Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements

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Veröffentlicht in:Microscopy and microanalysis 2014-08, Vol.20 (S3), p.558-559
Hauptverfasser: Lovejoy, T.C., Dellby, N., Aoki, T., Corbin, G.J., Hrncirik, P., Szilagyi, Z.S., Krivanek, O.L.
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container_end_page 559
container_issue S3
container_start_page 558
container_title Microscopy and microanalysis
container_volume 20
creator Lovejoy, T.C.
Dellby, N.
Aoki, T.
Corbin, G.J.
Hrncirik, P.
Szilagyi, Z.S.
Krivanek, O.L.
description
doi_str_mv 10.1017/S1431927614004516
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_1855674532</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><cupid>10_1017_S1431927614004516</cupid><sourcerecordid>4293958561</sourcerecordid><originalsourceid>FETCH-LOGICAL-c2756-78eacb0cc4730a0da4571d16329d7f7b2583349089d02d18378170c7e750d36c3</originalsourceid><addsrcrecordid>eNp1kDFPwzAQhS0EEqXwA9gsMRvu4jjnjFVJKFIRA3SO3NgJKWkSnHTovyelHZAQ053uvvee9Bi7RbhHQHp4w1BiHFCEIUCoMDpjk_GkhEZU5z87isP_kl31_QYAJFA0YUnSOF_uRVrVg_PO8kVVfohZU9aOPxr_ydPK1Za_mK6rmpK3BV_VgzdiOWIDT2q3dc3QX7OLwtS9uznNKVulyft8IZavT8_z2VLkAalIkHYmX0OehyTBgDWhIrQYySC2VNA6UFrKMAYdWwgsakkaCXJypMDKKJdTdnf07Xz7tXP9kG3anW_GyAy1UhGFSgYjhUcq923fe1dkna-2xu8zhOzQVvanrVEjTxqzXfvKlu6X9b-qbyeUaK4</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>1855674532</pqid></control><display><type>article</type><title>Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements</title><source>Cambridge University Press Journals Complete</source><creator>Lovejoy, T.C. ; Dellby, N. ; Aoki, T. ; Corbin, G.J. ; Hrncirik, P. ; Szilagyi, Z.S. ; Krivanek, O.L.</creator><creatorcontrib>Lovejoy, T.C. ; Dellby, N. ; Aoki, T. ; Corbin, G.J. ; Hrncirik, P. ; Szilagyi, Z.S. ; Krivanek, O.L.</creatorcontrib><identifier>ISSN: 1431-9276</identifier><identifier>EISSN: 1435-8115</identifier><identifier>DOI: 10.1017/S1431927614004516</identifier><language>eng</language><publisher>New York, USA: Cambridge University Press</publisher><subject>Advances in Instrumentation Symposia ; Frontiers in Analytical TEM-STEM</subject><ispartof>Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.558-559</ispartof><rights>Copyright © Microscopy Society of America 2014</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2756-78eacb0cc4730a0da4571d16329d7f7b2583349089d02d18378170c7e750d36c3</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.cambridge.org/core/product/identifier/S1431927614004516/type/journal_article$$EHTML$$P50$$Gcambridge$$H</linktohtml><link.rule.ids>164,314,780,784,27924,27925,55628</link.rule.ids></links><search><creatorcontrib>Lovejoy, T.C.</creatorcontrib><creatorcontrib>Dellby, N.</creatorcontrib><creatorcontrib>Aoki, T.</creatorcontrib><creatorcontrib>Corbin, G.J.</creatorcontrib><creatorcontrib>Hrncirik, P.</creatorcontrib><creatorcontrib>Szilagyi, Z.S.</creatorcontrib><creatorcontrib>Krivanek, O.L.</creatorcontrib><title>Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements</title><title>Microscopy and microanalysis</title><addtitle>Microsc Microanal</addtitle><subject>Advances in Instrumentation Symposia</subject><subject>Frontiers in Analytical TEM-STEM</subject><issn>1431-9276</issn><issn>1435-8115</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><sourceid>ABUWG</sourceid><sourceid>AFKRA</sourceid><sourceid>AZQEC</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><sourceid>GNUQQ</sourceid><recordid>eNp1kDFPwzAQhS0EEqXwA9gsMRvu4jjnjFVJKFIRA3SO3NgJKWkSnHTovyelHZAQ053uvvee9Bi7RbhHQHp4w1BiHFCEIUCoMDpjk_GkhEZU5z87isP_kl31_QYAJFA0YUnSOF_uRVrVg_PO8kVVfohZU9aOPxr_ydPK1Za_mK6rmpK3BV_VgzdiOWIDT2q3dc3QX7OLwtS9uznNKVulyft8IZavT8_z2VLkAalIkHYmX0OehyTBgDWhIrQYySC2VNA6UFrKMAYdWwgsakkaCXJypMDKKJdTdnf07Xz7tXP9kG3anW_GyAy1UhGFSgYjhUcq923fe1dkna-2xu8zhOzQVvanrVEjTxqzXfvKlu6X9b-qbyeUaK4</recordid><startdate>201408</startdate><enddate>201408</enddate><creator>Lovejoy, T.C.</creator><creator>Dellby, N.</creator><creator>Aoki, T.</creator><creator>Corbin, G.J.</creator><creator>Hrncirik, P.</creator><creator>Szilagyi, Z.S.</creator><creator>Krivanek, O.L.</creator><general>Cambridge University Press</general><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>3V.</scope><scope>7QO</scope><scope>7RV</scope><scope>7TK</scope><scope>7X7</scope><scope>7XB</scope><scope>88E</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>8FH</scope><scope>8FI</scope><scope>8FJ</scope><scope>8FK</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BBNVY</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>FR3</scope><scope>FYUFA</scope><scope>GHDGH</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>K9.</scope><scope>KB0</scope><scope>LK8</scope><scope>M0S</scope><scope>M1P</scope><scope>M7P</scope><scope>NAPCQ</scope><scope>P5Z</scope><scope>P62</scope><scope>P64</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope></search><sort><creationdate>201408</creationdate><title>Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements</title><author>Lovejoy, T.C. ; Dellby, N. ; Aoki, T. ; Corbin, G.J. ; Hrncirik, P. ; Szilagyi, Z.S. ; Krivanek, O.L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2756-78eacb0cc4730a0da4571d16329d7f7b2583349089d02d18378170c7e750d36c3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>Advances in Instrumentation Symposia</topic><topic>Frontiers in Analytical TEM-STEM</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Lovejoy, T.C.</creatorcontrib><creatorcontrib>Dellby, N.</creatorcontrib><creatorcontrib>Aoki, T.</creatorcontrib><creatorcontrib>Corbin, G.J.</creatorcontrib><creatorcontrib>Hrncirik, P.</creatorcontrib><creatorcontrib>Szilagyi, Z.S.</creatorcontrib><creatorcontrib>Krivanek, O.L.</creatorcontrib><collection>CrossRef</collection><collection>ProQuest Central (Corporate)</collection><collection>Biotechnology Research Abstracts</collection><collection>Nursing &amp; Allied Health Database</collection><collection>Neurosciences Abstracts</collection><collection>Health &amp; Medical Collection</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Medical Database (Alumni Edition)</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Hospital Premium Collection</collection><collection>Hospital Premium Collection (Alumni Edition)</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central UK/Ireland</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>Biological Science Collection</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Engineering Research Database</collection><collection>Health Research Premium Collection</collection><collection>Health Research Premium Collection (Alumni)</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>ProQuest Health &amp; Medical Complete (Alumni)</collection><collection>Nursing &amp; Allied Health Database (Alumni Edition)</collection><collection>ProQuest Biological Science Collection</collection><collection>Health &amp; Medical Collection (Alumni Edition)</collection><collection>Medical Database</collection><collection>Biological Science Database</collection><collection>Nursing &amp; Allied Health Premium</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Biotechnology and BioEngineering Abstracts</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><jtitle>Microscopy and microanalysis</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Lovejoy, T.C.</au><au>Dellby, N.</au><au>Aoki, T.</au><au>Corbin, G.J.</au><au>Hrncirik, P.</au><au>Szilagyi, Z.S.</au><au>Krivanek, O.L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements</atitle><jtitle>Microscopy and microanalysis</jtitle><addtitle>Microsc Microanal</addtitle><date>2014-08</date><risdate>2014</risdate><volume>20</volume><issue>S3</issue><spage>558</spage><epage>559</epage><pages>558-559</pages><issn>1431-9276</issn><eissn>1435-8115</eissn><cop>New York, USA</cop><pub>Cambridge University Press</pub><doi>10.1017/S1431927614004516</doi><tpages>2</tpages><oa>free_for_read</oa></addata></record>
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issn 1431-9276
1435-8115
language eng
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source Cambridge University Press Journals Complete
subjects Advances in Instrumentation Symposia
Frontiers in Analytical TEM-STEM
title Energy-Filtered High-Angle Dark Field Mapping of Ultra-Light Elements
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T23%3A20%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Energy-Filtered%20High-Angle%20Dark%20Field%20Mapping%20of%20Ultra-Light%20Elements&rft.jtitle=Microscopy%20and%20microanalysis&rft.au=Lovejoy,%20T.C.&rft.date=2014-08&rft.volume=20&rft.issue=S3&rft.spage=558&rft.epage=559&rft.pages=558-559&rft.issn=1431-9276&rft.eissn=1435-8115&rft_id=info:doi/10.1017/S1431927614004516&rft_dat=%3Cproquest_cross%3E4293958561%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=1855674532&rft_id=info:pmid/&rft_cupid=10_1017_S1431927614004516&rfr_iscdi=true