Measurement of Detection Efficiency in Atom Probe Tomography

Measurement of Detection Efficiency in Atom Probe Tomography

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Veröffentlicht in:Microscopy and microanalysis 2014-08, Vol.20 (S3), p.1160-1161
Hauptverfasser: Prosa, T.J., Geiser, B.P., Ulfig, R.M., Kelly, T.F., Larson, D.J.
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Advances in Instrumentation Symposia
Vendor Symposium: New Tools for Life and Materials Sciences
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container_title Microscopy and microanalysis
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creator Prosa, T.J.
Geiser, B.P.
Ulfig, R.M.
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Larson, D.J.
description
doi_str_mv 10.1017/S1431927614007533
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subjects Advances in Instrumentation Symposia
Vendor Symposium: New Tools for Life and Materials Sciences
title Measurement of Detection Efficiency in Atom Probe Tomography
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