testing condition planning of these thermal tests, however, the tailoring equation provided by MIL-STD-1540s is mainly based on the fatigue data of solders. In this paper, a new test condition tailoring equation is proposed by introducing an integrated evaluating method for the fatigue acceleration exponent. The different thermo-mechanical fatigue mechanisms and different subsystem characteristics have been considered and discussed in the deducing of this new equation. The test precipitation efficiency (PE) of the new tailoring law has been analyzed and compared with that from the MIL-STD-1540 tailoring equations. The results are encouraging and reasonable. |
| doi_str_mv | 10.1109/TAES.2016.150525 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_1869405433</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>7855576</ieee_id><sourcerecordid>1869405433</sourcerecordid><originalsourceid>FETCH-LOGICAL-c291t-21325392952e7e2cda17ad9d5bc4cbe1ffaa3a39aa203a6cf2559456855a02c33</originalsourceid><addsrcrecordid>eNo9kM1Lw0AQxRdRsFbvgpcFz6n7kUm6x1LqBxRErOdlupmtKWlSd7eH_vcmRDwNw7w37_Fj7F6KmZTCPG0Wq8-ZErKYSRCg4IJNJECZmULoSzYRQs4zo0Bes5sY9_2az3M9YR-Lltdtol3ARBVPWDddqNsdP3QVNdx3gadvCgdsuDu7ZrgkiinyzvN4REcuoE-cGnIpdG3t4i278thEuvubU_b1vNosX7P1-8vbcrHOnDIyZUpqBdooA4pKUq5CWWJlKti63G1Jeo-oURtEJTQWzisAk0MxB0ChnNZT9jj-PYbu59R3svvuFNo-0sp5YXIBuR5UYlS50MUYyNtjqA8YzlYKO4CzAzg7gLMjuN7yMFpqIvqXl30wlIX-BXKfaf8</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1869405433</pqid></control><display><type>article</type><title>An integrated tailoring model for thermal cycling tests of spacecraft electronics</title><source>IEEE Electronic Library (IEL)</source><creator>Ji, Xin-Yan ; Li, Yun-Ze ; Wang, Jing ; Yang, Xiao-Ning ; Bi, Yan-Qiang ; Cao, Zhi-Song ; Li, Xi-Yuan ; Liu, Guo-Qing</creator><creatorcontrib>Ji, Xin-Yan ; Li, Yun-Ze ; Wang, Jing ; Yang, Xiao-Ning ; Bi, Yan-Qiang ; Cao, Zhi-Song ; Li, Xi-Yuan ; Liu, Guo-Qing</creatorcontrib><description>Thermal tests of electronic units are critically important for the reliability validation and performance demonstration of spacecraft hardware. A tailoring equation like that provided by MIL-STD-1540s is necessary for the testing condition planning of these thermal tests, however, the tailoring equation provided by MIL-STD-1540s is mainly based on the fatigue data of solders. In this paper, a new test condition tailoring equation is proposed by introducing an integrated evaluating method for the fatigue acceleration exponent. The different thermo-mechanical fatigue mechanisms and different subsystem characteristics have been considered and discussed in the deducing of this new equation. The test precipitation efficiency (PE) of the new tailoring law has been analyzed and compared with that from the MIL-STD-1540 tailoring equations. The results are encouraging and reasonable.</description><identifier>ISSN: 0018-9251</identifier><identifier>EISSN: 1557-9603</identifier><identifier>DOI: 10.1109/TAES.2016.150525</identifier><identifier>CODEN: IEARAX</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Fatigue ; Fatigue tests ; Land surface temperature ; Materials fatigue ; Mathematical model ; Military standards ; Solders ; Space vehicles ; Spacecraft reliability ; Temperature distribution ; Testing ; Thermal cycling ; Thermal cycling tests</subject><ispartof>IEEE transactions on aerospace and electronic systems, 2016-12, Vol.52 (6), p.2685-2696</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2016</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c291t-21325392952e7e2cda17ad9d5bc4cbe1ffaa3a39aa203a6cf2559456855a02c33</citedby><cites>FETCH-LOGICAL-c291t-21325392952e7e2cda17ad9d5bc4cbe1ffaa3a39aa203a6cf2559456855a02c33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7855576$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,796,27924,27925,54758</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7855576$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Ji, Xin-Yan</creatorcontrib><creatorcontrib>Li, Yun-Ze</creatorcontrib><creatorcontrib>Wang, Jing</creatorcontrib><creatorcontrib>Yang, Xiao-Ning</creatorcontrib><creatorcontrib>Bi, Yan-Qiang</creatorcontrib><creatorcontrib>Cao, Zhi-Song</creatorcontrib><creatorcontrib>Li, Xi-Yuan</creatorcontrib><creatorcontrib>Liu, Guo-Qing</creatorcontrib><title>An integrated tailoring model for thermal cycling tests of spacecraft electronics</title><title>IEEE transactions on aerospace and electronic systems</title><addtitle>T-AES</addtitle><description>Thermal tests of electronic units are critically important for the reliability validation and performance demonstration of spacecraft hardware. A tailoring equation like that provided by MIL-STD-1540s is necessary for the testing condition planning of these thermal tests, however, the tailoring equation provided by MIL-STD-1540s is mainly based on the fatigue data of solders. In this paper, a new test condition tailoring equation is proposed by introducing an integrated evaluating method for the fatigue acceleration exponent. The different thermo-mechanical fatigue mechanisms and different subsystem characteristics have been considered and discussed in the deducing of this new equation. The test precipitation efficiency (PE) of the new tailoring law has been analyzed and compared with that from the MIL-STD-1540 tailoring equations. The results are encouraging and reasonable.</description><subject>Fatigue</subject><subject>Fatigue tests</subject><subject>Land surface temperature</subject><subject>Materials fatigue</subject><subject>Mathematical model</subject><subject>Military standards</subject><subject>Solders</subject><subject>Space vehicles</subject><subject>Spacecraft reliability</subject><subject>Temperature distribution</subject><subject>Testing</subject><subject>Thermal cycling</subject><subject>Thermal cycling tests</subject><issn>0018-9251</issn><issn>1557-9603</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM1Lw0AQxRdRsFbvgpcFz6n7kUm6x1LqBxRErOdlupmtKWlSd7eH_vcmRDwNw7w37_Fj7F6KmZTCPG0Wq8-ZErKYSRCg4IJNJECZmULoSzYRQs4zo0Bes5sY9_2az3M9YR-Lltdtol3ARBVPWDddqNsdP3QVNdx3gadvCgdsuDu7ZrgkiinyzvN4REcuoE-cGnIpdG3t4i278thEuvubU_b1vNosX7P1-8vbcrHOnDIyZUpqBdooA4pKUq5CWWJlKti63G1Jeo-oURtEJTQWzisAk0MxB0ChnNZT9jj-PYbu59R3svvuFNo-0sp5YXIBuR5UYlS50MUYyNtjqA8YzlYKO4CzAzg7gLMjuN7yMFpqIvqXl30wlIX-BXKfaf8</recordid><startdate>20161201</startdate><enddate>20161201</enddate><creator>Ji, Xin-Yan</creator><creator>Li, Yun-Ze</creator><creator>Wang, Jing</creator><creator>Yang, Xiao-Ning</creator><creator>Bi, Yan-Qiang</creator><creator>Cao, Zhi-Song</creator><creator>Li, Xi-Yuan</creator><creator>Liu, Guo-Qing</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>8FD</scope><scope>FR3</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20161201</creationdate><title>An integrated tailoring model for thermal cycling tests of spacecraft electronics</title><author>Ji, Xin-Yan ; Li, Yun-Ze ; Wang, Jing ; Yang, Xiao-Ning ; Bi, Yan-Qiang ; Cao, Zhi-Song ; Li, Xi-Yuan ; Liu, Guo-Qing</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c291t-21325392952e7e2cda17ad9d5bc4cbe1ffaa3a39aa203a6cf2559456855a02c33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Fatigue</topic><topic>Fatigue tests</topic><topic>Land surface temperature</topic><topic>Materials fatigue</topic><topic>Mathematical model</topic><topic>Military standards</topic><topic>Solders</topic><topic>Space vehicles</topic><topic>Spacecraft reliability</topic><topic>Temperature distribution</topic><topic>Testing</topic><topic>Thermal cycling</topic><topic>Thermal cycling tests</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ji, Xin-Yan</creatorcontrib><creatorcontrib>Li, Yun-Ze</creatorcontrib><creatorcontrib>Wang, Jing</creatorcontrib><creatorcontrib>Yang, Xiao-Ning</creatorcontrib><creatorcontrib>Bi, Yan-Qiang</creatorcontrib><creatorcontrib>Cao, Zhi-Song</creatorcontrib><creatorcontrib>Li, Xi-Yuan</creatorcontrib><creatorcontrib>Liu, Guo-Qing</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE transactions on aerospace and electronic systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Ji, Xin-Yan</au><au>Li, Yun-Ze</au><au>Wang, Jing</au><au>Yang, Xiao-Ning</au><au>Bi, Yan-Qiang</au><au>Cao, Zhi-Song</au><au>Li, Xi-Yuan</au><au>Liu, Guo-Qing</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>An integrated tailoring model for thermal cycling tests of spacecraft electronics</atitle><jtitle>IEEE transactions on aerospace and electronic systems</jtitle><stitle>T-AES</stitle><date>2016-12-01</date><risdate>2016</risdate><volume>52</volume><issue>6</issue><spage>2685</spage><epage>2696</epage><pages>2685-2696</pages><issn>0018-9251</issn><eissn>1557-9603</eissn><coden>IEARAX</coden><abstract>Thermal tests of electronic units are critically important for the reliability validation and performance demonstration of spacecraft hardware. A tailoring equation like that provided by MIL-STD-1540s is necessary for the testing condition planning of these thermal tests, however, the tailoring equation provided by MIL-STD-1540s is mainly based on the fatigue data of solders. In this paper, a new test condition tailoring equation is proposed by introducing an integrated evaluating method for the fatigue acceleration exponent. The different thermo-mechanical fatigue mechanisms and different subsystem characteristics have been considered and discussed in the deducing of this new equation. The test precipitation efficiency (PE) of the new tailoring law has been analyzed and compared with that from the MIL-STD-1540 tailoring equations. The results are encouraging and reasonable.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TAES.2016.150525</doi><tpages>12</tpages></addata></record> |
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| source | IEEE Electronic Library (IEL) |
| subjects | Fatigue Fatigue tests Land surface temperature Materials fatigue Mathematical model Military standards Solders Space vehicles Spacecraft reliability Temperature distribution Testing Thermal cycling Thermal cycling tests |
| title | An integrated tailoring model for thermal cycling tests of spacecraft electronics |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T06%3A07%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=An%20integrated%20tailoring%20model%20for%20thermal%20cycling%20tests%20of%20spacecraft%20electronics&rft.jtitle=IEEE%20transactions%20on%20aerospace%20and%20electronic%20systems&rft.au=Ji,%20Xin-Yan&rft.date=2016-12-01&rft.volume=52&rft.issue=6&rft.spage=2685&rft.epage=2696&rft.pages=2685-2696&rft.issn=0018-9251&rft.eissn=1557-9603&rft.coden=IEARAX&rft_id=info:doi/10.1109/TAES.2016.150525&rft_dat=%3Cproquest_RIE%3E1869405433%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1869405433&rft_id=info:pmid/&rft_ieee_id=7855576&rfr_iscdi=true |