Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector
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| Veröffentlicht in: | Microscopy and microanalysis 2014-08, Vol.20 (S3), p.1046-1047 |
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| container_issue | S3 |
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| container_title | Microscopy and microanalysis |
| container_volume | 20 |
| creator | Ozdol, V. B. Gammer, C. Sarahan, M.C. Minor, A. M. |
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| doi_str_mv | 10.1017/S1431927614006953 |
| format | Article |
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| identifier | ISSN: 1431-9276 |
| ispartof | Microscopy and microanalysis, 2014-08, Vol.20 (S3), p.1046-1047 |
| issn | 1431-9276 1435-8115 |
| language | eng |
| recordid | cdi_proquest_journals_1855674428 |
| source | Cambridge University Press Journals Complete |
| subjects | Advances in Instrumentation Symposia Extended Crystal Defects: Quantification of Strain, Local Atomic Structure and Chemistry |
| title | Nano-scale Strain Mapping Using Advanced STEM with a Direct Electron Detector |
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