Write-Induced Head Contamination in Heat-Assisted Magnetic Recording
One detrimental by-product of heat-assisted magnetic recording writing is the creation of head contamination. Here, we present the current understanding of the driving forces, growth mechanisms, and growth rates of write-induced head contamination. The combination of an evaporation and condensation...
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| Veröffentlicht in: | IEEE transactions on magnetics 2017-02, Vol.53 (2), p.1-7 |
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| container_title | IEEE transactions on magnetics |
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| creator | Kiely, James D. Jones, Paul M. Yang Yang Brand, John L. Anaya-Dufresne, Manuel Fletcher, Patrick C. Zavaliche, Florin Toivola, Yvete Duda, John C. Johnson, Michael T. |
| description | One detrimental by-product of heat-assisted magnetic recording writing is the creation of head contamination. Here, we present the current understanding of the driving forces, growth mechanisms, and growth rates of write-induced head contamination. The combination of an evaporation and condensation model with shear forces suggests a flow of lubricant on the head may precipitate contamination. The contamination is observed to grow in the head-media gap until it contacts the media surface, at which point an additional material pickup mechanism can be activated. Evidence of contact-induced transfer and a chemical reaction of the contamination is presented, and the impacts of contamination on head temperatures and thermal gradient is presented. Depending on the contamination properties, head temperatures may be increased substantially, leading to increased reliability risk. Consistent with previous analyses, we find that contamination may increase media thermal gradient. |
| doi_str_mv | 10.1109/TMAG.2016.2618842 |
| format | Article |
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Here, we present the current understanding of the driving forces, growth mechanisms, and growth rates of write-induced head contamination. The combination of an evaporation and condensation model with shear forces suggests a flow of lubricant on the head may precipitate contamination. The contamination is observed to grow in the head-media gap until it contacts the media surface, at which point an additional material pickup mechanism can be activated. Evidence of contact-induced transfer and a chemical reaction of the contamination is presented, and the impacts of contamination on head temperatures and thermal gradient is presented. Depending on the contamination properties, head temperatures may be increased substantially, leading to increased reliability risk. Consistent with previous analyses, we find that contamination may increase media thermal gradient.</description><identifier>ISSN: 0018-9464</identifier><identifier>EISSN: 1941-0069</identifier><identifier>DOI: 10.1109/TMAG.2016.2618842</identifier><identifier>CODEN: IEMGAQ</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Chemical reactions ; Condensates ; Contamination ; Evaporation rate ; hard disk drive ; Head ; head–disk interface ; Heat-assisted magnetic recording ; heat-assisted magnetic recording (HAMR) ; lubricant ; Lubricants ; Magnetic heads ; Magnetic recording ; Magnetism ; Media ; Reliability analysis ; Shear forces ; Surface contamination ; Temperature gradients</subject><ispartof>IEEE transactions on magnetics, 2017-02, Vol.53 (2), p.1-7</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2017</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c359t-d39bcefe98c311ded88bb891d74ba7a5ed2bd01331b72fee31b485d91a9694cf3</citedby><cites>FETCH-LOGICAL-c359t-d39bcefe98c311ded88bb891d74ba7a5ed2bd01331b72fee31b485d91a9694cf3</cites><orcidid>0000-0003-1986-1858</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/7736109$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>315,781,785,797,27929,27930,54763</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/7736109$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Kiely, James D.</creatorcontrib><creatorcontrib>Jones, Paul M.</creatorcontrib><creatorcontrib>Yang Yang</creatorcontrib><creatorcontrib>Brand, John L.</creatorcontrib><creatorcontrib>Anaya-Dufresne, Manuel</creatorcontrib><creatorcontrib>Fletcher, Patrick C.</creatorcontrib><creatorcontrib>Zavaliche, Florin</creatorcontrib><creatorcontrib>Toivola, Yvete</creatorcontrib><creatorcontrib>Duda, John C.</creatorcontrib><creatorcontrib>Johnson, Michael T.</creatorcontrib><title>Write-Induced Head Contamination in Heat-Assisted Magnetic Recording</title><title>IEEE transactions on magnetics</title><addtitle>TMAG</addtitle><description>One detrimental by-product of heat-assisted magnetic recording writing is the creation of head contamination. Here, we present the current understanding of the driving forces, growth mechanisms, and growth rates of write-induced head contamination. The combination of an evaporation and condensation model with shear forces suggests a flow of lubricant on the head may precipitate contamination. The contamination is observed to grow in the head-media gap until it contacts the media surface, at which point an additional material pickup mechanism can be activated. Evidence of contact-induced transfer and a chemical reaction of the contamination is presented, and the impacts of contamination on head temperatures and thermal gradient is presented. Depending on the contamination properties, head temperatures may be increased substantially, leading to increased reliability risk. Consistent with previous analyses, we find that contamination may increase media thermal gradient.</description><subject>Chemical reactions</subject><subject>Condensates</subject><subject>Contamination</subject><subject>Evaporation rate</subject><subject>hard disk drive</subject><subject>Head</subject><subject>head–disk interface</subject><subject>Heat-assisted magnetic recording</subject><subject>heat-assisted magnetic recording (HAMR)</subject><subject>lubricant</subject><subject>Lubricants</subject><subject>Magnetic heads</subject><subject>Magnetic recording</subject><subject>Magnetism</subject><subject>Media</subject><subject>Reliability analysis</subject><subject>Shear forces</subject><subject>Surface contamination</subject><subject>Temperature gradients</subject><issn>0018-9464</issn><issn>1941-0069</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kMFKAzEQhoMoWKsPIF4KnrdmNtlscixVa6FFkIrHkE1mS4rN1iQ9-Pbu0uLpZ4bvn4GPkHugUwCqnjbr2WJaUhDTUoCUvLwgI1AcCkqFuiQjSkEWigt-TW5S2vUjr4COyPNX9BmLZXBHi27yhsZN5l3IZu-Dyb4LEx-GbS5mKfmUe2ZttgGzt5MPtF10PmxvyVVrvhPenXNMPl9fNvO3YvW-WM5nq8KySuXCMdVYbFFJywAcOimbRipwNW9MbSp0ZeMoMAZNXbaIfXJZOQVGCcVty8bk8XT3ELufI6asd90xhv6lBilKUDVloqfgRNnYpRSx1Yfo9yb-aqB6kKUHWXqQpc-y-s7DqeMR8Z-vayZ6nv0BeR5lcw</recordid><startdate>20170201</startdate><enddate>20170201</enddate><creator>Kiely, James D.</creator><creator>Jones, Paul M.</creator><creator>Yang Yang</creator><creator>Brand, John L.</creator><creator>Anaya-Dufresne, Manuel</creator><creator>Fletcher, Patrick C.</creator><creator>Zavaliche, Florin</creator><creator>Toivola, Yvete</creator><creator>Duda, John C.</creator><creator>Johnson, Michael T.</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. 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Here, we present the current understanding of the driving forces, growth mechanisms, and growth rates of write-induced head contamination. The combination of an evaporation and condensation model with shear forces suggests a flow of lubricant on the head may precipitate contamination. The contamination is observed to grow in the head-media gap until it contacts the media surface, at which point an additional material pickup mechanism can be activated. Evidence of contact-induced transfer and a chemical reaction of the contamination is presented, and the impacts of contamination on head temperatures and thermal gradient is presented. Depending on the contamination properties, head temperatures may be increased substantially, leading to increased reliability risk. Consistent with previous analyses, we find that contamination may increase media thermal gradient.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/TMAG.2016.2618842</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0003-1986-1858</orcidid></addata></record> |
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| subjects | Chemical reactions Condensates Contamination Evaporation rate hard disk drive Head head–disk interface Heat-assisted magnetic recording heat-assisted magnetic recording (HAMR) lubricant Lubricants Magnetic heads Magnetic recording Magnetism Media Reliability analysis Shear forces Surface contamination Temperature gradients |
| title | Write-Induced Head Contamination in Heat-Assisted Magnetic Recording |
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